MicromachinesPub Date : 2025-08-30DOI: 10.3390/mi16091002
Somnath Mahato, Hendradi Hardhienata, Muhammad Danang Birowosuto
{"title":"Perovskites to Photonics: Engineering NIR LEDs for Photobiomodulation.","authors":"Somnath Mahato, Hendradi Hardhienata, Muhammad Danang Birowosuto","doi":"10.3390/mi16091002","DOIUrl":"10.3390/mi16091002","url":null,"abstract":"<p><p>Photobiomodulation (PBM) harnesses near-infrared (NIR) light to stimulate cellular processes, offering non-invasive treatment options for a range of conditions, including chronic wounds, inflammation, and neurological disorders. NIR light-emitting diodes (LEDs) are emerging as safer and more scalable alternatives to conventional lasers, but optimizing their performance for clinical use remains a challenge. This perspective explores the latest advances in NIR-emitting materials, spanning Group III-V, IV, and II-VI semiconductors, organic small molecules, polymers, and perovskites, with an emphasis on their applicability to PBM. Particular attention is given to the promise of perovskite LEDs, including lead-free and lanthanide-doped variants, for delivering narrowband, tunable NIR emission. Furthermore, we examine photonic and plasmonic engineering strategies that enhance light extraction, spectral precision, and device efficiency. By integrating advances in materials science and nanophotonics, it is increasingly feasible to develop flexible, biocompatible, and high-performance NIR LEDs tailored for next-generation therapeutic applications.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12472156/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-30DOI: 10.3390/mi16091005
Wenbo Wu, Jie Wang, Jiangtao Su, Zhanfei Chen, Zhiping Yu
{"title":"Characteristics Prediction and Optimization of GaN CAVET Using a Novel Physics-Guided Machine Learning Method.","authors":"Wenbo Wu, Jie Wang, Jiangtao Su, Zhanfei Chen, Zhiping Yu","doi":"10.3390/mi16091005","DOIUrl":"10.3390/mi16091005","url":null,"abstract":"<p><p>This paper presents a physics-guided machine learning (PGML) approach to model the I-V characteristics of GaN current aperture vertical field effect transistors (CAVET). By adopting the method of transfer learning and the shortcut structure, a physically guided neural network model is established. The shallow neural network with tanh as the basis function is combined with a hypernetwork that dynamically generates its weight parameters. The influence of transconductance is added to the loss function. This model can synchronously predict the output and transfer characteristics of the device. Under the condition of small samples, the prediction error is controlled within 5%, and the R2 value reaches above 0.99. The proposed PGML approach outperforms conventional approaches, ensuring physically meaningful and robust predictions for device optimization and circuit-level simulations.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12471978/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-30DOI: 10.3390/mi16091003
Yange Sun, Guangxu Huang, Chenglong Xu, Huaping Guo, Yan Feng
{"title":"Photovoltaic Cell Surface Defect Detection via Subtle Defect Enhancement and Background Suppression.","authors":"Yange Sun, Guangxu Huang, Chenglong Xu, Huaping Guo, Yan Feng","doi":"10.3390/mi16091003","DOIUrl":"10.3390/mi16091003","url":null,"abstract":"<p><p>As the core component of photovoltaic (PV) power generation systems, PV cells are susceptible to subtle surface defects, including thick lines, cracks, and finger interruptions, primarily caused by stress and material brittleness during the manufacturing process. These defects substantially degrade energy conversion efficiency by inducing both optical and electrical losses, yet existing detection methods struggle to precisely identify and localize them. In addition, the complexity of background noise and other factors further increases the challenge of detecting these subtle defects. To address these challenges, we propose a novel PV Cell Surface Defect Detector (PSDD) that extracts subtle defects both within the backbone network and during feature fusion. In particular, we propose a plug-and-play Subtle Feature Refinement Module (SFRM) that integrates into the backbone to enhance fine-grained feature representation by rearranging local spatial features to the channel dimension, mitigating the loss of detail caused by downsampling. SFRM further employs a general attention mechanism to adaptively enhance