2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)最新文献

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A unique centralized-management methodology block/architecture and a novel random input stimulus controlled variable table implementation for the latest marvell ethernet PHY UVM verification platform 为最新的marvell以太网PHY UVM验证平台提供了独特的集中管理方法块/架构和新颖的随机输入刺激控制变量表实现
Peter Wang
{"title":"A unique centralized-management methodology block/architecture and a novel random input stimulus controlled variable table implementation for the latest marvell ethernet PHY UVM verification platform","authors":"Peter Wang","doi":"10.1109/ICAM.2017.8242189","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242189","url":null,"abstract":"More than eighty different test environments need to be created and maintained for debugging the Marvell Ethernet PHY chip if the traditional industrial verification methodology is being used. This can easily incite very complicated debugging procedures and cause the problems and concerns of a multitude of engineering resources. The latest Marvell Ethernet PHY IC UVM verification platform integrating with the Marvell selected IP vendor's UVM library has been developed. A unique centralized-management methology block/architecture idea is brought in to build this UVM verification platform for the latest Marvell Ethernet PHY integrated circuit. All the eighty different test modes can be tested and verified in the same single UVM platform environment. This UVM verification platform environment significantly reduces the number of engineering resources needed to create and maintain the test cases. It also greatly saves debugging time and reduces chip development time. In the meanwhile, a novel random input stimulus controlled variables table idea is also implemented in this UVM verification platform to manage and improve the function coverage much more easily and efficiently.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127094968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Low-power adaptive edge decision feedback equalizer for serial links with 4PAM signaling 具有4PAM信令的串行链路低功耗自适应边缘决策反馈均衡器
Matthew Dolan, F. Yuan
{"title":"Low-power adaptive edge decision feedback equalizer for serial links with 4PAM signaling","authors":"Matthew Dolan, F. Yuan","doi":"10.1109/ICAM.2017.8242150","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242150","url":null,"abstract":"This paper presents a low-power adaptive edge decision feedback equalizer (DFE) for 10 giga-bits-per-second (Gbps) serial links with 4 PAM (pulse-amplitude-modulation) signaling. Optimal tap coefficients are obtained adaptively using a sign-sign least-mean-square (SS-LMS) algorithm that minimizes the jitter of equalized data. Low-voltage-differential-signaling (LVDS) tap generators that double DFE strength without increasing power consumption are used. Power reduction is also achieved by only activating the tap generator corresponding to the incoming data and sharing slicers for determining data state, the sign of data jitter, and bang-bang phase detection. A frequency locked-loop locked to an external frequency reference and a bang-bang phase-locked loop locked to the edge of equalized data, both sharing the same active inductor ring oscillator with separate frequency and phase tunings, are employed for clock recovery. The effectiveness of the proposed edge DFE is validated using a 10 Gbps 4PAM serial link designed in a 65 nm CMOS technology over a wire channel with 12 dB loss at baud-rate frequency. Simulation results demonstrated that the proposed adaptive edge DFE is capable of achieving 46% vertical opening and 60% horizontal eye-opening while consuming 26.24 mW.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130955574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An efficient triggering method of hardware Trojan in AES cryptographic circuit AES加密电路中硬件木马的一种有效触发方法
Xin Chuan, Yingjian Yan, Yi-lun Zhang
{"title":"An efficient triggering method of hardware Trojan in AES cryptographic circuit","authors":"Xin Chuan, Yingjian Yan, Yi-lun Zhang","doi":"10.1109/ICAM.2017.8242145","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242145","url":null,"abstract":"The cryptographic chip is widely used in government, military, finance, business and other fields, so the requirement of security is very high. The globalization of the integrated circuit supply chains has promoted the rapid development of the industry, but the chip is also vulnerable to malicious modified by the attacker, namely hardware Trojan implanted. The paper proposed a hardware Trojan efficient triggering method in AES cryptographic circuit. The method generated the test vector set by using the proposed optimal expand algorithm, which was used for detecting the AES cryptographic circuit to judge whether AES circuit exist hardware Trojans. Experiment results indicate that the method proposed in this paper can effectively trigger the hardware Trojan, increase the number of hardware Trojans triggered, and improve the trigger efficiency of the hardware Trojan. Thus, it is an efficient triggering method for detecting combinational hardware Trojans in AES Cryptographic circuit.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123429852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
