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Fresenius' Journal of Analytical Chemistry最新文献

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Preparation of cuprite (Cu2O), paramelaconite (Cu32+Cu21+O4) and tenorite (CuO) with magnetron sputtering ion plating: characterization by EPMA, XRD, HEED and SEM 磁控溅射离子镀制备铜(Cu2O)、副乌头矿(Cu32+Cu21+O4)和钛矿(CuO): EPMA、XRD、HEED和SEM表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050415
A. v. Richthofen, R. Domnick, R. Cremer
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引用次数: 30
Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films STM尖端卷积效应在金属- c:H薄膜粒径和距离测定中的修正
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050424
K. I. Schiffmann, M. Fryda, G. Goerigk, R. Lauer, P. Hinze
{"title":"Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films","authors":"K. I. Schiffmann, M. Fryda, G. Goerigk, R. Lauer, P. Hinze","doi":"10.1007/S002160050424","DOIUrl":"https://doi.org/10.1007/S002160050424","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"20 1","pages":"341-344"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78056199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Density and Young’s modulus of thin TiO2 films TiO2薄膜的密度和杨氏模量
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-01-01 DOI: 10.1007/s002160050416
O. Anderson, C. Ottermann, R. Kuschnereit, P. Hess, K. Bange
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引用次数: 13
Scratch test measurement of tribological hard coatings in practice 摩擦学硬质涂层的划痕试验测量
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-01-01 DOI: 10.1007/S002160050407
G. Berg, C. Friedrich, E. Broszeit, C. Berger
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引用次数: 32
Depth profile analysis of thin film solar cells using SNMS and SIMS 薄膜太阳能电池的SNMS和SIMS深度剖面分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-01-01 DOI: 10.1007/S002160050385
M. Gastel, U. Breuer, H. Holzbrecher, J. S. Becker, H. Dietze, H. Wagner
{"title":"Depth profile analysis of thin film solar cells using SNMS and SIMS","authors":"M. Gastel, U. Breuer, H. Holzbrecher, J. S. Becker, H. Dietze, H. Wagner","doi":"10.1007/S002160050385","DOIUrl":"https://doi.org/10.1007/S002160050385","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"6 1","pages":"207-210"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80425275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES XPS、RBS和GDOES深度剖面铜氧化物的对比研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-10-01 DOI: 10.1007/BF00322088
H. Bubert, E. Grallath, A. Quentmeier, M. Wielunski, L. Borucki
{"title":"Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES","authors":"H. Bubert, E. Grallath, A. Quentmeier, M. Wielunski, L. Borucki","doi":"10.1007/BF00322088","DOIUrl":"https://doi.org/10.1007/BF00322088","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"148 1","pages":"456-463"},"PeriodicalIF":0.0,"publicationDate":"1995-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76440985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS 用NRA [13C(p，γ)14N]和RBS表征硅中13C的注入
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-10-01 DOI: 10.1007/BF00322093
W. Theodossiu, H. Baumann, A. Markwitz, K. Bethge
{"title":"Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS","authors":"W. Theodossiu, H. Baumann, A. Markwitz, K. Bethge","doi":"10.1007/BF00322093","DOIUrl":"https://doi.org/10.1007/BF00322093","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"18 8 1","pages":"483-486"},"PeriodicalIF":0.0,"publicationDate":"1995-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82894451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Quality and the development of reference materials, including the role of traceability and comparability 标准物质的质量和发展，包括可追溯性和可比性的作用
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322337
W. P. Reed
{"title":"Quality and the development of reference materials, including the role of traceability and comparability","authors":"W. P. Reed","doi":"10.1007/BF00322337","DOIUrl":"https://doi.org/10.1007/BF00322337","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"63 1","pages":"250-254"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78209767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Optical and electrical measurements on CO2 covered copper films 二氧化碳覆盖铜膜的光学和电学测量
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00321368
M. Rauh, P. Wissmann
{"title":"Optical and electrical measurements on CO2 covered copper films","authors":"M. Rauh, P. Wissmann","doi":"10.1007/BF00321368","DOIUrl":"https://doi.org/10.1007/BF00321368","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"45 1","pages":"769-771"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82213213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Model calculations of temperature programmed surface segregation 温度程序表面偏析的模型计算
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00321367
M. Eisl, B. M. Reichl, H. Störi
{"title":"Model calculations of temperature programmed surface segregation","authors":"M. Eisl, B. M. Reichl, H. Störi","doi":"10.1007/BF00321367","DOIUrl":"https://doi.org/10.1007/BF00321367","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"46 1","pages":"766-768"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87826376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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