IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena最新文献_第6页

The influence of instantaneous value and dv/dt of applied voltage upon electrical treeing deterioration 外加电压瞬时值和dv/dt对电气树退化的影响

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634623

K. Osawa, K. Urano, Y. Ehara, H. Kishida, T. Ito

{"title":"The influence of instantaneous value and dv/dt of applied voltage upon electrical treeing deterioration","authors":"K. Osawa, K. Urano, Y. Ehara, H. Kishida, T. Ito","doi":"10.1109/CEIDP.1997.634623","DOIUrl":"https://doi.org/10.1109/CEIDP.1997.634623","url":null,"abstract":"In this study, we performed to analyze the treeing phenomena with a void by discharge magnitude and discharge luminous quantity in each phase angle area. The purpose of this study was to apply this analysis to the diagnosis of degradation by electrical treeing. The discharge magnitude and discharge luminous image were measured by the original measurement system to analyze discharge pulses and discharge luminescence at several phase angle areas of applied voltage. One cycle of applied voltage was divided into twenty areas, which were named /spl phi/ 1/spl sim//spl phi/ 20 in order from the negative peak point of applied ac voltage. Each phase angle area has informations of applied voltage that are instantaneous value, differential value of applied voltage (dv/dt) and the product of instantaneous value and dv/dt. The results of this analysis indicate that instantaneous value and dv/dt of applied voltage have a close relation with electrical treeing phenomena. Hence, we investigated the influence of instantaneous value and dv/dt of applied voltage upon electrical treeing phenomena.","PeriodicalId":176239,"journal":{"name":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"161 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129078169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Frequency dependence of electrical conduction of composites below the percolation threshold 渗透阈值以下复合材料导电性的频率依赖性

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634593

S. Nakamura, T. Minami, G. Sawa, K. Kitagawa

引用次数: 0

Dielectric surface flashover in vacuum at cryogenic temperature (100 K) 低温(100k)真空介质表面闪络

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.641139

A. Neuber, H. Krompholz, L. Hatfield

{"title":"Dielectric surface flashover in vacuum at cryogenic temperature (100 K)","authors":"A. Neuber, H. Krompholz, L. Hatfield","doi":"10.1109/CEIDP.1997.641139","DOIUrl":"https://doi.org/10.1109/CEIDP.1997.641139","url":null,"abstract":"Recent developments in high power systems use cryogenic components, where the performance of insulators at such low temperatures is unknown. In a fast coaxial setup, electrodes and dielectric sample are cooled to less than 100 K in vacuum, and the flashover initiation processes for gap distances on the order of 1 cm are characterized using fast electrical and optical diagnostics. As reported before, two development stages can be distinguished: a first phase with slowly rising current and the presence of free electrons, with a duration of 10-50 ns, and a second stage with a fast current rise due to gaseous ionization and collision dominated electrons. First experiments comparing cooled samples and samples at room temperature do not show discernible differences for Lexan. For Alumina, however, an increase of the duration of phase 1 is observed, with a higher current amplitude at the transition from phase one to phase two. Also, the current rise in phase two is reduced. These results indicate a temperature dependence of the electron induced outgassing process which is expected to cause the transition from phase one to phase two.","PeriodicalId":176239,"journal":{"name":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131904082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

Application of artificial neural network for modelling of discharge inception voltage 人工神经网络在放电起始电压建模中的应用

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.641122

S. Ghosh, N. Kishore

引用次数: 2

An examination of the environments for aging of polymers 对聚合物老化环境的检查

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634631

N. Frost, G. Xu, P. McGrath

引用次数: 15

Assessment of insulation condition of 130 kV oil-paper current transformers using return voltage measurements and an expert system 用回电压测量和专家系统评价130kv油纸电流互感器绝缘状况

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634596

A. Krivda, R. Neimanis, S. Gubanski

引用次数: 12

The combined effect of partial discharges and temperature on void surfaces 局部放电和温度对空洞表面的综合影响

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.641133

A.C. Gjaerde

{"title":"The combined effect of partial discharges and temperature on void surfaces","authors":"A.C. Gjaerde","doi":"10.1109/CEIDP.1997.641133","DOIUrl":"https://doi.org/10.1109/CEIDP.1997.641133","url":null,"abstract":"Voltage stress, thermal stress and time of pd-exposure are parameters that influence the deterioration of void surfaces. A qualitative comparison of the degradation caused by these parameters has been made by accelerated ageing tests using different temperatures and voltages. The electrode system applied in the tests contained a flat cylindrical void with epoxy on one side and a stainless steel electrode on the other side. The surface degradation was examined by light-microscope and scanning electron microscope (SEM). The intention of the study was to look for characteristic features of the surface degradation, primarily of the epoxy, at the different ageing levels. Comparison of the aged void surfaces was performed at different ageing times. The results show that the deterioration patterns of the epoxy surface obtained at different ageing temperatures are clearly distinguishable. Typically, the deterioration pattern at room temperature was diffuse, while at 50/spl deg/C the surface exhibited a variegated and distinct pattern. The deterioration was hardly visible in case of 80/spl deg/C, the glass transition temperature of the epoxy specimen. The results add knowledge to the different modes of pd-erosion resulting from synergy with temperature.","PeriodicalId":176239,"journal":{"name":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126685275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

High-field dissipation current waveforms in e-beam irradiated XLPE film superposed by DC ramp voltage 直流斜坡电压叠加下电子束辐照XLPE薄膜的高场耗散电流波形

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634580

K. Tohyama, T. Tokoro, S. Mitsumoto, M. Nagao, M. Kosaki

引用次数: 1

Charge/discharge and interfacial properties of Li/sub x/V/sub 3/O/sub 8//Li cells with polymer electrolyte 聚合物电解质下Li/sub x/V/sub 3/O/sub 8//Li电池的充放电和界面特性

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634591

Jong-Uk Kim, Chang-Ho Sung, H. Gu

引用次数: 0

Water treeing retardant materials for cable insulators 电缆绝缘子水树阻燃材料

IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 1997-10-19 DOI: 10.1109/CEIDP.1997.634621

L. Castellani, F. Peruzzotti, A. Zaopo, P. Cinquemani, S. Foulger, J. Filippini, V. Lachevre

引用次数: 4