Proceedings of the 2020 International Symposium on Physical Design最新文献

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Selective Sensor Placement for Cost-Effective Online Aging Monitoring and Resilience 具有成本效益的在线老化监测和恢复的选择性传感器放置
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3372780.3375556
Hao-Chun Chang, Li-An Huang, Kai-Chiang Wu, Yu-Guang Chen
{"title":"Selective Sensor Placement for Cost-Effective Online Aging Monitoring and Resilience","authors":"Hao-Chun Chang, Li-An Huang, Kai-Chiang Wu, Yu-Guang Chen","doi":"10.1145/3372780.3375556","DOIUrl":"https://doi.org/10.1145/3372780.3375556","url":null,"abstract":"Aggressive technology scaling trends, such as thinner gate oxide without proportional downscaling of supply voltage, aggravate the aging impact and thus necessitate an aging-aware reliability verification and optimization framework during early design stages. In this paper, we propose a novel in-situ sensing strategy based on deploying transition detectors (TDs), for on-chip aging monitoring and resilience. Transformed into the set cover problem and then formulated into maximum satisfiability, the proposed problem of TD/sensor placement can be solved efficiently. Experimental results show that, by introducing at most 2.2% area overhead (for TD/sensor placement), the aging behavior of a target circuit can be effectively monitored, and the correctness of its functionality can be perfectly guaranteed with an average of 77% aging resilience achieved. In other words, with 2.2% area overhead, potential aging-induced timing errors can be detected and then eliminated, while achieving 77% recovery from aging-induced performance degradation.","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126888488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Session 6: Machine Learning for Physical Design (part 2) 会议详情:第6部分:物理设计中的机器学习(第二部分)
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3389222
Ismail Bustany
{"title":"Session details: Session 6: Machine Learning for Physical Design (part 2)","authors":"Ismail Bustany","doi":"10.1145/3389222","DOIUrl":"https://doi.org/10.1145/3389222","url":null,"abstract":"","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132713920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Learning from Experience: Applying ML to Analog Circuit Design 从经验中学习:将机器学习应用于模拟电路设计
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3372780.3378172
K. Kunal, Tonmoy Dhar, Yaguang Li, Meghna Madhusudan, Jitesh Poojary, A. Sharma, Wenbin Xu, S. Burns, R. Harjani, Jiang Hu, P. Mukherjee, S. Sapatnekar
{"title":"Learning from Experience: Applying ML to Analog Circuit Design","authors":"K. Kunal, Tonmoy Dhar, Yaguang Li, Meghna Madhusudan, Jitesh Poojary, A. Sharma, Wenbin Xu, S. Burns, R. Harjani, Jiang Hu, P. Mukherjee, S. Sapatnekar","doi":"10.1145/3372780.3378172","DOIUrl":"https://doi.org/10.1145/3372780.3378172","url":null,"abstract":"The problem of analog design automation has vexed several generations of researchers in electronic design automation. At its core, the difficulty of the problem is related to the fact that machinegenerated designs have been unable to match the quality of the human designer. The human designer typically recognizes blocks from a netlist and draws upon her/his experience to translate these blocks into a circuit that is laid out in silicon. The ability to annotate blocks in a schematic or netlist-level description of a circuit is key to this entire process, but it is a process fraught with complexity due to the large number of variants of each circuit type. For example, the number of topologies of operational transconductance amplifiers (OTAs) easily numbers in the hundreds. A designer manages this complexity by dividing this large set of variants into classes (e.g., OTAs may be telescopic, folded cascode, etc.). Even so, the number of minor variations within each class is large. Early approaches to analog design automation attempted to use rule-based methods to capture these variations, but this database of rules required tender care: each new variant might require a new rule. As machine learning (ML) based alternatives have become more viable, alternative forms of solving this problem have begun to be explored. Our effort is part of the ALIGN (Analog Layout, Intelligently Generated from Netlists) project [2, 3], which is developing opensource software for analog/mixed-signal circuit layout [1]. Our specific goal is to translate a netlist into a physical layout, with 24-hour turnaround and no human in the loop. The ALIGN flow inputs a netlist whose topology and transistor sizes have already been chosen, a set of performance specifications, and a process design kit (PDK) that defines the process technology. The output of ALIGN is a layout in GDSII format.","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133917209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Session 4: Circuit Design and Security 会议详情:会议4:电路设计和安全
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3389220
D. Chinnery
{"title":"Session details: Session 4: Circuit Design and Security","authors":"D. Chinnery","doi":"10.1145/3389220","DOIUrl":"https://doi.org/10.1145/3389220","url":null,"abstract":"","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122736972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Full-Chip Electro-Thermal Coupling Extraction and Analysis for Face-to-Face Bonded 3D ICs 全片面对面键合3D集成电路的电热耦合提取与分析
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3372780.3378169
Lingjun Zhu, Kyungwook Chang, D. Petranovic, S. Sinha, Y. Yu, S. Lim
{"title":"Full-Chip Electro-Thermal Coupling Extraction and Analysis for Face-to-Face Bonded 3D ICs","authors":"Lingjun Zhu, Kyungwook Chang, D. Petranovic, S. Sinha, Y. Yu, S. Lim","doi":"10.1145/3372780.3378169","DOIUrl":"https://doi.org/10.1145/3372780.3378169","url":null,"abstract":"Due to the short die-to-die distance and inferior heat dissipation capability, Face-to-Face (F2F) boned 3D ICs are often considered to be vulnerable to electrical and thermal coupling. This study is the first to quantify the impacts of the electro-thermal coupling on the full-chip timing, power, and performance. We first present an implementation flow for realistic F2F 3D ICs including pad layers and power grids. Then, we propose our signal integrity analysis, parasitic extraction, and thermal analysis flows. Next, we investigate the impacts of the coupling on the delay, power, and noise of F2F 3D ICs, and provide guidelines to mitigate these effects. Our experimental results show that the inter-die electrical coupling causes up to 5.81% timing degradation and 4.00% noise increase, while the thermal coupling leads to less than 0.41% timing degradation and nearly no noise increase. The impact of the combined electro-thermal coupling on delay and noise reaches 6.07% and 4.05%, respectively.","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"169 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132235170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Hill Climbing with Trees: Detail Placement for Large Windows 爬树:大窗户的细节放置