An on-chip binning sensor for low-cost and accurate speed binning 用于低成本和精确速度装箱的片上装箱传感器
Dongrong Zhang, Xiaoxiao Wang
{"title":"An on-chip binning sensor for low-cost and accurate speed binning","authors":"Dongrong Zhang, Xiaoxiao Wang","doi":"10.1109/ICAM.2017.8242158","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242158","url":null,"abstract":"Due to process variations at the very low technology nodes, the manufactured chips are grouped into different speed bins. Currently, various types of maximum operation frequency (Fmax) tests are performed for efficient speed binning by applying complex functional or structural test patterns, which incurs high test cost. In this paper, a novel on-chip Binning Sensor is proposed which can monitor the worst-case timing slack in the DUT. Then the chip can be binned to the corresponding speed bin according to the test frequency and slack information. The proposed sensor has been implemented on various ITC benchmarks and the FGU of OpenSPARCT2 core on 28nm technology node. Experiment result shows that the proposed sensor can accurately monitor the slack of the DUT with low test time. At the same time, the proposed sensor is all-digital, which requires low design effort, and less than 1% area overhead for large benchmarks.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"368 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122922380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Reason analysis and countermeasure of opening failure of 220 kV circuit breaker 220kv断路器分闸故障原因分析及对策
W. Wang, Lin Yan, N. Zhang, Hua Yu, Wen-biao Tao
{"title":"Reason analysis and countermeasure of opening failure of 220 kV circuit breaker","authors":"W. Wang, Lin Yan, N. Zhang, Hua Yu, Wen-biao Tao","doi":"10.1109/ICAM.2017.8242173","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242173","url":null,"abstract":"Among power generation, transmission and use, distribution is an extremely important link. The distribution system includes a transformer and a variety of high and low voltage electrical equipment, the circuit breaker is a large amount of electrical appliances. The circuit breaker can be used to distribute electric energy, the asynchronous motor is not frequently started and the power line and motor is protected. The utility model can automatically cut off the circuit when the overload, short circuit and under voltage fault occur, and the utility model is equivalent to the combination of the fuse type switch and the over low thermal relay. In this paper, the problem of the failure of Qixian 220kV circuit breaker is analyzed. It is concluded that the gap of the switch electromagnet in the circuit breaker is changed and the hammer and trigger gap is too large. After the operation of the gate and non full phase protection, the top cannot trigger, thus unable to brake the conclusion.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"157 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124887685","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study on fault diagnosis method of transformer using multi-neural network and evidence theory 基于多神经网络和证据理论的变压器故障诊断方法研究
Wei Wang, N. Zhang, Xing-Ting Liu, Yu Han, Wen-biao Tao
{"title":"Study on fault diagnosis method of transformer using multi-neural network and evidence theory","authors":"Wei Wang, N. Zhang, Xing-Ting Liu, Yu Han, Wen-biao Tao","doi":"10.1109/ICAM.2017.8242172","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242172","url":null,"abstract":"In order to solve the problems of power transformer such as the fault can be reflected by different characteristic signal from different side and complexity of fault reason and phenomenon, a synthetic diagnosis method using multi-neural network and evidence theory for transformer fault diagnosis is presented. Various kinds of data are dealt by using neural network's excellent abilities of learning, memory and recognition. Integrating data fusion methods, neural network's preliminary results are diagnosed by evidence theory. It has been shown by experiments that the accuracy rate of transformer fault diagnosis is up to 73%.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121672425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 25–28Gb/s PLL-based full-rate reference-less CDR in 0.13μm SiGe BiCMOS 基于25-28Gb /s锁相环的0.13μm SiGe BiCMOS全速率无参考CDR
Peng Zhang, Changchun Zhang, Jingjian Zhang, Yi Zhang, Ying Zhang, Xincun Ji
