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Fresenius' Journal of Analytical Chemistry最新文献

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Characterization of SiO2 protective coatings on polycarbonate 聚碳酸酯表面SiO2保护涂层的表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050395
S. Jakobs, U. Schulz, A. Duparré, N. Kaiser
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引用次数: 3
Preparation of cuprite (Cu2O), paramelaconite (Cu32+Cu21+O4) and tenorite (CuO) with magnetron sputtering ion plating: characterization by EPMA, XRD, HEED and SEM 磁控溅射离子镀制备铜(Cu2O)、副乌头矿(Cu32+Cu21+O4)和钛矿(CuO): EPMA、XRD、HEED和SEM表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050415
A. v. Richthofen, R. Domnick, R. Cremer
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引用次数: 30
Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films STM尖端卷积效应在金属- c:H薄膜粒径和距离测定中的修正
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050424
K. I. Schiffmann, M. Fryda, G. Goerigk, R. Lauer, P. Hinze
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引用次数: 5
Density and Young’s modulus of thin TiO2 films TiO2薄膜的密度和杨氏模量
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-01-01 DOI: 10.1007/s002160050416
O. Anderson, C. Ottermann, R. Kuschnereit, P. Hess, K. Bange
{"title":"Density and Young’s modulus of thin TiO2 films","authors":"O. Anderson, C. Ottermann, R. Kuschnereit, P. Hess, K. Bange","doi":"10.1007/s002160050416","DOIUrl":"https://doi.org/10.1007/s002160050416","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"29 1","pages":"315-318"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90448506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Scratch test measurement of tribological hard coatings in practice 摩擦学硬质涂层的划痕试验测量
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-01-01 DOI: 10.1007/S002160050407
G. Berg, C. Friedrich, E. Broszeit, C. Berger
{"title":"Scratch test measurement of tribological hard coatings in practice","authors":"G. Berg, C. Friedrich, E. Broszeit, C. Berger","doi":"10.1007/S002160050407","DOIUrl":"https://doi.org/10.1007/S002160050407","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"22 1","pages":"281-285"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91199098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 32
Depth profile analysis of thin film solar cells using SNMS and SIMS 薄膜太阳能电池的SNMS和SIMS深度剖面分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-01-01 DOI: 10.1007/S002160050385
M. Gastel, U. Breuer, H. Holzbrecher, J. S. Becker, H. Dietze, H. Wagner
{"title":"Depth profile analysis of thin film solar cells using SNMS and SIMS","authors":"M. Gastel, U. Breuer, H. Holzbrecher, J. S. Becker, H. Dietze, H. Wagner","doi":"10.1007/S002160050385","DOIUrl":"https://doi.org/10.1007/S002160050385","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"6 1","pages":"207-210"},"PeriodicalIF":0.0,"publicationDate":"1997-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80425275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES XPS、RBS和GDOES深度剖面铜氧化物的对比研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-10-01 DOI: 10.1007/BF00322088
H. Bubert, E. Grallath, A. Quentmeier, M. Wielunski, L. Borucki
{"title":"Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES","authors":"H. Bubert, E. Grallath, A. Quentmeier, M. Wielunski, L. Borucki","doi":"10.1007/BF00322088","DOIUrl":"https://doi.org/10.1007/BF00322088","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"148 1","pages":"456-463"},"PeriodicalIF":0.0,"publicationDate":"1995-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76440985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS 用NRA [13C(p，γ)14N]和RBS表征硅中13C的注入
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-10-01 DOI: 10.1007/BF00322093
W. Theodossiu, H. Baumann, A. Markwitz, K. Bethge
{"title":"Characterisation of 13C implantations in silicon by NRA [13C(p,γ)14N] and RBS","authors":"W. Theodossiu, H. Baumann, A. Markwitz, K. Bethge","doi":"10.1007/BF00322093","DOIUrl":"https://doi.org/10.1007/BF00322093","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"18 8 1","pages":"483-486"},"PeriodicalIF":0.0,"publicationDate":"1995-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82894451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Adsorption of self-assembled monolayers of mercaptan on gold 自组装硫醇单层在金上的吸附
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-08-15 DOI: 10.1016/0040-6090(95)05824-9
K. Weldige, M. Rohwerder, E. Vago, H. Viefhaus, M. Stratmann
{"title":"Adsorption of self-assembled monolayers of mercaptan on gold","authors":"K. Weldige, M. Rohwerder, E. Vago, H. Viefhaus, M. Stratmann","doi":"10.1016/0040-6090(95)05824-9","DOIUrl":"https://doi.org/10.1016/0040-6090(95)05824-9","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"33 1","pages":"329-332"},"PeriodicalIF":0.0,"publicationDate":"1995-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87927511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Quality and the development of reference materials, including the role of traceability and comparability 标准物质的质量和发展，包括可追溯性和可比性的作用
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322337
W. P. Reed
{"title":"Quality and the development of reference materials, including the role of traceability and comparability","authors":"W. P. Reed","doi":"10.1007/BF00322337","DOIUrl":"https://doi.org/10.1007/BF00322337","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"63 1","pages":"250-254"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78209767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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