1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon最新文献_第4页

Toward the development of a non-invasive pressure-flow sensor system for the detection of prostate cancer in men 用于男性前列腺癌检测的无创压力-流量传感器系统的研制

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552414

V. Gupta, M. Parameswaran, L. Goldenberg, J. McEwen

引用次数: 8

Tactile integrated circuit sensor realized with a piezoelectric polymer 用压电聚合物实现触觉集成电路传感器

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552444

E. Kolesar, C. Dyson, R. Reston, R. Fitch, D. G. Ford, S.D. Nelms

{"title":"Tactile integrated circuit sensor realized with a piezoelectric polymer","authors":"E. Kolesar, C. Dyson, R. Reston, R. Fitch, D. G. Ford, S.D. Nelms","doi":"10.1109/ICISS.1996.552444","DOIUrl":"https://doi.org/10.1109/ICISS.1996.552444","url":null,"abstract":"A two-dimensional, electrically-multiplexed tactile sensor was realized by coupling a piezoelectric polyvinylidene fluoride (PVDF) polymer film to a monolithic silicon integrated circuit (IC). The IC incorporates 64 sensor electrodes arranged in a symmetrical 8/spl times/8 matrix. Each electrode occupies a 400/spl times/400 /spl mu/m square area, and they are separated from each other by 300 /spl mu/m. A 40-/spl mu/m thick piezoelectric PVDF polymer film was attached to the electrode array with a non-conductive urethane adhesive. The response of the tactile sensor is linear for loads spanning 0.8 to 135 grams-of-force (gmf) (0.008-1.35 Newtons (N)). The time required to electrically interrogate, measure, and record the response of the sensor's set of 64 taxels is less than 50 ms, the hysteresis level is tolerable, and, for operation in the sensor's linear range, taxel crosstalk is negligible. The historically persistent stability and response reproducibility limitations associated with piezoelectric-based tactile sensors have been resolved by implementing a pre-charge voltage bias technique to establish known pre- and post-load sensor responses. A rudimentary tactile object image measurement procedure has been devised to recognize the silhouette of a sharp edge, square, trapezoid, isosceles triangle, circle, toroid, slotted screw, and cross-slotted screw.","PeriodicalId":131620,"journal":{"name":"1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon","volume":"54 27","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114005975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 29

Reduced complexity SIMD-class architectures 降低simd类体系结构的复杂性

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552442

M. A. Glover, A. Rucinski, W. Miller

引用次数: 0

SOM (self-organizing map) implemented by wafer scale integration-its self-organizing behavior under defects 基于晶圆尺度集成的自组织映射——缺陷下的自组织行为

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552439

M. Yasunaga, I. Hachiya

引用次数: 0

Fault-tolerant cube-connected cycles capable of quick broadcasting 能够快速广播的容错立方体连接周期

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552443

N. Tsuda

引用次数: 3

A defect-tolerant word-oriented static RAM with built-in self-test and self-reconfiguration 具有内置自检和自重构功能的容错字导向静态RAM

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552419

P. Nordholz, J. Otterstedt, D. Niggemeyer

{"title":"A defect-tolerant word-oriented static RAM with built-in self-test and self-reconfiguration","authors":"P. Nordholz, J. Otterstedt, D. Niggemeyer","doi":"10.1109/ICISS.1996.552419","DOIUrl":"https://doi.org/10.1109/ICISS.1996.552419","url":null,"abstract":"In this paper, an efficient method for self-test and self-reconfiguration for a word-oriented single-port static RAM is presented. First, a suitable test algorithm is chosen and implemented as a built-in self-test (BIST) with low area overhead. Further, a circuit is developed which analyses the BIST signature and, in the event of a detected error, automatically reconfigures the memory utilising redundant cells in form of rows and blocks replacing the defective ones. In the presented approach a two-level redundancy has been implemented. Therefore, the RAM is split up into several blocks. On the lower level, each block is equipped with additional memory cells in the form of spare rows. On the higher level, additional redundant blocks are provided to mask larger defects. This hierarchical redundancy strategy leads to a considerably higher yield with comparatively low area overhead. To minimize the overhead, one has to consider the block size or the number of blocks, in which the RAM is split up, as the overhead strongly depends on it. An integrated chip has been manufactured and the functionality of the self-test and self-reconfiguration concept could be proved.","PeriodicalId":131620,"journal":{"name":"1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129146367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

Effects of scanning and biasing circuit restructuring on the response of a large area magnetic field sensor array 扫描和偏置电路重构对大面积磁场传感器阵列响应的影响

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552412

Y. Audet, G. Chapman

引用次数: 0

A general approach in system design integrating reconfigurable accelerators 集成可重构加速器的系统设计通用方法

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552407

R. Hartenstein, J. Becker, M. Herz, U. Nageldinger

引用次数: 27

Early analysis of cost/performance trade-offs in MCM systems MCM系统中成本/性能权衡的早期分析

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552430

V. Garg, D. Schimmel, D. Stogner, C. Ulmer, D. S. Wills, S. Yalamanchili

引用次数: 19

An analog telephone subscriber chipset integrating 16 lines with fully programmable central office impedance 一种模拟电话用户芯片组，集成16条线路，具有完全可编程的中心局阻抗

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon Pub Date : 1996-10-09 DOI: 10.1109/ICISS.1996.552425

E. Moons, M. De Langhe, L. Kiss, E. Op de Beeck, J. Sevenhans

引用次数: 0