The combined effect of partial discharges and temperature on void surfaces

A.C. Gjaerde
{"title":"The combined effect of partial discharges and temperature on void surfaces","authors":"A.C. Gjaerde","doi":"10.1109/CEIDP.1997.641133","DOIUrl":null,"url":null,"abstract":"Voltage stress, thermal stress and time of pd-exposure are parameters that influence the deterioration of void surfaces. A qualitative comparison of the degradation caused by these parameters has been made by accelerated ageing tests using different temperatures and voltages. The electrode system applied in the tests contained a flat cylindrical void with epoxy on one side and a stainless steel electrode on the other side. The surface degradation was examined by light-microscope and scanning electron microscope (SEM). The intention of the study was to look for characteristic features of the surface degradation, primarily of the epoxy, at the different ageing levels. Comparison of the aged void surfaces was performed at different ageing times. The results show that the deterioration patterns of the epoxy surface obtained at different ageing temperatures are clearly distinguishable. Typically, the deterioration pattern at room temperature was diffuse, while at 50/spl deg/C the surface exhibited a variegated and distinct pattern. The deterioration was hardly visible in case of 80/spl deg/C, the glass transition temperature of the epoxy specimen. The results add knowledge to the different modes of pd-erosion resulting from synergy with temperature.","PeriodicalId":176239,"journal":{"name":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1997 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1997.641133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Voltage stress, thermal stress and time of pd-exposure are parameters that influence the deterioration of void surfaces. A qualitative comparison of the degradation caused by these parameters has been made by accelerated ageing tests using different temperatures and voltages. The electrode system applied in the tests contained a flat cylindrical void with epoxy on one side and a stainless steel electrode on the other side. The surface degradation was examined by light-microscope and scanning electron microscope (SEM). The intention of the study was to look for characteristic features of the surface degradation, primarily of the epoxy, at the different ageing levels. Comparison of the aged void surfaces was performed at different ageing times. The results show that the deterioration patterns of the epoxy surface obtained at different ageing temperatures are clearly distinguishable. Typically, the deterioration pattern at room temperature was diffuse, while at 50/spl deg/C the surface exhibited a variegated and distinct pattern. The deterioration was hardly visible in case of 80/spl deg/C, the glass transition temperature of the epoxy specimen. The results add knowledge to the different modes of pd-erosion resulting from synergy with temperature.
局部放电和温度对空洞表面的综合影响
电压应力、热应力和暴露时间是影响空洞表面劣化的参数。通过不同温度和电压下的加速老化试验,对这些参数引起的退化进行了定性比较。在测试中应用的电极系统包含一个平坦的圆柱形空隙,一边是环氧树脂,另一边是不锈钢电极。采用光镜和扫描电镜对其表面降解情况进行了观察。该研究的目的是寻找不同老化水平下表面降解的特征,主要是环氧树脂的特征。对不同时效时间下的孔隙表面进行了对比。结果表明,在不同老化温度下得到的环氧树脂表面劣化模式有明显区别。室温下的劣化模式呈弥漫性,而在50℃时,劣化模式呈现出明显的杂色。当环氧树脂试样的玻璃化转变温度为80℃时,变质几乎不明显。研究结果增加了人们对温度协同作用下pd侵蚀的不同模式的认识。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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