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Fresenius' Journal of Analytical Chemistry最新文献

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Examples for the improvements in AES depth profiling of multilayer thin film systems by application of factor analysis data evaluation 应用因子分析数据评价改进多层薄膜系统AES深度剖面的实例
Fresenius' Journal of Analytical Chemistry Pub Date : 2015-02-12 DOI: 10.1007/BF00322089
U. Scheithauer
{"title":"Examples for the improvements in AES depth profiling of multilayer thin film systems by application of factor analysis data evaluation","authors":"U. Scheithauer","doi":"10.1007/BF00322089","DOIUrl":"https://doi.org/10.1007/BF00322089","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"21 1","pages":"464-467"},"PeriodicalIF":0.0,"publicationDate":"2015-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87600837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Combined AES/factor analysis and RBS investigation of a thermally treated Pt/Ti metallisation on SiO2 结合AES/因子分析和RBS对SiO2上热处理Pt/Ti金属化的研究
Fresenius' Journal of Analytical Chemistry Pub Date : 2015-02-11 DOI: 10.1007/BF00321438
U. Scheithauer, W. Hösler, R. Bruchhaus
{"title":"Combined AES/factor analysis and RBS investigation of a thermally treated Pt/Ti metallisation on SiO2","authors":"U. Scheithauer, W. Hösler, R. Bruchhaus","doi":"10.1007/BF00321438","DOIUrl":"https://doi.org/10.1007/BF00321438","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"42 1","pages":"305-307"},"PeriodicalIF":0.0,"publicationDate":"2015-02-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77145269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Determination of idarubicin in human urine by capillary zone electrophoresis with amperometric detection. 毛细管区带电泳-安培检测法测定人尿中的依达柔比星。
Fresenius' Journal of Analytical Chemistry Pub Date : 2000-07-03 DOI: 10.1016/S0003-2670(00)00856-4
Q. Hu, T. Zhou, L. Zhang, H. Li, Y. Fang
{"title":"Determination of idarubicin in human urine by capillary zone electrophoresis with amperometric detection.","authors":"Q. Hu, T. Zhou, L. Zhang, H. Li, Y. Fang","doi":"10.1016/S0003-2670(00)00856-4","DOIUrl":"https://doi.org/10.1016/S0003-2670(00)00856-4","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"16 1","pages":"844-7"},"PeriodicalIF":0.0,"publicationDate":"2000-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91545579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Nitrogen incorporation into WTi films WTi膜中氮的掺入
Fresenius' Journal of Analytical Chemistry Pub Date : 1999-09-08 DOI: 10.1007/S002160051486
J. Burschik, B. Adolphi
{"title":"Nitrogen incorporation into WTi films","authors":"J. Burschik, B. Adolphi","doi":"10.1007/S002160051486","DOIUrl":"https://doi.org/10.1007/S002160051486","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"55 1","pages":"269-271"},"PeriodicalIF":0.0,"publicationDate":"1999-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79863798","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The influence of an epitaxial CoSi2 layer on diffusion of B and Sb in underlying Si during oxidation 氧化过程中外延CoSi2层对下伏Si中B和Sb扩散的影响
Fresenius' Journal of Analytical Chemistry Pub Date : 1999-09-08 DOI: 10.1007/S002160051489
A. Tyagi, U. Breuer, H. Holzbrecher, J. Becker, H. Dietze, L. Kappius, H. Bay, S. Mantl
{"title":"The influence of an epitaxial CoSi2 layer on diffusion of B and Sb in underlying Si during oxidation","authors":"A. Tyagi, U. Breuer, H. Holzbrecher, J. Becker, H. Dietze, L. Kappius, H. Bay, S. Mantl","doi":"10.1007/S002160051489","DOIUrl":"https://doi.org/10.1007/S002160051489","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"66 1","pages":"282-285"},"PeriodicalIF":0.0,"publicationDate":"1999-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72884010","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Chemical interaction and diffusion on interface cathode/electrolyte of SOFC SOFC阴极/电解质界面上的化学相互作用和扩散
Fresenius' Journal of Analytical Chemistry Pub Date : 1999-09-08 DOI: 10.1007/S002160051488
A. Naoumidis, A. Ahmad-Khanlou, Z. Samardz̆ija, D. Kolar
{"title":"Chemical interaction and diffusion on interface cathode/electrolyte of SOFC","authors":"A. Naoumidis, A. Ahmad-Khanlou, Z. Samardz̆ija, D. Kolar","doi":"10.1007/S002160051488","DOIUrl":"https://doi.org/10.1007/S002160051488","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"25 1","pages":"277-281"},"PeriodicalIF":0.0,"publicationDate":"1999-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77907768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Mixed self-assembled monolayers of terminally functionalized thiols at gold surfaces characterized by angle resolved X-ray photoelectron spectroscopy (ARXPS) studies 角分辨x射线光电子能谱(ARXPS)研究了金表面末端功能化硫醇混合自组装单层
Fresenius' Journal of Analytical Chemistry Pub Date : 1999-09-08 DOI: 10.1007/S002160051487
J. Heeg, U. Schubert, F. Küchenmeister
{"title":"Mixed self-assembled monolayers of terminally functionalized thiols at gold surfaces characterized by angle resolved X-ray photoelectron spectroscopy (ARXPS) studies","authors":"J. Heeg, U. Schubert, F. Küchenmeister","doi":"10.1007/S002160051487","DOIUrl":"https://doi.org/10.1007/S002160051487","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"1 1","pages":"272-276"},"PeriodicalIF":0.0,"publicationDate":"1999-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90175044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Characterization of nanoscale metal structures obtained by template synthesis 模板合成纳米金属结构的表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1998-08-03 DOI: 10.1007/S002160050992
F. Schlottig, M. Textor, N. Spencer, K. Sekinger, U. Schnaut, J.-F. Paulet
{"title":"Characterization of nanoscale metal structures obtained by template synthesis","authors":"F. Schlottig, M. Textor, N. Spencer, K. Sekinger, U. Schnaut, J.-F. Paulet","doi":"10.1007/S002160050992","DOIUrl":"https://doi.org/10.1007/S002160050992","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"21 1","pages":"684-686"},"PeriodicalIF":0.0,"publicationDate":"1998-08-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86861700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique x射线吸收光谱:用电子产率技术对(模型)催化剂的敏感表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1998-08-03 DOI: 10.1007/S002160050990
T. Schedel-Niedrig
{"title":"X-Ray absorption spectroscopy: sensitive characterization of (model-) catalysts with the electron yield technique","authors":"T. Schedel-Niedrig","doi":"10.1007/S002160050990","DOIUrl":"https://doi.org/10.1007/S002160050990","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"46 1","pages":"680-682"},"PeriodicalIF":0.0,"publicationDate":"1998-08-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86490056","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Polarization sensitive in situ infrared spectroscopy: the adsorption of simple ions at platinum electrodes 偏振敏感的原位红外光谱:简单离子在铂电极上的吸附
Fresenius' Journal of Analytical Chemistry Pub Date : 1998-08-03 DOI: 10.1007/S002160050996
M. Bron, R. Holze
{"title":"Polarization sensitive in situ infrared spectroscopy: the adsorption of simple ions at platinum electrodes","authors":"M. Bron, R. Holze","doi":"10.1007/S002160050996","DOIUrl":"https://doi.org/10.1007/S002160050996","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"41 1","pages":"694-696"},"PeriodicalIF":0.0,"publicationDate":"1998-08-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90832034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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