{"title":"A 25–28Gb/s PLL-based full-rate reference-less CDR in 0.13μm SiGe BiCMOS","authors":"Peng Zhang, Changchun Zhang, Jingjian Zhang, Yi Zhang, Ying Zhang, Xincun Ji","doi":"10.1109/ICAM.2017.8242165","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242165","url":null,"abstract":"A 25–28Gb/s full-rate reference-less CDR is presented and designed in a standard 0.13μm SiGe BiCMOS process, which can be applicable to nearly all classical 100G communication protocols by multi-channel configuration. It consists mainly of a full-rate phase frequency detector, a quadrature voltage control oscillator and two voltage to current convertors with loop filters. A dual-loop topology is adopted in order for a wide frequency acquisition range and an excellent jitter performance. Simulation results show that the proposed CDR operates properly at a data rate of 25–28Gb/s. When a 25Gb/s PRBS data is applied, the jitters of the recovered clock and data are 0.34ps and 2.8ps, respectively, with 91 mA current consumption from a single power supply of 1.7V.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121983530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A dual-channel GNSS receiver for GPS and Beidou applications 用于GPS和北斗应用的双通道GNSS接收机
Y. Lyu, Wei Zou, Shuang Chen
{"title":"A dual-channel GNSS receiver for GPS and Beidou applications","authors":"Y. Lyu, Wei Zou, Shuang Chen","doi":"10.1109/ICAM.2017.8242195","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242195","url":null,"abstract":"This paper presents a dual-channel GNSS receiver covering GPS and Beidou on a single chip in 0.13μm CMOS process. The receiver incorporates one reconfigurable RF front-end and two separate IF signal channels with one single fractional-N frequency synthesizer by using a ring voltage-controlled oscillator. This architecture supports an external active or passive antenna and provides the benefits of low cost and power consumption. An optional SAW filter can be inserted between the low-noise amplifier and mixer, providing out-of-band interference rejection in high performance applications. The receiver exhibits maximum gain of 95 dB and noise figures of 3.5 and 3.7 dB for L1 and B1 bands, respectively. The total power consumption of the receiver is 30 mW with a 1.2-V supply while occupying a 1.7mm2 die area including the ESD I/O pads. The one presented here is the smallest dual-channel GNSS receiver reported so far.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130697150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The development of microsystem technology 微系统技术的发展
Hu Jianfei, Guo Jinjin
{"title":"The development of microsystem technology","authors":"Hu Jianfei, Guo Jinjin","doi":"10.1109/ICAM.2017.8242146","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242146","url":null,"abstract":"Microsystem technology based on micro machining technology and integrated circuit technology has the advantages of miniaturization, integration, intelligence, low cost, high performance, mass production and so on. An overview of the composition and working principle of the microsystem, it introduces the development history of micro system technology, current situation and industrial distribution pattern, focuses on several important micro machining technology, analyses surface processing technology, bonding, LIGA technology, nano imprint technology and high aspect ratio manufacturing technology principle, characteristics and manufacturing process, explains the study of microsystem CAD, and combines with the current application of micro devices of the advantages of technology, which has a certain value for the study of microsystem technology.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126785234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis and simulation of LLC resonant converter with voltage-doubling rectifier 带倍压整流器的LLC谐振变换器的分析与仿真
Shulin Liu, Chaoying Wang, Qianqian Wang, Shitong Tao
{"title":"Analysis and simulation of LLC resonant converter with voltage-doubling rectifier","authors":"Shulin Liu, Chaoying Wang, Qianqian Wang, Shitong Tao","doi":"10.1109/ICAM.2017.8242154","DOIUrl":"https://doi.org/10.1109/ICAM.2017.8242154","url":null,"abstract":"A kind of LLC resonant converter with voltage-doubling rectifier technology is studied in this paper. The converter has not only a general LLC half-bridge resonant converter being easy to obtain ZVS for primary side switches and ZCS for secondary side diodes, a high efficiency of this topology, but also advantages that the transformer structure is simple in which one winding is involved on its secondary side, voltage stress of two output capacitors are half of output voltage and extra voltage balance circuit is excluded. Voltage and current stress of two output rectifier diodes are equal to output voltage and current, respectively. The working principle of the converter and the soft switching process are analyzed in detail in this paper. Simulation and experiment results are in positive to the analysis showing the feasibility of the proposed method.","PeriodicalId":117801,"journal":{"name":"2017 2nd IEEE International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130244550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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