2017 IEEE East-West Design & Test Symposium (EWDTS)最新文献

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Algorithm for assessing quality of fuzzy expert information 模糊专家信息质量评价算法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110107
L. Borisova, V. Dimitrov, I. Nurutdinova
{"title":"Algorithm for assessing quality of fuzzy expert information","authors":"L. Borisova, V. Dimitrov, I. Nurutdinova","doi":"10.1109/EWDTS.2017.8110107","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110107","url":null,"abstract":"The purpose presents the algorithm for software implementation of the expert system block to perform diagnostics and update the parameters of complex technical systems, operating in changing conditions when external factors assessment is presented in the form of fuzzy expert information. The block is intended to input, analyze, and update the expert knowledge, on the basis of which a fuzzy logic inference of values of the system parameters is performed. The accuracy of the inferred parameter significantly depends on the adequacy of the expert information to real conditions, which determines the urgency of generating qualitative expert information. The proposed new algorithm includes identifying all the characteristics of consistency, specifying critical values of consistency indices, it provides feedback with experts for immediate information updating, performs selection of optimal models of linguistic variables and construction of the generalized membership functions with consideration of the hierarchy of expert information. The algorithm application makes the process of expert information generation completely automated. A model example of generating expert information has been provided.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125799748","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A high-speed hybrid algorithm of monochrome multitone images approximation 单色多色调图像高速混合逼近算法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110160
R. Neydorf, A. Aghajanyan, D. Vucinic
{"title":"A high-speed hybrid algorithm of monochrome multitone images approximation","authors":"R. Neydorf, A. Aghajanyan, D. Vucinic","doi":"10.1109/EWDTS.2017.8110160","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110160","url":null,"abstract":"The paper considers the problem of increasing the speed of monochrome multitone image (MMI) approximation, which consists in replacement of original palette with palette that has less number of tones. Often, for solving such a problem, the heuristic optimization-search algorithms are used. Their drawback is that, they cannot guarantee to find the solution for the given optimization criteria, which motivates to find the approximating palette of the potential extreme. The solution of this problem is to define the deterministic algorithm, that guarantees finding the extreme, through the integration with the heuristic algorithm. Such hybridization takes in consideration the main advantage of these 2 approaches: (1) speed of the heuristic algorithm and (2) accuracy of the deterministic one. The hybrid algorithm applies the heuristic approach to decrease the search area and the deterministic approach guarantees to find extremes within this area. This approach defines the time, as the optimization criteria for the algorithm processing speed. Thus, the proposed hybridization enables to find the bi-optimal solution for the defined MMI approximation problem that provides both, the optimal quality of approximation within the available time frame.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115987397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Accurate method for identical fault search in logical circuits 逻辑电路中相同故障的精确搜索方法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110093
A. Stempkovskiy, D. Telpukhov, R. Solovyev
{"title":"Accurate method for identical fault search in logical circuits","authors":"A. Stempkovskiy, D. Telpukhov, R. Solovyev","doi":"10.1109/EWDTS.2017.8110093","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110093","url":null,"abstract":"The problems of IC reliability are now becoming increasingly important. The idea of reliability is a complex integrated concept and includes structural, schematic and technological solutions, as well as solutions at the level of logic gates, register transmissions and microsystem as a whole. This paper is devoted to preprocessing of logical circuits aimed at the reduction of computational costs of evaluating fault tolerance parameters, as well as the costs of circuit verification and testing. A method for identical fault search in logical circuits have been proposed, which makes it possible to estimate the effect of only one fault from the corresponding equivalence class of identical faults in subsequent verification and evaluation processes. In addition, these data can be used to construct self-test circuits.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125969533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A new faults blocking method for out-of-step protection 一种新的失步保护故障阻断方法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110045
A. Gerasimenko, K. Ivanov, Viktor Kislyukov, V. Roganov
{"title":"A new faults blocking method for out-of-step protection","authors":"A. Gerasimenko, K. Ivanov, Viktor Kislyukov, V. Roganov","doi":"10.1109/EWDTS.2017.8110045","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110045","url":null,"abstract":"Modern automatic out-of-step protection devices of allow indication of out-of-step regime during the first cycle. At that, they must fail-safely distinguish malfunctions, such as short circuits. The new method of finding short circuits or other sudden changes of operating parameters is suggested in the article. The developed algorithm was tested through COMTRADE oscillograms obtained at digital-to-analog physical complex OAO NIIPT.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126019965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An object-oriented open software architecture for security applications 面向对象的开放软件体系结构,用于安全应用程序
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110070
Giuseppe Airò Farulla, Alexander James Pane, P. Prinetto, A. Varriale
