CCD阵列光谱仪的波长校准和光谱响应校正程序。

IF 1.5 4区 工程技术
A K Gaigalas, Lili Wang, Hua-Jun He, Paul DeRose
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引用次数: 47

摘要

本工作描述了在一个扩展的波长范围内获取分析物的光谱并验证波长和强度分配的程序。为了利用带电荷耦合器件(CCD)阵列探测器的光谱仪获取扩展波长范围内的光谱,需要在光栅的不同角度处获取多个部分光谱,并将这些部分光谱拼接成单个扩展光谱。拼接过程暴露了与仪器相关的工件。结果表明,通过获取参考辐照源的光谱并进行光谱校正,可以从分析物光谱中去除拼接暴露的伪影。这是因为辐照度参考光谱包含与分析物光谱相同的伪影。所述拼接暴露的伪影取决于所述拼接的波长;因此,测量用于测量分析物溶液光谱的相同波长范围的辐照度参考光谱是很重要的。换句话说,没有适用于不同波长范围的光谱的通用光谱校正因子。波长校准也可以通过拼接来自氪灯等光源的许多部分光谱来进行。然而,波长分配对拼接过程不敏感,在不同的扩展波长范围内获得的光谱可以使用相同的波长校准。波长校准检查光栅角度位置设置的有效性,以及CCD阵列探测器上单个像素的波长分配。通过测量橙色玻璃的光谱和微藻悬浮液的光谱来说明该过程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers.

Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers.

Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers.

Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers.

This work describes a procedure for acquiring a spectrum of an analyte over an extended range of wavelengths and validating the wavelength and intensity assignments. To acquire a spectrum over an extended range of wavelengths with a spectrometer with a charge coupled device (CCD) array detector, it is necessary to acquire many partial spectra, each at a different angular position of the grating, and splice the partial spectra into a single extended spectrum. The splicing procedure exposes instrument dependent artifacts. It is demonstrated that by taking a spectrum of a reference irradiance source and making spectral correction, the artifacts exposed by the splicing are removed from the analyte spectrum. This is because the irradiance reference spectrum contains the same artifacts as the analyte spectrum. The artifacts exposed by the splicing depend on the wavelength of the splice; therefore it is important to measure the irradiance reference spectrum for the same range of wavelengths used to measure the spectrum of the analyte solution. In other words, there is no general spectral correction factor which is applicable to spectra taken for different range of wavelengths. The wavelength calibration is also carried out by splicing many partial spectra from a source like a krypton lamp. However the wavelength assignments are not sensitive to the splicing procedure and the same wavelength calibration can be used for spectra acquired over different extended wavelength ranges. The wavelength calibration checks the validity of the setting of the grating angular position, and the assignment of wavelengths to individual pixels on the CCD array detector. The procedure is illustrated by measuring the spectrum of an orange glass and the spectrum of a suspension of microalgae.

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来源期刊
自引率
33.30%
发文量
10
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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