2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)最新文献_第4页

Near-Earth phase risk comparison of human Mars campaign architectures 人类火星活动架构的近地阶段风险比较

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517729

T. Manning, H. Nejad, C. Mattenberger

{"title":"Near-Earth phase risk comparison of human Mars campaign architectures","authors":"T. Manning, H. Nejad, C. Mattenberger","doi":"10.1109/RAMS.2013.6517729","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517729","url":null,"abstract":"A risk analysis of the launch, orbital assembly, and Earth-departure phases of human Mars exploration campaign architectures was completed as an extension of a probabilistic risk assessment (PRA) originally carried out under the NASA Constellation Program Ares V Project [1]. The objective of the updated analysis was to study the sensitivity of loss-of-campaign risk to such architectural factors as composition of the propellant delivery portion of the launch vehicle fleet (Ares V heavy-lift launch vehicle vs. smaller/cheaper commercial launchers) and the degree of launcher or Mars-bound spacecraft element sparing. Both a static PRA analysis and a dynamic, event-based Monte Carlo simulation were developed and used to evaluate the probability of loss of campaign under different sparing options. Results showed that with no sparing, loss-of-campaign risk is strongly driven by launcher count and on-orbit loiter duration, favoring an all-Ares V launch approach. Further, the reliability of the all-Ares V architecture showed significant improvement with the addition of a single spare launcher/payload. Among architectures utilizing a mix of Ares V and commercial launchers, those that minimized the on-orbit loiter duration of Mars-bound elements were found to exceed the reliability of no spare all-Ares V campaign if unlimited commercial vehicle sparing was assumed.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131790598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Performance degeneration analysis and reliability evaluation of servo valve 伺服阀性能退化分析及可靠性评价

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517672

Jinling Wang, Jianbin Guo, S. Zeng, Wensheng Shi

{"title":"Performance degeneration analysis and reliability evaluation of servo valve","authors":"Jinling Wang, Jianbin Guo, S. Zeng, Wensheng Shi","doi":"10.1109/RAMS.2013.6517672","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517672","url":null,"abstract":"Generally, products especially aviation products must satisfy rigorous demand on the performance sensitivity caused by uncertainty disturbance. As long as performance indexes overstep the specified range, the temporal failure would happen. Otherwise, long time degeneration becomes increasingly obvious with usage and further intensifies performance sensitivity. So performance reliability gradually degrades. However, traditional reliability assessment methods are distinctly deficient when applied to evaluate performance reliability considering degeneration. Therefore, an improved method is proposed in this research. The definition and expression of performance reliability are presented first, and the theory of performance reliability evaluation considering degeneration is also introduced. To solve the simulation problem for the long time, a multi Monte Carlo algorithm is proposed. In the case of servo valve, according the procedure of the performance reliability evaluation method, initial uncertainty disturbance sub-models of design parameters& environment & noise, and degenerated uncertainty disturbance sub-models are both established. Then two kinds of submodels are respectively injected into the performance model to construct the integrated performance and reliability model considering uncertainty and degeneration. Finally time-dependent performance reliability is evaluated via the multi Monte Carlo method. Simulation results demonstrate that the method in this study is feasible.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121703071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Estimating component reliabilities from incomplete system failure data 从不完整的系统故障数据中估计部件的可靠性

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517765

Huairui Guo, F. Szidarovszky, Pengying Niu

引用次数: 3

Reliability of phased-mission systems subject to competing failures 受竞争失效影响的分阶段任务系统的可靠性

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517701

Chaonan Wang, L. Xing, G. Levitin

{"title":"Reliability of phased-mission systems subject to competing failures","authors":"Chaonan Wang, L. Xing, G. Levitin","doi":"10.1109/RAMS.2013.6517701","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517701","url":null,"abstract":"This paper considers the reliability analysis of phased-mission systems (PMS) subject to competing failure propagation and failure isolation effects. A propagated failure with global effect (PFGE) originating from a system component is a failure that causes damage to all other system components besides the component itself. However, in systems subject to the functional dependence (FDEP) behavior, the failure of a trigger component can make the system insensitive to PFGE originating from the dependent components, i.e., the failure isolation effect. On the other hand, if the trigger component is still functioning when the PFGE of a dependent component happens, the failure propagation effect takes place causing the entire system failure. In summary, there exists competition between the failure isolation and failure propagation effects. Existing works addressing the above described competing failures focus only on single-phase systems. In this work, we propose a combinatorial algorithm for the reliability analysis of non-repairable PMS subject to the competing failures. The proposed approach is applicable to different types of time-to-failure distributions for the system components. A case study is given to demonstrate application and advantages of the proposed method.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125153762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Better bottom line through lower component stress 通过更低的组件压力，实现更好的底线

