Journal of Research of the National Institute of Standards and Technology最新文献_第9页

First-Principles Calculation of the Third Virial Coefficient of Helium. 氦气第三室温系数的第一原理计算。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-10-01 Print Date: 2009-09-01 DOI: 10.6028/jres.114.018

Giovanni Garberoglio, Allan H Harvey

引用次数: 0

Perturbations From Ducts on the Modes of Acoustic Thermometers. 管道对声温度计模态的扰动。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-10-01 Print Date: 2009-09-01 DOI: 10.6028/jres.114.019

K A Gillis, H Lin, M R Moldover

{"title":"Perturbations From Ducts on the Modes of Acoustic Thermometers.","authors":"K A Gillis, H Lin, M R Moldover","doi":"10.6028/jres.114.019","DOIUrl":"https://doi.org/10.6028/jres.114.019","url":null,"abstract":"We examine the perturbations of the modes of an acoustic thermometer caused by circular ducts used either for gas flow or as acoustic waveguides coupled to remote transducers. We calculate the acoustic admittance of circular ducts using a model based on transmission line theory. The admittance is used to calculate the perturbations to the resonance frequencies and half-widths of the modes of spherical and cylindrical acoustic resonators as functions of the duct's radius, length, and the locations of the transducers along the duct's length. To verify the model, we measured the complex acoustic admittances of a series of circular tubes as a function of length between 200 Hz and 10 kHz using a three-port acoustic coupler. The absolute magnitude of the specific acoustic admittance is approximately one. For a 1.4 mm inside-diameter, 1.4 m long tube, the root mean square difference between the measured and modeled specific admittances (both real and imaginary parts) over this frequency range was 0.018. We conclude by presenting design considerations for ducts connected to acoustic thermometers.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2009-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4646578/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"34353629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 32

Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers. CCD阵列光谱仪的波长校准和光谱响应校正程序。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-08-01 Print Date: 2009-07-01 DOI: 10.6028/jres.114.015

A K Gaigalas, Lili Wang, Hua-Jun He, Paul DeRose

{"title":"Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers.","authors":"A K Gaigalas, Lili Wang, Hua-Jun He, Paul DeRose","doi":"10.6028/jres.114.015","DOIUrl":"https://doi.org/10.6028/jres.114.015","url":null,"abstract":"This work describes a procedure for acquiring a spectrum of an analyte over an extended range of wavelengths and validating the wavelength and intensity assignments. To acquire a spectrum over an extended range of wavelengths with a spectrometer with a charge coupled device (CCD) array detector, it is necessary to acquire many partial spectra, each at a different angular position of the grating, and splice the partial spectra into a single extended spectrum. The splicing procedure exposes instrument dependent artifacts. It is demonstrated that by taking a spectrum of a reference irradiance source and making spectral correction, the artifacts exposed by the splicing are removed from the analyte spectrum. This is because the irradiance reference spectrum contains the same artifacts as the analyte spectrum. The artifacts exposed by the splicing depend on the wavelength of the splice; therefore it is important to measure the irradiance reference spectrum for the same range of wavelengths used to measure the spectrum of the analyte solution. In other words, there is no general spectral correction factor which is applicable to spectra taken for different range of wavelengths. The wavelength calibration is also carried out by splicing many partial spectra from a source like a krypton lamp. However the wavelength assignments are not sensitive to the splicing procedure and the same wavelength calibration can be used for spectra acquired over different extended wavelength ranges. The wavelength calibration checks the validity of the setting of the grating angular position, and the assignment of wavelengths to individual pixels on the CCD array detector. The procedure is illustrated by measuring the spectrum of an orange glass and the spectrum of a suspension of microalgae.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.114.015","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"34646792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 47

A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies. 为美国测量系统(USMS)需求分配优先级的方法:纳米电子技术。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-08-01 Print Date: 2009-07-01 DOI: 10.6028/jres.114.017

Herbert S Bennett, Howard Andres, Joan Pellegrino

{"title":"A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies.","authors":"Herbert S Bennett, Howard Andres, Joan Pellegrino","doi":"10.6028/jres.114.017","DOIUrl":"https://doi.org/10.6028/jres.114.017","url":null,"abstract":"In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement results. As part of that assessment, NIST collaborated with Energetics Incorporated to identify and authenticate 723 measurement needs that are barriers to technological innovations. A number of these measurement needs (64) are relevant to accelerating innovation and commercialization of nano-electrotechnologies. In this paper, we apply the taxonomy from a 2008 international survey that established a global consensus of priorities for standards and measurements in nano-electrotechnologies to rank in priority order the relevant 64 USMS-identified measurement needs. This paper presents a method for assigning priorities that is statistically based and represents a global consensus of stakeholders. Such a method is needed because limited resources exist to address the large number of measurement needs in nano-electrotechnologies, and the most critical measurement needs should be addressed first.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4651608/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"34646797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Design of the DEMO Fusion Reactor Following ITER. ITER之后演示聚变反应堆的设计。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-08-01 Print Date: 2009-07-01 DOI: 10.6028/jres.114.016

