Use of EM analysis to study shielding effects in microstrip circuits

L. Dunleavy, R. Wenzel
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引用次数: 2

Abstract

This paper describes results obtained using electromagnetic (EM) analysis to investigate shielding effects in microstrip circuits. Questions considered include the following: 1) under what circumstances do the effects of a package with metallic top and side walls significantly affect the behavior of microstrip transmission line characteristics and discontinuity behavior?; and 2) are currently used "rules of thumb" sufficient for avoiding shielding effects? Shielding effects are not yet adequately accounted for in the linear nodal analyses of widely used microwave CAD software such as HP-EESOF Software's Libra or Compact Software's Microwave Harmonica. The common approach by designers is to try to avoid shielding effects by making sure that the package's cover and side walls are distanced from the circuit by three to five substrate thicknesses. The approach taken in this paper is to use the electromagnetic analysis software package "em" (available from Sonnet Software) as a tool in an attempt to answer the questions posed above. Confidence in em is gained by comparing em results to measured and independently obtained numerical data for an edge coupled bandpass four resonator filter. Shielding effects are then examined in selected microstrip examples.
利用电磁分析研究微带电路中的屏蔽效应
本文介绍了利用电磁分析方法研究微带电路屏蔽效应的结果。考虑的问题包括:1)在什么情况下,金属顶壁和侧壁的封装效应会显著影响微带传输线的特性和不连续行为?2)目前使用的“经验法则”是否足以避免屏蔽效应?在广泛使用的微波CAD软件(如HP-EESOF software的Libra或Compact software的microwave Harmonica)的线性节点分析中,屏蔽效应尚未充分考虑。设计人员常用的方法是确保封装的外壳和侧壁与电路保持三到五个基板厚度的距离,以尽量避免屏蔽效应。本文采用的方法是使用电磁分析软件包“em”(可从Sonnet software获得)作为工具,试图回答上述问题。通过将em结果与边缘耦合带通四谐振器滤波器的测量和独立获得的数值数据进行比较,获得em的置信度。然后在选定的微带示例中检查屏蔽效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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