A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies.

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-08-01 Print Date: 2009-07-01 DOI:10.6028/jres.114.017

Herbert S Bennett, Howard Andres, Joan Pellegrino

{"title":"A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies.","authors":"Herbert S Bennett, Howard Andres, Joan Pellegrino","doi":"10.6028/jres.114.017","DOIUrl":null,"url":null,"abstract":"<p><p>In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement results. As part of that assessment, NIST collaborated with Energetics Incorporated to identify and authenticate 723 measurement needs that are barriers to technological innovations. A number of these measurement needs (64) are relevant to accelerating innovation and commercialization of nano-electrotechnologies. In this paper, we apply the taxonomy from a 2008 international survey that established a global consensus of priorities for standards and measurements in nano-electrotechnologies to rank in priority order the relevant 64 USMS-identified measurement needs. This paper presents a method for assigning priorities that is statistically based and represents a global consensus of stakeholders. Such a method is needed because limited resources exist to address the large number of measurement needs in nano-electrotechnologies, and the most critical measurement needs should be addressed first.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5000,"publicationDate":"2009-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4651608/pdf/","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.114.017","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2009/7/1 0:00:00","PubModel":"Print","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

Abstract

In 2006, the National Institute of Standards and Technology conducted an assessment of the U.S. measurement system (USMS), which encompasses all private and public organizations that develop, supply, use, or ensure the validity of measurement results. As part of that assessment, NIST collaborated with Energetics Incorporated to identify and authenticate 723 measurement needs that are barriers to technological innovations. A number of these measurement needs (64) are relevant to accelerating innovation and commercialization of nano-electrotechnologies. In this paper, we apply the taxonomy from a 2008 international survey that established a global consensus of priorities for standards and measurements in nano-electrotechnologies to rank in priority order the relevant 64 USMS-identified measurement needs. This paper presents a method for assigning priorities that is statistically based and represents a global consensus of stakeholders. Such a method is needed because limited resources exist to address the large number of measurement needs in nano-electrotechnologies, and the most critical measurement needs should be addressed first.

Abstract Image

查看原文本刊更多论文

为美国测量系统(USMS)需求分配优先级的方法:纳米电子技术。

2006年，美国国家标准与技术研究所(National Institute of Standards and Technology)对美国测量系统(USMS)进行了评估，该系统涵盖了所有开发、供应、使用或确保测量结果有效性的私营和公共组织。作为评估的一部分，NIST与Energetics公司合作，确定并验证了723种测量需求，这些需求是技术创新的障碍。这些测量需求中的许多(64)与加速纳米电子技术的创新和商业化有关。在本文中，我们应用2008年国际调查的分类，该调查建立了纳米电子技术标准和测量的全球优先共识，以优先顺序排列相关的64个美国科学院确定的测量需求。本文提出了一种分配优先级的方法，该方法基于统计并代表了利益相关者的全球共识。这种方法是必要的，因为现有的资源有限，无法满足纳米电技术中大量的测量需求，而最关键的测量需求应该首先得到解决。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Journal of Research of the National Institute of Standards and Technology Engineering-General Engineering

自引率

33.30%

发文量

期刊介绍： The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.