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517712

N. Bidokhti

{"title":"Better bottom line through lower component stress","authors":"N. Bidokhti","doi":"10.1109/RAMS.2013.6517712","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517712","url":null,"abstract":"This paper discusses the value of having a methodology and capability to de-risk the design from stress de-rating point of view and how to improve the bottom line by following and building enough margins in the design. As designs are becoming more complex and development time is getting shorter, the chance of designing overstressed components and introducing schematic connectivity errors increases significantly which could lead to higher number of failures. This scenario is a one of typical cases where the overall product bottom line is impacted. Electronic assemblies are utilizing complex circuitry with smarter and denser ICs with more than 1000 pins. Due to sophisticated features and requirements of new designs, power dissipation and temperatures are increasing that jeopardizes the design reliability and integrity for mission critical systems. In addition to lack of acceptable product performance, mission critical and non-critical products will experience higher number of returns where it directly impacts customer confidence and cost of ownership. The challenge for today's reliability and design engineers is to perform an analysis in a timely manner at the schematic level before the first prototype to identify overstressed components and pins to prevent hardware re-spin. The intent if this paper is to demonstrate methods that should be implemented during the design phase of electronic boards, which will help the designer and the reliability analyst to detect components with high operational stress. The stress level can be power, voltage, current or temperature. Through this technique, product time to market will be reduced and decreases the risk of hardware failures during product operation. The analysis will provide best rules for schematic modeling, stress analysis and the importance of de-rating standard in a design. The paper will include the results of more than 20 analysis performed utilizing the recommended best practices and how many re-spins were prevented. This analysis can be performed on any types of components such as analog, digital and RF.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124547906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Storage life prediction of electromagnetic relay based on PoF analysis 基于PoF分析的电磁继电器存储寿命预测

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517671

B. Wan, Guicui Fu, Nan Li, Youhu Zhao, Li Wang

{"title":"Storage life prediction of electromagnetic relay based on PoF analysis","authors":"B. Wan, Guicui Fu, Nan Li, Youhu Zhao, Li Wang","doi":"10.1109/RAMS.2013.6517671","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517671","url":null,"abstract":"This paper proposed a storage life prediction method for air sealed electromagnetic relay based on Physics of Failure (PoF) analysis by an Accelerated Storage Degradation Test (ASDT) of the electromagnetic relay to forecast the component failure. Firstly, an Accelerated Storage Degradation Test (ASDT) of air sealed electromagnetic relay is designed and implemented based on the storage failure mechanism. Secondly, the PoF analysis such as Scanning Electron Microscope (SEM) energy spectrum analysis is designed for the contact of relay after ASDT. The organic compound content on contact is analyzed at each temperature testing samples. Then the time series method is applied to model the degradation path and the storage life is predicted according to the characteristic of ASDT data. Finally, based on the relationship between prediction of the storage life and organic contamination degree of the contact, the PoF model of contact contamination of electromagnetic relay is proposed, which presents the relationship between the storage residual life and the carbon content of the organic compound on the contact. It is meaningful to avoiding the redundant preventive maintenance and saving the maintenance costs.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116039614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Effective R&M activities 有效的R&M活动

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517702

A. Foote

引用次数: 0

Integrated circuit reliability prediction based on physics-of-failure models in conjunction with field study 基于失效物理模型的集成电路可靠性预测与现场研究

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517737

A. Hava, J. Qin, J. Bernstein, Y. Bot

引用次数: 13

Defect types and surveillance strategies for one-shot items 一次性项目的缺陷类型和监视策略

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517631

R. Bierbaum, A. Robertson

引用次数: 0

Pre-proposal assessment of reliability for spacecraft docking with limited information 有限信息条件下航天器对接可靠性预评估

2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517719

A. Brall

{"title":"Pre-proposal assessment of reliability for spacecraft docking with limited information","authors":"A. Brall","doi":"10.1109/RAMS.2013.6517719","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517719","url":null,"abstract":"This paper addresses the problem of estimating the reliability of a critical system function as well as its impact on the system reliability when limited information is available. The approach addresses the basic function reliability, and then the impact of multiple attempts to accomplish the function. The dependence of subsequent attempts on prior failure to accomplish the function is also addressed. The autonomous docking of two spacecraft was the specific example that generated the inquiry, and the resultant impact on total reliability generated substantial interest in presenting the results due to the relative insensitivity of overall performance to basic function reliability and moderate degradation given sufficient attempts to try and accomplish the required goal. The application of the methodology allows proper emphasis on the characteristics that can be estimated with some knowledge, and to insulate the integrity of the design from those characteristics that can't be properly estimated with any rational value of uncertainty. The nature of NASA's missions contains a great deal of uncertainty due to the pursuit of new science or operations. This approach can be applied to any function where multiple attempts at success, with or without degradation, are allowed.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132661750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1