{"title":"A simple NWA calibration algorithm based on a transfer standard","authors":"G. Madonna, A. Ferrero, U. Pisani","doi":"10.1109/IMTC.1997.603911","DOIUrl":null,"url":null,"abstract":"A new two-port network analyzer (NWA) calibration technique is here presented. It uses a single two-port transfer standard plus a known reflectance to perform the calibration process. The transfer standard device has to be previously fully characterized with a traceable NWA. The technique here proposed uses less standards than any other up today calibration algorithm, which, on the contrary, requires at least three different devices. The paper presents the calibration algorithm along with some on-wafer experimental results which compare the new solution with a more traditional technique.","PeriodicalId":124893,"journal":{"name":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","volume":"281 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation and Measurement Technology Conference Sensing, Processing, Networking. IMTC Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1997.603911","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A new two-port network analyzer (NWA) calibration technique is here presented. It uses a single two-port transfer standard plus a known reflectance to perform the calibration process. The transfer standard device has to be previously fully characterized with a traceable NWA. The technique here proposed uses less standards than any other up today calibration algorithm, which, on the contrary, requires at least three different devices. The paper presents the calibration algorithm along with some on-wafer experimental results which compare the new solution with a more traditional technique.