Paul R Garabedian, Geoffrey B McFadden

{"title":"Design of the DEMO Fusion Reactor Following ITER.","authors":"Paul R Garabedian, Geoffrey B McFadden","doi":"10.6028/jres.114.016","DOIUrl":"https://doi.org/10.6028/jres.114.016","url":null,"abstract":"Runs of the NSTAB nonlinear stability code show there are many three-dimensional (3D) solutions of the advanced tokamak problem subject to axially symmetric boundary conditions. These numerical simulations based on mathematical equations in conservation form predict that the ITER international tokamak project will encounter persistent disruptions and edge localized mode (ELMS) crashes. Test particle runs of the TRAN transport code suggest that for quasineutrality to prevail in tokamaks a certain minimum level of 3D asymmetry of the magnetic spectrum is required which is comparable to that found in quasiaxially symmetric (QAS) stellarators. The computational theory suggests that a QAS stellarator with two field periods and proportions like those of ITER is a good candidate for a fusion reactor. For a demonstration reactor (DEMO) we seek an experiment that combines the best features of ITER, with a system of QAS coils providing external rotational transform, which is a measure of the poloidal field. We have discovered a configuration with unusually good quasisymmetry that is ideal for this task.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4651607/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"34646793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 14

Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy. 临界维原子力显微镜中探针动态行为的表征。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-08-01 Print Date: 2009-07-01 DOI: 10.6028/jres.114.014

Shaw C Feng, Che Bong Joung, Theodore V Vorburger

{"title":"Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy.","authors":"Shaw C Feng, Che Bong Joung, Theodore V Vorburger","doi":"10.6028/jres.114.014","DOIUrl":"https://doi.org/10.6028/jres.114.014","url":null,"abstract":"This paper describes a detailed computational model of the interaction between an atomic force microscope probe tip and a sample surface. The model provides analyses of dynamic behaviors of the tip to estimate the probe deflections due to surface intermittent contact and the resulting dimensional biases and uncertainties. Probe tip and cantilever beam responses to intermittent contact between the probe tip and sample surface are computed using the finite element method. Intermittent contacts with a wall and a horizontal surface are computed and modeled, respectively. Using a 75 nm Critical Dimension (CD) tip as an example, the responses of the probe to interaction forces between the sample surface and the probe tip are shown in both time and frequency domains. In particular, interaction forces between the tip and both a vertical wall and a horizontal surface of a silicon sample are modeled using Lennard-Jones theory. The Snap-in and Snap-out of the probe tip in surface scanning are calculated and shown in the time domain. Based on the given tip-sample interaction force model, the calculation includes the compliance of the probe and dynamic forces generated by an excitation. Cantilever and probe tip deflections versus interaction forces in the time domain can be derived for both vertical contact with a plateau and horizontal contact with a side wall. Dynamic analysis using the finite element method and Lennard-Jones model provide a unique means to analyze the interaction of the probe and sample, including calculation of the deflection and the gap between the probe tip and the measured sample surface.","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4651605/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"34646791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

High Speed Quantum Key Distribution Over Optical Fiber Network System. 光纤网络系统中的高速量子密钥分配。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-06-01 Print Date: 2009-05-01 DOI: 10.6028/jres.114.010

Lijun Ma, Alan Mink, Xiao Tang

引用次数: 12

Calibration of Speed Enforcement Down-The-Road Radars. 公路超速执法雷达的校正。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-06-01 Print Date: 2009-05-01 DOI: 10.6028/jres.114.009

John Jendzurski, Nicholas G Paulter

引用次数: 19

The Detection of Lyman Alpha Radiation Formed by the Slowing Down of Protons and Tritons Produced by the (3)He (n, tp) Reaction-A Model Study. (3)He (n, tp)反应产生的质子和triton减速形成的Lyman α辐射的探测- a模型研究

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-06-01 Print Date: 2009-05-01 DOI: 10.6028/jres.114.012

John W Cooper, Michael A Coplan, Patrick P Hughes

引用次数: 3

Pass-Fail Testing: Statistical Requirements and Interpretations. 合格-不合格测试:统计要求和解释。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-06-01 Print Date: 2009-05-01 DOI: 10.6028/jres.114.013

David Gilliam, Stefan Leigh, Andrew Rukhin, William Strawderman

引用次数: 15