{"title":"存储器应用的符号纠错码","authors":"Scott Chen","doi":"10.1109/FTCS.1996.534607","DOIUrl":null,"url":null,"abstract":"Symbol error correcting codes have been used for fault tolerance in computer memory subsystems configured in b-bits-per-chip. This paper presents algorithms for designing the parity check matrices of symbol error correcting codes to reduce circuit count and the circuit time delay. It presents a technique for formulating the parity check matrices for modular implementation. It also presents codes that use a smaller number of circuits and require a shorter circuit delay time than other known codes. These results are useful for practical design of symbol error correcting codes.","PeriodicalId":191163,"journal":{"name":"Proceedings of Annual Symposium on Fault Tolerant Computing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":"{\"title\":\"Symbol error correcting codes for memory applications\",\"authors\":\"Scott Chen\",\"doi\":\"10.1109/FTCS.1996.534607\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Symbol error correcting codes have been used for fault tolerance in computer memory subsystems configured in b-bits-per-chip. This paper presents algorithms for designing the parity check matrices of symbol error correcting codes to reduce circuit count and the circuit time delay. It presents a technique for formulating the parity check matrices for modular implementation. It also presents codes that use a smaller number of circuits and require a shorter circuit delay time than other known codes. These results are useful for practical design of symbol error correcting codes.\",\"PeriodicalId\":191163,\"journal\":{\"name\":\"Proceedings of Annual Symposium on Fault Tolerant Computing\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Annual Symposium on Fault Tolerant Computing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FTCS.1996.534607\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Annual Symposium on Fault Tolerant Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FTCS.1996.534607","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Symbol error correcting codes for memory applications
Symbol error correcting codes have been used for fault tolerance in computer memory subsystems configured in b-bits-per-chip. This paper presents algorithms for designing the parity check matrices of symbol error correcting codes to reduce circuit count and the circuit time delay. It presents a technique for formulating the parity check matrices for modular implementation. It also presents codes that use a smaller number of circuits and require a shorter circuit delay time than other known codes. These results are useful for practical design of symbol error correcting codes.