key channels associated with subtle defects, improving the representation of fine defect features. In addition, we propose a Background Noise Suppression Block (BNSB) as a key component of the feature aggregation stage, which employs a dual-path strategy to fuse multiscale features, reducing background interference and improving defect saliency. Specifically, the first path uses a Background-Aware Module (BAM) to adaptively suppress noise and emphasize relevant features, while the second path adopts a residual structure to retain the original input features and prevent the loss of critical details. Experiments show that PSDD outperforms other methods, achieving the highest mAP50 scores of 93.6% on the PVEL-AD.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12472073/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-29DOI: 10.3390/mi16090999
Hao Lu, Xiaorun Hao, Yichi Zhang, Ling Yang, Bin Hou, Meng Zhang, Mei Wu, Xiaohua Ma, Yue Hao
{"title":"Recent Progress of Ion Implantation Technique in GaN-Based Electronic Devices.","authors":"Hao Lu, Xiaorun Hao, Yichi Zhang, Ling Yang, Bin Hou, Meng Zhang, Mei Wu, Xiaohua Ma, Yue Hao","doi":"10.3390/mi16090999","DOIUrl":"10.3390/mi16090999","url":null,"abstract":"<p><p>Gallium nitride (GaN) offers exceptional material properties, making it indispensable in communications, defense, and power electronics. With high electron mobility and robust thermal conductivity, GaN-based devices excel in high-frequency, high-power applications. They are vital in wireless communication systems, radar, electronic warfare, and power electronics systems, offering superior performance, efficiency, and reliability. Further research is crucial for optimizing GaN-based devices performance and expanding their applications, driving innovation across industries. The application of ion implantation technology in GaN-based devices is a key process that can be used to improve device performance and characteristics, which enables process aspects such as electrical isolation, ion implantation for ohmic contacts, threshold voltage regulation, and terminal design. In this paper, we will focus on reviewing the principles and issues of the ion implantation process in GaN-based device preparation. This work aims to serve as a guide for ion implantation in future GaN-based devices.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12471583/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-29DOI: 10.3390/mi16090991
Xiaorui Dong, Shijing Han
{"title":"Real-Time Correction and Long-Term Drift Compensation in MOS Gas Sensor Arrays Using Iterative Random Forests and Incremental Domain-Adversarial Networks.","authors":"Xiaorui Dong, Shijing Han","doi":"10.3390/mi16090991","DOIUrl":"10.3390/mi16090991","url":null,"abstract":"<p><p>Sensor arrays serve a crucial role in various fields such as environmental monitoring, industrial process control, and medical diagnostics, yet their reliability remains challenged by sensor drift and noise contamination. This study presents a novel framework for real-time data error correction and long-term drift compensation utilizing an iterative random forest-based error correction algorithm paired with an Incremental Domain-Adversarial Network (IDAN). The iterative random forest algorithm leverages the collective data from multiple sensor channels to identify and rectify abnormal sensor responses in real time. The IDAN integrates domain-adversarial learning principles with an incremental adaptation mechanism to effectively manage temporal variations in sensor data. Experiments utilizing the metal oxide semiconductor gas sensor array drift dataset demonstrate that the combination of these approaches significantly enhances data integrity and operational efficiency, achieving a robust and good accuracy even in the presence of severe drift. This study underscores the efficacy of integrating advanced artificial intelligence techniques for the ongoing evolution of sensor array technology, paving the way for enhanced monitoring systems capable of sustaining high levels of performance over extended time periods.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12471586/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-29DOI: 10.3390/mi16090997
Yi Wu, Bin Deng, Qinghua Zhao, Tuo Ye, Anmin Liu, Wenbo Jiang
