2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)最新文献
{"title":"Using of solderable conductive pastes in PCB prototyping","authors":"A. Marín, P. Svasta, C. Ionescu, N. Codreanu","doi":"10.1109/POLYTR.2002.1020177","DOIUrl":"https://doi.org/10.1109/POLYTR.2002.1020177","url":null,"abstract":"The paper presents some tests in the field of through-hole plating process using special solderable conductive pastes in order to metallize the barrel of drilled holes for vias. The process consists of dispensing the special paste into holes, absorption of paste from them, keeping inside only the necessary quantity for metallization, and curing the paste into a regular hot-air oven at 160/spl deg/C for 30 minutes. The process is appropriate for small/medium quantity of vias (less than 400) and FR4 substrate. The contact resistance, specified by producer as 150 m/spl Omega/, will be analyzed. In addition, pastes shall be evaluated as soldering materials destined for contacting the SMDs onto the printed circuit boards.","PeriodicalId":166602,"journal":{"name":"2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115312736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Accelerated life testing in microelectronics and photonics, its role, attributes, challenges, pitfalls, and its interaction with qualification tests","authors":"E. Suhir","doi":"10.1117/12.469620","DOIUrl":"https://doi.org/10.1117/12.469620","url":null,"abstract":"Accelerated life tests (ALTs) are aimed at the revealing and understanding the physics of the expected or occurred failures i.e. are able to detect the possible failure modes and mechanisms. Another objective of the ALTs is to accumulate representative failure statistics. Adequately designed, carefully conducted, and properly interpreted ALTs provide a consistent basis for obtaining the ultimate information of the reliability of a product - the predicted probability of failure after the given time of service. Such tests can dramatically facilitate the solution to the cost effectiveness and time-to-market problems. ALTs should play an important role in the evaluation, prediction and assurance of the reliability of microelectronics and optoelectronics devices and systems. In the majority of cases, ALTs should be conducted in addition to the qualification tests, which are required by the existing standards. There might be also situations, when ALTs can be (and, probably, should be) used as an effective substitution for such standards, or, at least, as the basis for the improvement of the existing qualification specifications. We describe different types (categories) of accelerated tests, with an emphasis on the role that ALTs should play in the development, design, qualification and manufacturing of microelectronics and photonics products. We discuss the challenges associated with the implementation and use of the ALTs, potential pitfalls (primarily those associated with possible \"shifts\" in the mechanisms and modes of failure), and the interaction of the ALTs with other types of accelerated tests.","PeriodicalId":166602,"journal":{"name":"2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115261257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)","authors":"","doi":"10.1109/POLYTR.2002.1020173","DOIUrl":"https://doi.org/10.1109/POLYTR.2002.1020173","url":null,"abstract":"The following topics are dealt with: adhesive joints in microwave applications; electrical conductivity of anisotropic chemical adhesives; conductive adhesive fillets for double sided PCBs; solderable conductive pastes; application of adhesives in MEMS, and MOEMS assembly; isotropically conductive adhesives; reliability; epoxy resins for UV laser cure; double-layer no-flow underfill materials and process; encapsulant characterization tools for process setup and failure analysis; low temperature processable core material for embedded inductor; triazine containing polymers for use in integrated optics; fine pitch flip chip on flex interconnection process; stackable package using chip in polymer technology; high volume printing technologies; lamination technique for electronic packaging; laser processing of flexible substrates; all-polymer field effect transistors and organic thin film transistors; ultra-high dielectric constant polymer based composite; and vacuum molded flip chip packaging technology.","PeriodicalId":166602,"journal":{"name":"2nd International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics. POLYTRONIC 2002. Conference Proceedings (Cat. No.02EX599)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116666464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}