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3372780.3375563
M. Khasawneh, P. Madden
{"title":"Hill Climbing with Trees: Detail Placement for Large Windows","authors":"M. Khasawneh, P. Madden","doi":"10.1145/3372780.3375563","DOIUrl":"https://doi.org/10.1145/3372780.3375563","url":null,"abstract":"Integrated circuit design encompasses a wide range of intractable optimization problems. In this paper, we extend linear time hill climbing techniques from graph partitioning to address detailed placement -- this results in a new way to refine circuit designs, dramatically expands the size of practical optimization windows, and enables wire length reductions on a variety of benchmark problems. The approach is versatile and straight-forward to implement, allowing it to be applied to a wide range of problems within design automation, and beyond.","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121259393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Understanding Graphs in EDA: From Shallow to Deep Learning 理解EDA中的图:从浅学习到深度学习
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3372780.3378173
Yuzhe Ma, Zhuolun He, Wei Li, Lu Zhang, Bei Yu
{"title":"Understanding Graphs in EDA: From Shallow to Deep Learning","authors":"Yuzhe Ma, Zhuolun He, Wei Li, Lu Zhang, Bei Yu","doi":"10.1145/3372780.3378173","DOIUrl":"https://doi.org/10.1145/3372780.3378173","url":null,"abstract":"As the scale of integrated circuits keeps increasing, it is witnessed that there is a surge in the research of electronic design automation (EDA) to make the technology node scaling happen. Graph is of great significance in the technology evolution since it is one of the most natural ways of abstraction to many fundamental objects in EDA problems like netlist and layout, and hence many EDA problems are essentially graph problems. Traditional approaches for solving these problems are mostly based on analytical solutions or heuristic algorithms, which require substantial efforts in designing and tuning. With the emergence of the learning techniques, dealing with graph problems with machine learning or deep learning has become a potential way to further improve the quality of solutions. In this paper, we discuss a set of key techniques for conducting machine learning on graphs. Particularly, a few challenges in applying graph learning to EDA applications are highlighted. Furthermore, two case studies are presented to demonstrate the potential of graph learning on EDA applications.","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121527882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
ISPD 2020 Physical Mapping of Neural Networks on a Wafer-Scale Deep Learning Accelerator
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3372780.3380846
Michael James, Marvin Tom, P. Groeneveld, V. Kibardin
{"title":"ISPD 2020 Physical Mapping of Neural Networks on a Wafer-Scale Deep Learning Accelerator","authors":"Michael James, Marvin Tom, P. Groeneveld, V. Kibardin","doi":"10.1145/3372780.3380846","DOIUrl":"https://doi.org/10.1145/3372780.3380846","url":null,"abstract":"This paper introduces a special case of the floorplanning problem for optimizing neural networks to run on a wafer-scale computing engine. From a compute perspective, neural networks can be represented by a deeply layered structure of compute kernels. During the training of a neural network, gradient descent is used to determine the weight factors. Each layer then uses a local weight tensor to transform \"activations\" and \"gradients\" that are shared among connected kernels according to the topology of the network. This process is computationally intensive and requires high memory and communication bandwidth. Cerebras has developed a novel computer system designed for this work that is powered by a 21.5cm by 21.5cm wafer-scale processor with 400,000 programmable compute cores. It is structured as a regular array of 633 by 633 processing elements, each with its own local high bandwidth SRAM memory and direct high bandwidth connection to its neighboring cores. In addition to supporting traditional execution models for neural network training and inference, this engine has a unique capability to compile and compute every layer of a complete neural network simultaneously. Mapping a neural network in this fashion onto Cerebras' Wafer-Scale Engine (WSE) is reminiscent of the traditional floorplanning problem in physical design. A kernel ends up as a rectangle of x by y compute elements. These are the flexible blocks that need to be placed to optimize performance. This paper describes an ISPD 2020 challenge to develop algorithms and heuristics that produce compiled neural networks that achieve the highest possible performance on the Cerebras WSE.","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130347519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Session details: Session 2: Breaking New Ground: From Carbon Nanotubes to Packaging 会议详情:第二部分:开拓新领域:从碳纳米管到包装
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3389217
P. Madden
{"title":"Session details: Session 2: Breaking New Ground: From Carbon Nanotubes to Packaging","authors":"P. Madden","doi":"10.1145/3389217","DOIUrl":"https://doi.org/10.1145/3389217","url":null,"abstract":"","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"8 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133913432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Session 8: ISPD 2020 Contest Results and Poster Presentations 会议详情:第8部分:ISPD 2020竞赛结果和海报展示
Proceedings of the 2020 International Symposium on Physical Design Pub Date : 2020-03-30 DOI: 10.1145/3389224
Marvin Tom
{"title":"Session details: Session 8: ISPD 2020 Contest Results and Poster Presentations","authors":"Marvin Tom","doi":"10.1145/3389224","DOIUrl":"https://doi.org/10.1145/3389224","url":null,"abstract":"","PeriodicalId":151741,"journal":{"name":"Proceedings of the 2020 International Symposium on Physical Design","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132295790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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