Electrochemical and Solid State Letters最新文献

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Fabrication of Delamination Free, Low Stress Diamond Like Carbon (DLC) Films Using Pulsed Laser Deposition (PLD) 脉冲激光沉积(PLD)制备无分层、低应力类金刚石(DLC)薄膜
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.010201ESL
A. Arjunan, K. Balasundaram, Purushottam Kumar, Jaeseok Lee, Sang Yoon, S. Kim, Sushant Gupta, R. Singh
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引用次数: 7
Non-Aqueous Redox Flow Batteries with Nickel and Iron Tris(2,2′-bipyridine) Complex Electrolyte 镍铁三(2,2′-联吡啶)络合电解质非水氧化还原液流电池
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.033206ESL
J. Mun, Myung-Jin Lee, Joung-Won Park, Dukjin Oh, Doo-yeon Lee, S. Doo
{"title":"Non-Aqueous Redox Flow Batteries with Nickel and Iron Tris(2,2′-bipyridine) Complex Electrolyte","authors":"J. Mun, Myung-Jin Lee, Joung-Won Park, Dukjin Oh, Doo-yeon Lee, S. Doo","doi":"10.1149/2.033206ESL","DOIUrl":"https://doi.org/10.1149/2.033206ESL","url":null,"abstract":"An organic redox flow battery adopting tris(2,2'-bipyridine)nickel(II)tetrafluoroborate (Ni(Bpy)3(BF4)2) and tris(2,2'-bipyridine)iron(II)tetrafluoroborate (Fe(BPy)3(BF4)2)) in propylenecarbonate electrolyte is investigated. With cyclic voltammetry, the redox current of one-electron related Fe(II)/Fe(III) and two-electron related Ni(II)/Ni(0) appears at 0.65 V and −1.66 V (vs. Ag/Ag+), respectively and their cycleabilities are highly stable during 100 cycles. Their charge-discharge characteristics on the carbon-felt electrodes are evaluated with 0.4 M Fe(Bpy)3(BF4)2 and 0.2 M Ni(Bpy)3(BF4)2 which are adopted as catholyte and anolyte. Comparing with the aqueous system, the higher cell voltage of 2.2 V was achieved and initial coulombic and energy efficiencies were reached with 90.4 and 81.8%.","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"21 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81695465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 112
Solution Processed p-Doped Hole Transport Layer for Polymer Light-Emitting Diodes 聚合物发光二极管溶液处理p掺杂空穴传输层
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.004203ESL
K. Yook, Jun Yeob Lee
{"title":"Solution Processed p-Doped Hole Transport Layer for Polymer Light-Emitting Diodes","authors":"K. Yook, Jun Yeob Lee","doi":"10.1149/2.004203ESL","DOIUrl":"https://doi.org/10.1149/2.004203ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"41 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83290550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
NaCrO2 is a Fundamentally Safe Positive Electrode Material for Sodium-Ion Batteries with Liquid Electrolytes NaCrO2是一种完全安全的钠离子电池正极材料
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.002201ESL
X. Xia, J. Dahn
{"title":"NaCrO2 is a Fundamentally Safe Positive Electrode Material for Sodium-Ion Batteries with Liquid Electrolytes","authors":"X. Xia, J. Dahn","doi":"10.1149/2.002201ESL","DOIUrl":"https://doi.org/10.1149/2.002201ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"15 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81598831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 168
A Study on Tetraphenylporphyrin as a Corrosion Inhibitor for Pure Magnesium 四苯基卟啉作为纯镁缓蚀剂的研究
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.021206ESL
Junying Hu, Daobing Huang, Guoan Zhang, G. Song, Xingpeng Guo
{"title":"A Study on Tetraphenylporphyrin as a Corrosion Inhibitor for Pure Magnesium","authors":"Junying Hu, Daobing Huang, Guoan Zhang, G. Song, Xingpeng Guo","doi":"10.1149/2.021206ESL","DOIUrl":"https://doi.org/10.1149/2.021206ESL","url":null,"abstract":"Summary Thesynthesizedenvironment-friendlytetraphenylporphyrin(TPP)proved to be an efficient inhibitor for pure Mg. TPP may chelate withMgandformaTPP-Mgcompound,precipitatingonMgsurface.ThismeansthatTPPanditsderivativemayactaseffectiveinhibitorsforMgalloys; chelating reaction could be a mechanism responsible for Mgcorrosion inhibition. Following this, more highly efficient inhibitorsmay be identified for Mg alloys. Acknowledgments The authors thank the support of the Center of Forecasting andAnalysis,HuazhongUniversityofScienceandTechnology,inmolec-ular simulation. References 1. E. Ghali, “Magneisum and Magnesium alloys,” Uhlig’s Corrosion Handbook : 793(2000).2. G. Song and D. StJohn, Mater. Corros. , 56 ,15 (2005).3. G.