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Design of a microwave ablation system used to treat arythmogenous focus in cardiology 一种用于治疗心脏科原发性病灶的微波消融系统的设计
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.604001
D. Berube, F. Ghannouchi, P. Savard, J. Gauthier
{"title":"Design of a microwave ablation system used to treat arythmogenous focus in cardiology","authors":"D. Berube, F. Ghannouchi, P. Savard, J. Gauthier","doi":"10.1109/IMTC.1997.604001","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604001","url":null,"abstract":"Since the end of the 1980's, some cardiac rhythm disorders can be cured by a catheter RF ablation. This method is very efficient when the arythmogenous focus is small and situated near to the endocardium surface. However, when this focus is large and deep in the myocardium, the efficiency of RF ablation decreases in an important way. Microwave ablation could be used in these cases. This paper presents a microwave system that has been designed to treat arythmogenous focus by catheter ablation. Important technical characteristics have been implemented in this system to improve its versatility and to ensure the security of the patient.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130217334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Time series analysis in the frequency domain 频域时间序列分析
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.604010
R. Pintelon, J. Schoukens
{"title":"Time series analysis in the frequency domain","authors":"R. Pintelon, J. Schoukens","doi":"10.1109/IMTC.1997.604010","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604010","url":null,"abstract":"This paper presents a parametric frequency domain identification algorithm for autoregressive moving average (ARMA) processes that does not suffer from spectral leakage errors. It is based on an extended transfer function model that takes into account the begin and end effect of the finite data record. The relationship with the one step ahead prediction error method is established. The advantages of the proposed method are easy prefiltering and leakage free spectral representation of the raw data.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130250713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Improved recursive Newton type algorithm for real-time frequency estimation in power systems 电力系统实时频率估计的改进递归牛顿算法
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603992
V. Terzija
{"title":"Improved recursive Newton type algorithm for real-time frequency estimation in power systems","authors":"V. Terzija","doi":"10.1109/IMTC.1997.603992","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603992","url":null,"abstract":"In this paper a new improved recursive Newton type algorithm suitable for measurement applications in power systems is presented. It is used for power system frequency, phasors and spectra estimation. The recursive form of Newton type algorithm is improved with a strategy of sequentially tuning the forgetting factor. By this, the main algorithm properties, speed of convergence and accuracy, are significantly improved. The results of computer simulation, laboratory testing and off-line full-scale real-life data processing are given to show the main algorithm features.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125525214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of operational amplifier parameters on the performance of feedback structures with thermoresistive sensors 运算放大器参数对带有热阻传感器的反馈结构性能的影响
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.610254
R. Freire, G. S. Deep, A. Oliveira
{"title":"Effect of operational amplifier parameters on the performance of feedback structures with thermoresistive sensors","authors":"R. Freire, G. S. Deep, A. Oliveira","doi":"10.1109/IMTC.1997.610254","DOIUrl":"https://doi.org/10.1109/IMTC.1997.610254","url":null,"abstract":"Feedback circuits with thermoresistive sensors have been widely used in the measurement of thermal radiation and fluid flow. In general, the operation of these circuits is explained assuming an ideal operational amplifier used in the feedback configuration. The effect of various limiting parameters of the operational amplifier on the static and dynamic performance has been analyzed. The error introduced when used as a measuring device, due to input offset voltage is estimated.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125580723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A simple NWA calibration algorithm based on a transfer standard 基于传输标准的简单NWA校准算法
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603911
G. Madonna, A. Ferrero, U. Pisani
{"title":"A simple NWA calibration algorithm based on a transfer standard","authors":"G. Madonna, A. Ferrero, U. Pisani","doi":"10.1109/IMTC.1997.603911","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603911","url":null,"abstract":"A new two-port network analyzer (NWA) calibration technique is here presented. It uses a single two-port transfer standard plus a known reflectance to perform the calibration process. The transfer standard device has to be previously fully characterized with a traceable NWA. The technique here proposed uses less standards than any other up today calibration algorithm, which, on the contrary, requires at least three different devices. The paper presents the calibration algorithm along with some on-wafer experimental results which compare the new solution with a more traditional technique.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"281 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121046845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Active load characterization of a microwave transistor for oscillator design 微波晶体管有源负载特性的振荡器设计
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.604036
P. Berini, F. Ghannouchi, R. Bosisio
