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Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)最新文献

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Generalized cofactoring for logic function evaluation 逻辑函数求值的广义协分解
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.775873
Yunjian Jiang, Slobodan Matic, R. Brayton
{"title":"Generalized cofactoring for logic function evaluation","authors":"Yunjian Jiang, Slobodan Matic, R. Brayton","doi":"10.1145/775832.775873","DOIUrl":"https://doi.org/10.1145/775832.775873","url":null,"abstract":"Logic evaluation of a Boolean function or relation is traditionally done by simulating its gate-level implementation, or creating a branching program using its binary decision diagram (BDD) representation, or using a set of look-up tables. We propose a new approach called generalized cofactoring diagrams, which are a generalization of the above methods. Algorithms are given for finding the optimal cofactoring structure for free-ordered BDD's and generalized cube cofactoring under an average path level (APL) cost criterion. Experiments on multi-valued functions show superior results to previously known methods by an average of 30%. The framework has direct applications in logic simulation, software synthesis for embedded control applications, and functional decomposition in logic synthesis.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127811383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Static analysis of transaction-level models 事务级模型的静态分析
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.775950
G. Agosta, F. Bruschi, D. Sciuto
{"title":"Static analysis of transaction-level models","authors":"G. Agosta, F. Bruschi, D. Sciuto","doi":"10.1145/775832.775950","DOIUrl":"https://doi.org/10.1145/775832.775950","url":null,"abstract":"The introduction of design languages, such as SystemC 2.0, that allow the modeling of digital systems at the transaction level will impose some major changes to the design flows. Since these formalisms allow for a higher level of abstraction in the systems description, new methodological tools will be needed to support all design phases. The goal of this paper is twofold: first we formalize in an abstract way a significant set of features of a Transaction Level Model, according to the SystemC 2.0 formalism. Then, upon this model we define numerical metrics that can provide useful information in the analysis of the system-level specifications. In particular these metrics are useful in the design exploration phase, to define the main characteristics of the hardware and software architectures.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"412 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126692571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Recent advances and future prospects in single-electronics 单电子学的最新进展与未来展望
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.775901
C. Wasshuber
{"title":"Recent advances and future prospects in single-electronics","authors":"C. Wasshuber","doi":"10.1145/775832.775901","DOIUrl":"https://doi.org/10.1145/775832.775901","url":null,"abstract":"This paper introduces new developments in single-electron logic technology and review a few clever applications made possible when single-electron transistors are combined with CMOS.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132859755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
A hybrid SAT-based decision procedure for separation logic with uninterpreted functions 一个基于sat的混合决策过程，用于分离逻辑和未解释的函数
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.775945
S. Seshia, Shuvendu K. Lahiri, R. Bryant
{"title":"A hybrid SAT-based decision procedure for separation logic with uninterpreted functions","authors":"S. Seshia, Shuvendu K. Lahiri, R. Bryant","doi":"10.1145/775832.775945","DOIUrl":"https://doi.org/10.1145/775832.775945","url":null,"abstract":"SAT-based decision procedures for quantifier-free fragments of first-order logic have proved to be useful in formal verification. These decisions procedures are either based on encoding atomic subformulas with Boolean variables, or by encoding integer variables as bit-vectors. Based on evaluating these two encoding methods on a diverse set of hardware and software benchmarks, we conclude that neither method is robust to variations in formula characteristics. We therefore propose a new hybrid technique that combines the two methods. We give experimental results showing that the hybrid method can significantly outperform either approach as well as other decision procedures.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"44 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122418480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 91
Optimal integer delay budgeting on directed acyclic graphs 有向无环图上最优整数延迟预算
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.776064
E. Bozorgzadeh, S. Ghiasi, A. Takahashi, M. Sarrafzadeh
{"title":"Optimal integer delay budgeting on directed acyclic graphs","authors":"E. Bozorgzadeh, S. Ghiasi, A. Takahashi, M. Sarrafzadeh","doi":"10.1145/775832.776064","DOIUrl":"https://doi.org/10.1145/775832.776064","url":null,"abstract":"Delay budget is an excess delay each component of a design can tolerate under a given timing constraint. Delay budgeting has been widely exploited to improve the design quality. We present an optimal integer delay budgeting algorithm. Due to numerical instability and discreteness of libraries of components during library mapping in design optimization flow, integer solution for delay budgeting is essential. We prove that integer budgeting problem - a 20-year old open problem in design optimization based on Y. Liao and C.K. Wong (1983) - can be solved optimally in polynomial time. We applied optimal delay budgeting in mapping applications on FPGA platform using pre-optimized cores of FPGA libraries. For each application we go through synthesis and place and route stages in order to obtain accurate results. Our optimal algorithm outperforms ZSA algorithm by R. Nair et al. (1989) in terms of area by 10% on average for all applications. In some applications, optimal delay budgeting can speedup runtime of place and route up to 2 times.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"504 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123198496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Power network analysis using an adaptive algebraic multigrid approach 基于自适应代数多网格方法的电网分析