-L. Song and Z. Xu, Electrochim. Acta. , 55 , 4148 (2010).4. L.J.Li,Z.M.Yao,J.L.Lei,H.Xu,S.T.Zhang,andF.S.Pan, Acta.Physico-Chimica.Sinica. , 25 , 1332 (2009).5. J. L. Lei, L. J. Li, H. S. Yu, M. L. Chen, S. T. Zhang, and F. S. Pan, Chem Res &Appl , 20 , 461 (2008).6. E. Slavcheva and G. Schmitt,","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"7 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90778716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Early Failure Induced by Phase Transformation in Microjoints for Chip-Level Integration 芯片级集成微接头相变诱发的早期失效
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.023203ESL
Ren-Shin Cheng, H. Chang, Tao-Chih Chang, J. Chou
{"title":"Early Failure Induced by Phase Transformation in Microjoints for Chip-Level Integration","authors":"Ren-Shin Cheng, H. Chang, Tao-Chih Chang, J. Chou","doi":"10.1149/2.023203ESL","DOIUrl":"https://doi.org/10.1149/2.023203ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"2 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89245818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
High-Speed Endurance and Switching Measurements for Memristive Switches 忆阻开关的高速耐用性和开关测量
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.002206ESL
P. Shrestha, Adaku Ochia, K. Cheung, J. Campbell, H. Baumgart, G. Harris
{"title":"High-Speed Endurance and Switching Measurements for Memristive Switches","authors":"P. Shrestha, Adaku Ochia, K. Cheung, J. Campbell, H. Baumgart, G. Harris","doi":"10.1149/2.002206ESL","DOIUrl":"https://doi.org/10.1149/2.002206ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"11 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86851399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
The Effect of Silicon Oxide Based RRAM with Tin Doping 锡掺杂对氧化硅基RRAM性能的影响
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.013203ESL
Kuan‐Chang Chang, T. Tsai, T. Chang, Yong-En Syu, Siang-Lan Chuang, Chenghua Li, D. Gan, S. Sze
{"title":"The Effect of Silicon Oxide Based RRAM with Tin Doping","authors":"Kuan‐Chang Chang, T. Tsai, T. Chang, Yong-En Syu, Siang-Lan Chuang, Chenghua Li, D. Gan, S. Sze","doi":"10.1149/2.013203ESL","DOIUrl":"https://doi.org/10.1149/2.013203ESL","url":null,"abstract":"2011, Volume 15, Issue 3, Pages H65-H68. Electrochem. Solid-State Lett. Chuang, Cheng-Hua Li, Der-Shin Gan and Simon M. Sze Kuan-Chang Chang, Tsung-Ming Tsai, Ting-Chang Chang, Yong-En Syu, Siang-Lan The Effect of Silicon Oxide Based RRAM with Tin Doping service Email alerting click here in the box at the top right corner of the article or Receive free email alerts when new articles cite this article sign up","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"7 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76188343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 49
Pattern-Coverage Effect on Light Extraction Efficiency of GaN LED on Patterned-Sapphire Substrate 图案覆盖对图案蓝宝石衬底GaN LED光提取效率的影响
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.018203ESL
H. Lin, Y. J. Chen, C. C. Chang, X. F. Li, S. Hsu, C. Y. Liu
{"title":"Pattern-Coverage Effect on Light Extraction Efficiency of GaN LED on Patterned-Sapphire Substrate","authors":"H. Lin, Y. J. Chen, C. C. Chang, X. F. Li, S. Hsu, C. Y. Liu","doi":"10.1149/2.018203ESL","DOIUrl":"https://doi.org/10.1149/2.018203ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"80 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86235762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Structural and Ionic Conductivity Studies of Doped Ceria Electrolyte 掺杂铈电解质的结构和离子电导率研究
Electrochemical and Solid State Letters Pub Date : 2012-01-01 DOI: 10.1149/2.019203ESL
S. Ramesh, K. Raju
{"title":"Structural and Ionic Conductivity Studies of Doped Ceria Electrolyte","authors":"S. Ramesh, K. Raju","doi":"10.1149/2.019203ESL","DOIUrl":"https://doi.org/10.1149/2.019203ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"46 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91347912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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