{"title":"Active load characterization of a microwave transistor for oscillator design","authors":"P. Berini, F. Ghannouchi, R. Bosisio","doi":"10.1109/IMTC.1997.604036","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604036","url":null,"abstract":"This paper describes the use of a six-port active load measurement system to determine the optimal large-signal loading of transistors for the design of microwave oscillators providing maximum output power. Our system has been used to measure the optimal large-signal terminating impedance for a potentially unstable microwave transistor and to apply the device line characterization technique. This technique, which is used to characterize a negative resistance monoport and predict the level of oscillator output power, is implemented for the first time using active loading. An oscillator designed using our measurements generated an output power of 11.3 dBm at a frequency of 3.5 GHz. This result is in good agreement with the value predicted from the device line technique and our measurement system.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121466138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Independent scaling of a delay in frequency domain system identification 频域系统辨识中时延的独立标度
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.604055
J. Strompf, I. Kollár, Y. Rolain
{"title":"Independent scaling of a delay in frequency domain system identification","authors":"J. Strompf, I. Kollár, Y. Rolain","doi":"10.1109/IMTC.1997.604055","DOIUrl":"https://doi.org/10.1109/IMTC.1997.604055","url":null,"abstract":"Numerical conditioning and identifiability are key factors in frequency domain identification. Independent frequency scaling of the delay in transfer function models is studied in view of these two topics, both for ordinary s-domain descriptions as well as for orthogonal polynomials. An algorithm and a rule of thumb are proposed for device independent scaling during estimation sessions.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125235850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Fuzzy modelling and control using parameterised linear filters 模糊建模和控制使用参数化线性滤波器
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.610182
Z. Papp
{"title":"Fuzzy modelling and control using parameterised linear filters","authors":"Z. Papp","doi":"10.1109/IMTC.1997.610182","DOIUrl":"https://doi.org/10.1109/IMTC.1997.610182","url":null,"abstract":"The paper presents a nonlinear identification scheme, which consists of a linear dynamical section (filter) and a nonlinear zero-memory section (implemented by a fuzzy mapping). Only the filter section is on the primary signal path. The nonlinear mapping (depending on the system input and state) delivers the filter parameters. The identification assumes structural knowledge about the process with proper parameterisation. An adaption procedure is introduced, which tunes the nonlinear mapping (e.g. membership function parameters) to minimize identification error. The adaption procedure is driven by the approximate dynamical sensitivity model of the system thus the method is very effective with respect to the number of training steps necessary to reach the accuracy required. The scheme proposed can incorporate a priori knowledge on two levels (structure and fuzzy rule set). One of the most distinctive features of the scheme is that it directly supports controller design and/or (on-line) tuning.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125611015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits 用于线性和非线性多端口RF和数字电路的自动n端口网络分析仪
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603912
N. Boulejfen, A. Ferrero, F. Ghannouchi, A. Kouki
{"title":"An automated N-port network analyzer for linear and non linear multi-port RF and digital circuits","authors":"N. Boulejfen, A. Ferrero, F. Ghannouchi, A. Kouki","doi":"10.1109/IMTC.1997.603912","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603912","url":null,"abstract":"A new automated N-port time and frequency domain network analyzer based on the microwave transition analyzer MTA, used as a high speed digital oscilloscope, has been developed. The validity of the developed system is demonstrated with number of experimental measurements on different multi-ports structures.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133504218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A digital instrument for measurement of voltage flicker 一种测量电压闪变的数字仪器
IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings Pub Date : 1997-05-19 DOI: 10.1109/IMTC.1997.603957
S. Nuccio
{"title":"A digital instrument for measurement of voltage flicker","authors":"S. Nuccio","doi":"10.1109/IMTC.1997.603957","DOIUrl":"https://doi.org/10.1109/IMTC.1997.603957","url":null,"abstract":"The voltage flicker is one of the aspects of power quality related to slow and repetitive fluctuations (0,5-30 Hz) of the rms voltage of the electricity supply network. To evaluate these fluctuations the UIE&IEC give functional and design specifications for a flickermeter. The proposed measurement techniques are basically designed for analog implementation. In this paper, a digital flickermeter is presented based on the forward and inverse F.F.T. and on the filtering in the frequency domain for the implementation of the functional blocks of simulation of lamp-eye-brain response. The instrument, implemented with a NI acquisition board inserted on a PC and with a software developed with the LabView tools, samples the voltage and furnishes the instantaneous flicker level, continuously sampled at 2 kHz. Results of simulated and actual data are reported to validate the performances of the realized flickermeter compliant the specifications of the IEC 868 recommendation.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"275 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133615930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
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