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Fresenius' Journal of Analytical Chemistry最新文献

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Atomic force microscopy of coated glasses 镀膜玻璃的原子力显微镜
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322080
E. Radlein, R. Ambos, G. H. Frischat
{"title":"Atomic force microscopy of coated glasses","authors":"E. Radlein, R. Ambos, G. H. Frischat","doi":"10.1007/BF00322080","DOIUrl":"https://doi.org/10.1007/BF00322080","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"53 1","pages":"413-418"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91427090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
In-situ investigation of ZnS deposition on mica by successive ionic layer adsorption and reaction method as studied with atomic force microscopy 原子力显微镜研究了连续离子层吸附和反应法在云母上沉积ZnS的原位研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00321369
R. Resch, T. Prohaska, G. Friedbacher, M. Grasserbauer, T. Kanniainen, S. Lindroos, M. Leskelä, L. Niinistö, J. Broekaert
{"title":"In-situ investigation of ZnS deposition on mica by successive ionic layer adsorption and reaction method as studied with atomic force microscopy","authors":"R. Resch, T. Prohaska, G. Friedbacher, M. Grasserbauer, T. Kanniainen, S. Lindroos, M. Leskelä, L. Niinistö, J. Broekaert","doi":"10.1007/BF00321369","DOIUrl":"https://doi.org/10.1007/BF00321369","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"1 1","pages":"772-777"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83873034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Prepolymer film growth by adsorption out of solution on silicon and aluminium 在硅和铝的溶液外吸附生长预聚物薄膜
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322081
T. Gesang, R. Höper, S. Dieckhoff, A. Hartwig, W. Possart, O. Hennemann
{"title":"Prepolymer film growth by adsorption out of solution on silicon and aluminium","authors":"T. Gesang, R. Höper, S. Dieckhoff, A. Hartwig, W. Possart, O. Hennemann","doi":"10.1007/BF00322081","DOIUrl":"https://doi.org/10.1007/BF00322081","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"84 1","pages":"419-426"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84093544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-resolution, low-voltage SEM for true surface imaging and analysis 高分辨率，低压扫描电镜，真正的表面成像和分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322073
H. Jaksch, J. Martin
{"title":"High-resolution, low-voltage SEM for true surface imaging and analysis","authors":"H. Jaksch, J. Martin","doi":"10.1007/BF00322073","DOIUrl":"https://doi.org/10.1007/BF00322073","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"1 1","pages":"378-382"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89511488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
An overview of reference materials prepared for standardization of DNA typing procedures 为DNA分型程序标准化准备的参考材料概述
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322336
D. Reeder, M. Kline, K. L. Richie
{"title":"An overview of reference materials prepared for standardization of DNA typing procedures","authors":"D. Reeder, M. Kline, K. L. Richie","doi":"10.1007/BF00322336","DOIUrl":"https://doi.org/10.1007/BF00322336","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"51 1","pages":"246-249"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88919994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A fast and simple method for background removal in Auger electron spectroscopy 一种快速简便的俄歇电子能谱背景去除方法
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322087
H. Bauer
{"title":"A fast and simple method for background removal in Auger electron spectroscopy","authors":"H. Bauer","doi":"10.1007/BF00322087","DOIUrl":"https://doi.org/10.1007/BF00322087","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"25 1","pages":"450-455"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85642577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of a quantification methodology for polychlorinated biphenyls by using Kanechlor products as the secondary reference standard 以Kanechlor产品为二级参比标准，建立多氯联苯的定量方法
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322339
R. Boonyathumanondh, S. Watanabe, W. Laovakul, M. Tabucanon
{"title":"Development of a quantification methodology for polychlorinated biphenyls by using Kanechlor products as the secondary reference standard","authors":"R. Boonyathumanondh, S. Watanabe, W. Laovakul, M. Tabucanon","doi":"10.1007/BF00322339","DOIUrl":"https://doi.org/10.1007/BF00322339","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"55 1","pages":"261-267"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86196618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Quantitative determination of element distributions in silicon based thin film solar cells using SNMS 用SNMS定量测定硅基薄膜太阳能电池中元素分布
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00322092
M. Gastel, U. Breuer, H. Holzbrecher, J. Becker, H. Dietze, M. Kubon, H. Wagner
{"title":"Quantitative determination of element distributions in silicon based thin film solar cells using SNMS","authors":"M. Gastel, U. Breuer, H. Holzbrecher, J. Becker, H. Dietze, M. Kubon, H. Wagner","doi":"10.1007/BF00322092","DOIUrl":"https://doi.org/10.1007/BF00322092","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"154 1","pages":"478-482"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86272291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Adsorbates on thin iron(100) films 吸附在薄铁(100)薄膜上
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00321363
M. Getzlaff, J. Bansmann, G. Schönhense
{"title":"Adsorbates on thin iron(100) films","authors":"M. Getzlaff, J. Bansmann, G. Schönhense","doi":"10.1007/BF00321363","DOIUrl":"https://doi.org/10.1007/BF00321363","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"39 1","pages":"748-752"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74736370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Three-dimensional atom probe study of the segregation behaviour of Ni91Pt9 alloy after sputtering 溅射后Ni91Pt9合金偏析行为的三维原子探针研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1995-01-01 DOI: 10.1007/BF00321364
W. Athenstaedt, M. Leisch
{"title":"Three-dimensional atom probe study of the segregation behaviour of Ni91Pt9 alloy after sputtering","authors":"W. Athenstaedt, M. Leisch","doi":"10.1007/BF00321364","DOIUrl":"https://doi.org/10.1007/BF00321364","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"8 1","pages":"753-756"},"PeriodicalIF":0.0,"publicationDate":"1995-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73639626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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