发布求助
文献互助 智能选刊 最新文献

7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era最新文献

筛选
英文 中文
A logic sharing synthesis tool for mutually exclusive applications 用于互斥应用程序的逻辑共享综合工具
7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era Pub Date : 2012-05-16 DOI: 10.1109/DTIS.2012.6232984
Alp Kiliç, Z. Marrakchi, M. Tuna, H. Mehrez
{"title":"A logic sharing synthesis tool for mutually exclusive applications","authors":"Alp Kiliç, Z. Marrakchi, M. Tuna, H. Mehrez","doi":"10.1109/DTIS.2012.6232984","DOIUrl":"https://doi.org/10.1109/DTIS.2012.6232984","url":null,"abstract":"Multiple Context ASIC (mASIC) is a circuit grouping a set of designs (applications) which operates at mutually exclusive times. In this paper we propose to take this particularity into account when we run logic synthesis. The idea is to maximize logic resources sharing between designs to reduce the total resulting area. Once used on mASIC for a set of 5 benchmark designs, our synthesizing technique reduces area by 28% compared to the sum of the 5 individual ASIC areas.","PeriodicalId":114829,"journal":{"name":"7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129126561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Feasibility study on in situ CCVD grown CNTs for field-effect power device applications 原位CCVD生长cnt用于场效应功率器件的可行性研究
7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era Pub Date : 2012-05-16 DOI: 10.1109/DTIS.2012.6232952
Martin Keyn, P. Wessely, Frank Wessely, L. Rispal, Johannes Palm, U. Schwalke
{"title":"Feasibility study on in situ CCVD grown CNTs for field-effect power device applications","authors":"Martin Keyn, P. Wessely, Frank Wessely, L. Rispal, Johannes Palm, U. Schwalke","doi":"10.1109/DTIS.2012.6232952","DOIUrl":"https://doi.org/10.1109/DTIS.2012.6232952","url":null,"abstract":"In this paper we investigate the feasibility of carbon nanotubes (CNTs) for power applications. On the basis of a process which fabricates thousands of carbon nanotube field-effect transistors (CNTFETs) by means of catalytic chemical vapor deposition (CCVD) we will show that CNTFETs are capable to provide a sufficiently high current to drive a light-emitting diode (LED).","PeriodicalId":114829,"journal":{"name":"7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128730714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test vector embedding in accumulators with stored carry in O(1) time 在O(1)时间内，测试向量嵌入存储进位累加器
7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era Pub Date : 2012-05-16 DOI: 10.1109/DTIS.2012.6232976
I. Voyiatzis, C. Efstathiou, C. Sgouropoulou
{"title":"Test vector embedding in accumulators with stored carry in O(1) time","authors":"I. Voyiatzis, C. Efstathiou, C. Sgouropoulou","doi":"10.1109/DTIS.2012.6232976","DOIUrl":"https://doi.org/10.1109/DTIS.2012.6232976","url":null,"abstract":"In test set embedding Built-In Self Test (BIST) schemes a precomputed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we present a O(1) solution to the test vector-embedding problem for sequences generated by accumulators.","PeriodicalId":114829,"journal":{"name":"7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125837895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信