发布求助
文献互助 智能选刊 最新文献

Conference Record Southcon最新文献

筛选
英文 中文
On vision-based robot calibration 基于视觉的机器人标定
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498083
Hanqi Huang, Z. Roth
{"title":"On vision-based robot calibration","authors":"Hanqi Huang, Z. Roth","doi":"10.1109/SOUTHC.1994.498083","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498083","url":null,"abstract":"This tutorial, which is on the subject of using hand-mounted cameras for robot calibration, focuses on the basic principles of \"one-stage\" methods that calibrate simultaneously the robot and the cameras and \"two stage\" methods that first calibrating the cameras and then calibrating the robot. Distinction is made between stereo and monocular camera systems. The papers addresses the pros and cons of the various techniques and summarizes open research issues.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130682067","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
An innovative ATM switch using existing Four-Port technology 采用现有四端口技术的创新ATM交换机
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498174
J. Smith
{"title":"An innovative ATM switch using existing Four-Port technology","authors":"J. Smith","doi":"10.1109/SOUTHC.1994.498174","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498174","url":null,"abstract":"The demonstrated ATM switch shows the enormous bandwidth obtainable by the use of the Integrated Device Technology's Four-Port component. The IDT7052 Four-Port accomplishes the high bandwidth through IDTs high speed CMOS technology which creates a true simultaneously accessible multi-ported SRAM. Some ATM switch vendor products have incorporated the Four-Ported components, which accommodated their high bandwidth requirements.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122039711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fiber optics: an antidote to electromagnetic interference (EMI) 光纤:电磁干扰(EMI)的解毒剂
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498123
M. A. Mohd, M.M. Ahmed
{"title":"Fiber optics: an antidote to electromagnetic interference (EMI)","authors":"M. A. Mohd, M.M. Ahmed","doi":"10.1109/SOUTHC.1994.498123","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498123","url":null,"abstract":"Summary form only given, as follows. As electronic devices become increasingly sensitive and proliferate in number, electromagnetic interference (EMI) to and from these devices is becoming increasingly important. EMI can create several problems in electronic systems, such as ground loops, system safety, cross talk, common mode noise, and differential mode coupling. Over the years several techniques have been developed to solve these problems. However, they are cumbersome, impractical, inefficient, and expensive. The fiber optics technology offers an excellent solution to overcome EMI problems altogether. This paper introduces the salient features of fiber optics as an alternate solution to EMI problems. This tutorial paper focuses on the fundamentals of fiber optics technology and how it can be exploited to eliminate EMI from practical electronic systems. The paper concludes with a detailed power budget calculation example.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114596788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Free-space method of measuring complex permittivity of fast-ion conductors at microwave frequencies using pelleted samples 用颗粒状样品测量微波频率下快离子导体复介电常数的自由空间方法
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498104
P. Neelakanta, S. Abeygunawardana, D. De Groff
{"title":"Free-space method of measuring complex permittivity of fast-ion conductors at microwave frequencies using pelleted samples","authors":"P. Neelakanta, S. Abeygunawardana, D. De Groff","doi":"10.1109/SOUTHC.1994.498104","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498104","url":null,"abstract":"A new free-space method of measuring the complex permittivity at microwave frequencies of solid-electrolytes (such as AgI) using small (pellet) samples is described. Unlike the transmission-line and/or cavity methods which need elaborate sample heating arrangements (to achieve /spl beta/-to-/spl alpha/ phase transition) and also have restricted applications to low-loss materials, the present technique offers simpler and direct measurement of high conductivity at /spl alpha/-phase. Measured results are in good agreement with the available data.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"150 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114524235","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microprocessor design innovations 微处理器设计创新
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498155
T. Giuma, S. Warden
{"title":"Microprocessor design innovations","authors":"T. Giuma, S. Warden","doi":"10.1109/SOUTHC.1994.498155","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498155","url":null,"abstract":"This paper reviews new innovations in microprocessor design. Transistor technologies, clock speed, execution throughput, and other innovations such as parallel processing are discussed. The utilization of superscalar pipelines, powerful on-chip floating point units, and enhanced internal caches are illustrated from new design approaches in three next-generation processors: the Intel Pentium, the DEC 21064 \"Alpha\", and the Motorola MPC 601 \"PowerPC\".","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133934519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Unified software approach to power quality assessment and evaluation 电能质量评估与评价的统一软件方法
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498140
A. Chandrasekaran, A. Sundaram
{"title":"Unified software approach to power quality assessment and evaluation","authors":"A. Chandrasekaran, A. Sundaram","doi":"10.1109/SOUTHC.1994.498140","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498140","url":null,"abstract":"Many utilities have initiated aggressive programs to address power quality (PQ) issues in their systems. Power quality issues span the full spectrum of electric generation, transmission and distribution, and end-use. The major thrust in the utility programs on PQ is on system/customer interface. The utility engineer is responsible to customer problems and since there are too many factors in the equation, a unified approach based on software is not only essential but the most effective solution. The utility engineer should have the following tools to respond adequately to the various power quality concerns: a large database that is accessed quickly; expertise available in an expert system; and customized analysis software that will provide quantitative answers to device-oriented problems. Intelligent systems design provides a rational path to a unified approach to PQ problems.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133020735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Crosstalk in coupled microstrip lines due to substrate permittivity and S/h ratios 由衬底介电常数和S/h比引起的耦合微带线串扰