{"title":"High-Order Exponentially Fitted Methods for Accurate Prediction of Milling Stability.","authors":"Yi Wu, Bin Deng, Qinghua Zhao, Tuo Ye, Anmin Liu, Wenbo Jiang","doi":"10.3390/mi16090997","DOIUrl":"10.3390/mi16090997","url":null,"abstract":"<p><p>Regenerative chatter is an unfavorable phenomenon that severely affects machining efficiency and surface finish in milling operations. The prediction of chatter stability is an important way to obtain the stable cutting zone. Based on implicit multistep schemes, this paper presents the third-order and fourth-order implicit exponentially fitted methods (3rd IEM and 4th IEM) for milling stability prediction. To begin with, the delay differential equations (DDEs) with time-periodic coefficients are employed to describe the milling dynamics models, and the principal period of the coefficient matrix is firstly decomposed into two different subintervals according to the cutting state. Subsequently, the fourth-step and fifth-step implicit exponential fitting schemes are applied to more accurately estimate the state term. Two benchmark milling models are utilized to illustrate the effectiveness and advantages of the high-order implicit exponentially fitted methods by making comparisons with the three typical existing methods. Under different radial immersion conditions, the numerical results demonstrate that the 3rd IEM and the 4th IEM exhibit both faster convergence rates and higher prediction accuracy than the other three existing prediction methods, without much loss of computational efficiency. Finally, in order to verify the feasibility of the 3rd IEM and the 4th IEM, a series of experimental verifications are conducted using a computer numerical control machining center. It is clearly visible that the stability boundaries predicted by the 3rd IEM and the 4th IEM are mostly consistent with the cutting test results, which indicates that the proposed high-order exponentially fitted methods achieve significantly better prediction performance for actual milling processes.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12472104/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-29DOI: 10.3390/mi16091001
Lijun Yang, Yu Hang, Renjie Liu, Zongan Li, Ye Wu
{"title":"Effects of Geometric Parameters on Mixing Efficiency and Optimization in Variable Cross Section Microchannels.","authors":"Lijun Yang, Yu Hang, Renjie Liu, Zongan Li, Ye Wu","doi":"10.3390/mi16091001","DOIUrl":"10.3390/mi16091001","url":null,"abstract":"<p><p>Micromixers are important devices used in many fields for various applications which provide high mixing efficiencies and reduce the amount of reagents and samples. In addition, effective premixing of reactants is essential for obtaining high reaction rates. In order to further improve the mixing performance, three-dimensional numerical simulations and optimizations of the flow and mixing characteristics within a variable cross section T-shaped micromixer were carried out. The effects of the geometric parameters containing channel diameter, channel shape, channel contraction and expansion ratio, and number of expansion units on the mixing were investigated with the evaluation criteria of mixing index and performance index. The optimized geometric parameters of the channel were a diameter of 0.2 mm, the shape of Sem channel, an expansion ratio of 1:3, and a number of expansion units of 7, respectively. It can be showed that the mixing efficiency of the optimized micromixer was greatly improved, and the mixing index at different velocities could reach up to more than 0.98.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12471991/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Research on Spatial Optical Path System for Evaluating the Reflection Performance of Quartz-Based Volume Bragg Grating Applied to Fabry-Perot Cavity.","authors":"Jiamin Chen, Gengchen Zhang, Hejin Wang, Qianyu Ren, Yongqiu Zheng, Chenyang Xue","doi":"10.3390/mi16090998","DOIUrl":"10.3390/mi16090998","url":null,"abstract":"<p><p>In the field of high-temperature in situ sensing, highly reflective Fabry-Perot (F-P) cavity mirrors with thermal stress matching are urgently needed. The quartz-based volume Bragg grating (VBG) can replace the dielectric high-reflection film to prepare a high-temperature and high-precision F-P cavity sensitive unit by virtue of the integrated structure of homogeneous materials. The reflectivity of the VBG is a key parameter determining the performance of the F-P cavity, and its accurate measurement is very important for the pre-evaluation of the device's sensing ability. Based on the reflectivity