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.775862
Zhengyong Zhu, B. Yao, Chung-Kuan Cheng
{"title":"Power network analysis using an adaptive algebraic multigrid approach","authors":"Zhengyong Zhu, B. Yao, Chung-Kuan Cheng","doi":"10.1145/775832.775862","DOIUrl":"https://doi.org/10.1145/775832.775862","url":null,"abstract":"In this paper, we introduce an efficient analysis method for the power network of general topology. The new approach is based on algebraic multigrid (AMG) method that can avoid the slow convergence of basic iterative methods. An innovative adaptive coarsening scheme is employed to further speed up the performance, taking advantage of the spatial variation of power supply noise. Experimental results show that our method is more than 100 times faster than SPICE3.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128330929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 49
Test generation for designs with multiple clocks 具有多个时钟设计的测试生成
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.776000
X. Lin, R. Thompson
{"title":"Test generation for designs with multiple clocks","authors":"X. Lin, R. Thompson","doi":"10.1145/775832.776000","DOIUrl":"https://doi.org/10.1145/775832.776000","url":null,"abstract":"To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize multiple clocks in the design effectively and efficiently in order to dramatically reduce test pattern count without sacrificing fault coverage or causing clock skew problem. This is achieved by pulsing multiple noninteractive clocks simultaneously and applying a clock concatenation technique. Experimental results on several industrial circuits show significant test pattern count reduction by using the proposed test pattern generation procedures.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125364867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 55
A survey of techniques for energy efficient on-chip communication 片上高效节能通信技术综述
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.776059
V. Raghunathan, M. Srivastava, Rajesh K. Gupta
{"title":"A survey of techniques for energy efficient on-chip communication","authors":"V. Raghunathan, M. Srivastava, Rajesh K. Gupta","doi":"10.1145/775832.776059","DOIUrl":"https://doi.org/10.1145/775832.776059","url":null,"abstract":"Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems being designed with battery considerations in mind, minimizing the energy consumed in on-chip interconnects becomes crucial. Further, the use of nanometer technologies is making it increasingly important to consider reliability issues during the design of SoC communication architectures. Continued supply voltage scaling has led to decreased noise margins, making interconnects more susceptible to noise sources such as crosstalk, power supply noise, radiation induced defects, etc. The resulting transient faults cause the interconnect to behave as an unreliable transport medium for data signals. Therefore, fault tolerant communication mechanism, such as Automatic Repeat Request (ARQ), Forward Error Correction (FEC), etc., which have been widely used in the networking community, are likely to percolate to the SoC domain. This paper presents a survey of techniques for energy efficient on-chip communication. Techniques operating at different levels of the communication design hierarchy are described, including circuit-level techniques, such as low voltage signaling, architecture-level techniques, such as communication architecture selection and bus isolation, system-level techniques, such as communication based power management and dynamic voltage scaling for interconnects, and network-level techniques, such as error resilient encoding for packetized on-chip communication. Emerging technologies, such as Code Division Multiple Access (CDMA) based buses, and wireless interconnects are also surveyed.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125972037","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 165
Test application time and volume compression through seed overlapping 通过种子重叠测试应用时间和体积压缩
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.776020
Wenjing Rao, I. Bayraktaroglu, A. Orailoglu
{"title":"Test application time and volume compression through seed overlapping","authors":"Wenjing Rao, I. Bayraktaroglu, A. Orailoglu","doi":"10.1145/775832.776020","DOIUrl":"https://doi.org/10.1145/775832.776020","url":null,"abstract":"We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architecture of the existing SCC scheme, while it attempts to overlap consecutive test vector seeds, thus providing increased flexibility in exploiting effectively the large volume of don't-care bits in test vectors. We also introduce modified ATPG algorithms upon the previous SCC scheme and explore various implementation strategies. Experimental data exhibit significant reductions on test time and volume over all current test compression techniques.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116788918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 57
Quantum-dot cellular automata: computing by field polarization 量子点元胞自动机:场极化计算
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451) Pub Date : 2003-06-02 DOI: 10.1145/775832.775900
G. Bernstein
{"title":"Quantum-dot cellular automata: computing by field polarization","authors":"G. Bernstein","doi":"10.1145/775832.775900","DOIUrl":"https://doi.org/10.1145/775832.775900","url":null,"abstract":"As CMOS technology continue its monotonic shrink, computing with quantum dots remains a goal in nanotechnology research. Quantum-dot cellular automata (QCA) is a paradigm for low-power, high-speed, highly dense computing that could be realized in a variety of materials systems. Discussed here are the basic paradigm of QCA, materials systems in which QCA might be constructed, a series of experiments performed in the metal tunnel junction technology, and ideas for future QCA implementations.","PeriodicalId":167477,"journal":{"name":"Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130632439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
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