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498120
V. Ungvichian, M. Kopp
{"title":"Crosstalk in coupled microstrip lines due to substrate permittivity and S/h ratios","authors":"V. Ungvichian, M. Kopp","doi":"10.1109/SOUTHC.1994.498120","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498120","url":null,"abstract":"The Finite Element Method (FEM) is used to determine the magnitude of crosstalk due to substrate permittivities and S/h ratios in a pair of parallel coplanar microstrip lines. One trace is driven by an ideal current source (generator strip) and the other line is a passive (receptor) strip. At the operating frequency of 200 MHz, the dielectric of the substrates is assumed to be lossless and homogeneous. Computed results when compared with the results obtained from analytical formulation show a good agreement. Further, the study indicates that an increase in the substrate permittivity would increase the crosstalk.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134027660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Impact of parallel computing on fractal image compression 并行计算对分形图像压缩的影响
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498127
R. Cofer, H.K. Brown, S. Abdallah
{"title":"Impact of parallel computing on fractal image compression","authors":"R. Cofer, H.K. Brown, S. Abdallah","doi":"10.1109/SOUTHC.1994.498127","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498127","url":null,"abstract":"Fractal theory is emerging as a dominant force in the area of image compression. The resulting images are strikingly good even at very high compression rates and the technique additionally shows promise for simultaneous rectification of the image. Although fractal image decompression is a relatively inexpensive operation, widespread use of the technology is limited by the computational complexity of the fractal compression itself. This complexity results from a search for contractive regions of self-similarity within the image. Conceptually the problem is that of irregular parallelism. The search can begin in a highly parallel fashion but must become increasingly dependent as the process converges. In this paper, we employ macro parallelism techniques based upon loosely communicating computers each assigned its own region of the search space. As the search progresses, each computer periodically broadcasts its search status and all cooperatively readjust to speed the process. The techniques advanced are expected to have wide utility since the approach utilizes nets of readily available computers rather than either supercomputer or dedicated silicon.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"234 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123104280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Use of EM analysis to study shielding effects in microstrip circuits 利用电磁分析研究微带电路中的屏蔽效应
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498116
L. Dunleavy, R. Wenzel
{"title":"Use of EM analysis to study shielding effects in microstrip circuits","authors":"L. Dunleavy, R. Wenzel","doi":"10.1109/SOUTHC.1994.498116","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498116","url":null,"abstract":"This paper describes results obtained using electromagnetic (EM) analysis to investigate shielding effects in microstrip circuits. Questions considered include the following: 1) under what circumstances do the effects of a package with metallic top and side walls significantly affect the behavior of microstrip transmission line characteristics and discontinuity behavior?; and 2) are currently used \"rules of thumb\" sufficient for avoiding shielding effects? Shielding effects are not yet adequately accounted for in the linear nodal analyses of widely used microwave CAD software such as HP-EESOF Software's Libra or Compact Software's Microwave Harmonica. The common approach by designers is to try to avoid shielding effects by making sure that the package's cover and side walls are distanced from the circuit by three to five substrate thicknesses. The approach taken in this paper is to use the electromagnetic analysis software package \"em\" (available from Sonnet Software) as a tool in an attempt to answer the questions posed above. Confidence in em is gained by comparing em results to measured and independently obtained numerical data for an edge coupled bandpass four resonator filter. Shielding effects are then examined in selected microstrip examples.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130734444","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
IC yield modeling and statistical circuit simulation 集成电路良率建模与统计电路仿真
Conference Record Southcon Pub Date : 1994-03-29 DOI: 10.1109/SOUTHC.1994.498172
M. M. Shahsavari, T. Sanders, D. P. Means, K. J. Moye, J. Louis-Chandran
{"title":"IC yield modeling and statistical circuit simulation","authors":"M. M. Shahsavari, T. Sanders, D. P. Means, K. J. Moye, J. Louis-Chandran","doi":"10.1109/SOUTHC.1994.498172","DOIUrl":"https://doi.org/10.1109/SOUTHC.1994.498172","url":null,"abstract":"An important concern whether designing a new process or maintaining an existing one is the cost of production and hence the chip yield. In order to maximize chip yield, the most significant process parameters need to be identified so that variations in these critical parameters can be minimized resulting in the highest possible chip yield. Presented in this paper is a software-based methodology for facilitating the identification of critical process parameters and relating them to circuit level performances using statistical analysis techniques and conventional simulators.","PeriodicalId":164672,"journal":{"name":"Conference Record Southcon","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-03-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122067528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信