measurement of quartz-based VBG with a large aspect ratio, a free-space optical path reflective measurement system is proposed. The ZEMAX simulation is used to optimize the optical transmission path and determine the position of each component when the optimal spot size is achieved. After completing the construction of the VBG reflectivity measurement system, the measurement error is calibrated by measuring the optical path loss, and the maximum error is only 1.2%. Finally, the reflectivity of the VBG measured by the calibrated system is 30.84%, which is basically consistent with the multi-physical field simulation results, showing a deviation as low as 0.85%. The experimental results fully verify the availability and high measurement accuracy of the reflectivity measurement system. This research work provides a new method for testing the characteristics of micron-scale grating size VBGs. Additionally, this work combines optical characterization methods to verify the good effect of VBG preparation technology, providing core technical support for the realization of subsequent homogeneous integrated Fabry-Perot cavity sensors. Furthermore, it holds important application value in the field of optical sensing and micro-nano integration.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12472014/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-29DOI: 10.3390/mi16090990
Zhongtian Liu, Hao Zheng, Chunwei Li, Zunhan Qi, Cunwei Zhang, Tie Li, Zhenxu Bai
{"title":"Advances in Laser Linewidth Measurement Techniques: A Comprehensive Review.","authors":"Zhongtian Liu, Hao Zheng, Chunwei Li, Zunhan Qi, Cunwei Zhang, Tie Li, Zhenxu Bai","doi":"10.3390/mi16090990","DOIUrl":"10.3390/mi16090990","url":null,"abstract":"<p><p>As a key parameter that defines the spectral characteristics of lasers, the precise measurement of laser linewidth is crucial for a wide range of advanced applications. This review systematically summarizes recent advances in laser linewidth measurement techniques, covering methods applicable from GHz-level broad linewidths to sub-Hz ultranarrow regimes. We begin by presenting representative applications of lasers with varying linewidth requirements, followed by the physical definition of linewidth and a discussion of the fundamental principles underlying its measurement. For broader linewidth regimes, we review two established techniques: direct spectral measurement using high-resolution spectrometers and Fabry-Pérot interferometer-based analysis. In the context of narrow-linewidth lasers, particular emphasis is placed on the optical beating method. A detailed comparison is provided between two dominant approaches: power spectral density (PSD) analysis of the beat signal and phase-noise-based linewidth evaluation. For each technique, we discuss the working principles, experimental configurations, achievable resolution, and limitations, along with comparative assessments of their advantages and drawbacks. Additionally, we critically examine recent innovations in ultra-high-precision linewidth metrology. This review aims to serve as a comprehensive technical reference for the development, characterization, and application of lasers across diverse spectral regimes.</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12471392/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
MicromachinesPub Date : 2025-08-29DOI: 10.3390/mi16090995
Hajra Hameed, Abdul Waheed, Muhammad Shakeeb Sharif, Muhammad Saleem, Afshan Afreen, Muhammad Tariq, Asif Kamal, Wedad A Al-Onazi, Dunia A Al Farraj, Shabir Ahmad, Rania M Mahmoud
{"title":"Correction: Hameed et al. Green Synthesis of Zinc Oxide (ZnO) Nanoparticles from Green Algae and Their Assessment in Various Biological Applications. <i>Micromachines</i> 2023, <i>14</i>, 928.","authors":"Hajra Hameed, Abdul Waheed, Muhammad Shakeeb Sharif, Muhammad Saleem, Afshan Afreen, Muhammad Tariq, Asif Kamal, Wedad A Al-Onazi, Dunia A Al Farraj, Shabir Ahmad, Rania M Mahmoud","doi":"10.3390/mi16090995","DOIUrl":"10.3390/mi16090995","url":null,"abstract":"<p><p>Following publication, concerns were raised regarding the peer-review process related to the publication of this article [...].</p>","PeriodicalId":18508,"journal":{"name":"Micromachines","volume":"16 9","pages":""},"PeriodicalIF":3.0,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12471982/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145176261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}