{"title":"An object-oriented open software architecture for security applications","authors":"Giuseppe Airò Farulla, Alexander James Pane, P. Prinetto, A. Varriale","doi":"10.1109/EWDTS.2017.8110070","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110070","url":null,"abstract":"This paper introduces a newly developed Object-Oriented Open Software Architecture designed for supporting security applications, while leveraging on the capabilities offered by dedicated Open Hardware devices. Specifically, we target the SEcube™ platform, an Open Hardware security platform based on a 3D SiP (System on Package) designed and produced by Blu5 Group. The platform integrates three components employed for security in a single package: a Cortex-M4 CPU, a FPGA and an EAL5+ certified Smart Card. The Open Software Architecture targets both the host machine and the security device, together with the secure communication among them. To maximize its usability, this architecture is organized in several abstraction layers, ranging from hardware interfaces to device drivers, from security APIs to advanced applications, like secure messaging and data protection. We aim at releasing a multi-platform Open Source security framework, where software and hardware cooperate to hide to both the developer and the final users classical security concepts like cryptographic algorithms and keys, focusing, instead, on common operational security concepts like groups and policies.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126020410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Cloud traffic control: Smart traffic-driven streetlight 云交通控制:智能交通驱动路灯
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110064
Artur Ziarmand, S. Chumachenko, V. Hahanov, E. Litvinova
{"title":"Cloud traffic control: Smart traffic-driven streetlight","authors":"Artur Ziarmand, S. Chumachenko, V. Hahanov, E. Litvinova","doi":"10.1109/EWDTS.2017.8110064","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110064","url":null,"abstract":"The smart cloud traffic light sequencer, focused on optimal control of traffic flows at the crossroads, is proposed within the framework of creating cloud traffic control [1]. A logical architecture of the sequencer free of arithmetic operations, intended for generating control signals, depending on the number of cars on intersecting lines. The ways of increasing the traffic capacity of intersections through the decrease of the green signal downtime in the absence of cars on the permitted traffic lane are shown. Test and real experiments on the transport infrastructure, which confirm the effectiveness of the introduction of a smart cloud traffic light to reduce the time of route execution and save energy resources, are presented.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127787585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling linked faults via automata models 通过自动机模型建模链接故障
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110071
D. Hayrapetyan
{"title":"Modeling linked faults via automata models","authors":"D. Hayrapetyan","doi":"10.1109/EWDTS.2017.8110071","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110071","url":null,"abstract":"The purpose of this paper is to introduce a deterministic finite automaton as a model for linked fault representation. It is shown how the model can be used during memory behavior simulation at the register transfer level.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130668457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Electrical, dielectric and structural characterization of nickel ferrite films for thin film electronic applications 薄膜电子用镍铁氧体薄膜的电学、介电和结构特性
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110054
S. Sredojevic, N. Kovacevic, Djordje Miseljic
{"title":"Electrical, dielectric and structural characterization of nickel ferrite films for thin film electronic applications","authors":"S. Sredojevic, N. Kovacevic, Djordje Miseljic","doi":"10.1109/EWDTS.2017.8110054","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110054","url":null,"abstract":"In this paper, we present detailed electrical, dielectric and structural analysis of nickel ferrite thin film deposited by spin coating technique. Films were characterized by the impedance spectroscopy measurements, four-point Hall effect measurements, XRD analysis and dielectric measurements. Low-cost fabrication technique, as well as good properties of the film, (smooth, crack free surface, uniform thickness) makes them good candidates for thin film electronic applications.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134149764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Universal generator of irregular multidimensional multiextremal functions 不规则多维多极值函数的通用生成器
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110046
R. Neydorf, D. Vucinic, Ivan Chernogorov
{"title":"Universal generator of irregular multidimensional multiextremal functions","authors":"R. Neydorf, D. Vucinic, Ivan Chernogorov","doi":"10.1109/EWDTS.2017.8110046","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110046","url":null,"abstract":"The paper describes the development of a universal test functions generator to validate and setup the algorithms for investigating multiextremal systems characteristics. The main difference between the proposed functions and the set of known multiextremal test functions is their irregularity related to the extremes coordinate location and their respective quantitative values, since all known test functions are based on the analytical functions. The functionality of the developed “Lambda Function” software is described in details to validate such approach, supporting the test functions controlled generation, their editing and studying the multi-dimensional, multi-extremal test functions characteristics. Its fundamental novelty is that these functions are based on the multiplicative functions, developed by R. Neudorf, which extreme and multidimensionality characteristics enable to completely exclude the influence of their structure patterns when the results are computed. The “Lambda Function” software provides a wide range of possibilities to develop and investigate the test functions being created. Such results can be applied in variety of research domains, and the developed software can be easily integrated with third-party software, based on its extensive modular design.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134160726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Development and research of the carrier module and the mezzanine module of angular velocity for the remote control system of the unmanned vessel 无人船远程控制系统角速度载体模块和夹层模块的开发与研究
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110060
V. Iskiv, A. Lukyanchikov, Y. Mickhayluck, A. Savochkin, A. Schekaturin
{"title":"Development and research of the carrier module and the mezzanine module of angular velocity for the remote control system of the unmanned vessel","authors":"V. Iskiv, A. Lukyanchikov, Y. Mickhayluck, A. Savochkin, A. Schekaturin","doi":"10.1109/EWDTS.2017.8110060","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110060","url":null,"abstract":"The mezzanine module of angular velocity and the carrier module for the remote control system of the unmanned vessel are designed. The carrier module is designed to control and configure the mezzanine module for speed measuring and mezzanine module for angular velocity measuring.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134584761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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