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Fresenius' Journal of Analytical Chemistry最新文献

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ESCA-Analysis of tin compounds on the surface of hydroxyapatite 羟基磷灰石表面锡化合物的esca分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050402
K. Schenk-Meuser, H. Duschner
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引用次数: 8
On the dynamic range in depth profiling with electron-gas SNMS 电子-气体SNMS深度剖面动态范围研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050412
W. Bock, M. Kopnarski, H. Oechsner
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引用次数: 2
Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS 用AES、因子分析和XPS表征激光电弧沉积多层体系
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050413
A. John, H. Scheibe, H. Ziegele, S. Oswald
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引用次数: 2
Oxidation behavior of mechanically alloyed chromium based alloys 机械合金化铬基合金的氧化行为
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050391
U. v. d. Crone, M. Hänsel, W. Quadakkers, R. Vaßen
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引用次数: 10
CEMS studies of thermally treated Fe/TiN coatings on Si(1,0,0) Si(1,0,0)表面热处理Fe/TiN涂层的CEMS研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050411
D. Hanzel
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引用次数: 3
Characterisation of adsorbed layers on sulphide minerals by photoelectron spectroscopy 硫化物矿物吸附层的光电子能谱表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050401
A. Schaufuß, P. Rossbach, I. Uhlig, R. Szargan
{"title":"Characterisation of adsorbed layers on sulphide minerals by photoelectron spectroscopy","authors":"A. Schaufuß, P. Rossbach, I. Uhlig, R. Szargan","doi":"10.1007/S002160050401","DOIUrl":"https://doi.org/10.1007/S002160050401","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"50 1","pages":"262-265"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83218285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
SIMS depth profiling of vertical p-channel Si-MOS transistor structures 垂直p沟道Si-MOS晶体管结构的SIMS深度分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050384
U. Zastrow, R. Loo, K. Szot, J. Moers, T. Grabolla, D. Behammer, L. Vescan
{"title":"SIMS depth profiling of vertical p-channel Si-MOS transistor structures","authors":"U. Zastrow, R. Loo, K. Szot, J. Moers, T. Grabolla, D. Behammer, L. Vescan","doi":"10.1007/S002160050384","DOIUrl":"https://doi.org/10.1007/S002160050384","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"62 1","pages":"203-207"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88281486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Flow sorption calorimetry, a powerful tool to investigate the acid-base character of organic polymer surfaces 流动吸附量热法是研究有机聚合物表面酸碱特性的有力工具
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050396
S. Schneider, F. Simon, D. Pleul, H. Jacobasch
{"title":"Flow sorption calorimetry, a powerful tool to investigate the acid-base character of organic polymer surfaces","authors":"S. Schneider, F. Simon, D. Pleul, H. Jacobasch","doi":"10.1007/S002160050396","DOIUrl":"https://doi.org/10.1007/S002160050396","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"214 1","pages":"244-247"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89173848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Chemical analysis of the interface between Al thin films and polymer surfaces pretreated with KrF-excimer laser radiation krf准分子激光辐照预处理铝薄膜与聚合物表面界面的化学分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050397
D. Wesner, R. Weichenhain, Wilhelm Pfleging, H. Horn, E. Kreutz
{"title":"Chemical analysis of the interface between Al thin films and polymer surfaces pretreated with KrF-excimer laser radiation","authors":"D. Wesner, R. Weichenhain, Wilhelm Pfleging, H. Horn, E. Kreutz","doi":"10.1007/S002160050397","DOIUrl":"https://doi.org/10.1007/S002160050397","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"18 1","pages":"248-250"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77025763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Characterization of SiO2 protective coatings on polycarbonate 聚碳酸酯表面SiO2保护涂层的表征
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050395
S. Jakobs, U. Schulz, A. Duparré, N. Kaiser
{"title":"Characterization of SiO2 protective coatings on polycarbonate","authors":"S. Jakobs, U. Schulz, A. Duparré, N. Kaiser","doi":"10.1007/S002160050395","DOIUrl":"https://doi.org/10.1007/S002160050395","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"29 1","pages":"242-244"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79177077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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