{"title":"Research on features for diagnostics of filtered analog circuits based on LS-SVM","authors":"B. Long, Shulin Tian, Q. Miao, M. Pecht","doi":"10.1109/AUTEST.2011.6058746","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058746","url":null,"abstract":"Feature selection techniques have become an apparent need for diagnostic methods such as a least squares support vector machine (LS-SVM). Most researchers use wavelet transform coefficients of the time-domain transient response data obtained from filtered analog circuits as features to train a LS-SVM classifier to diagnose faults. But wavelet coefficient features have certain disadvantages such as no physical meanings. Thus, in this paper, two new feature vectors with clearly defined meanings based on a time-domain response curve and a frequency response curve of a filter are proposed, respectively. In addition, a statistical property feature vector which represents global properties of the time-domain response curve or the frequency response curve is proposed. The results from the simulation data and real data for a biquad filter showed the following: (1) these proposed conventional time-domain and frequency features, which are already familiar to designers of filtered analog circuits, have good diagnostic accuracy—all above 91% for the example circuit; (2) the best accuracies using the proposed statistical property feature vector are 100% for time-domain simulation data, and for both real experiment data ; (3) the diagnostic accuracy using the proposed combined feature vector is more accurate than conventional feature vectors; (4) an LS-SVM can be used to diagnose faults in a real analog circuit that only has a few fault samples.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134076893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Testable and diagnosable commercial off the shelf (COTS) electronics","authors":"L. Ungar","doi":"10.1109/AUTEST.2011.6058731","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058731","url":null,"abstract":"Commercial off the shelf (COTS) are inexpensive electronics modules, partly because the designs are expected to conform to commercial needs and driven by market popularity, rather than military and avionics logistics. Design for testability (DFT) and for diagnosability (DFD) can serve both manufacturing and end user concerns. COTS testability, however, are generally focused only on improving manufacturing test - or the vendors' domain. End users' testability and diagnosability concerns are different. For COTS to serve system level support, designers must plan for maintenance and repair paradigms. We present a set of general and simple to implement guidelines for COTS designers so that system designers can create testable and diagnosable systems using COTS modules. The guidelines will initially serve as selection criteria between competing COTS, but we hope it will eventually become a universal design guideline for all COTS designers.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132648146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Rajeev Ghimire, C. Sankavaram, A. Ghahari, K. Pattipati, Y. Ghoneim, Mark N Howell, M. Salman
{"title":"Integrated model-based and data-driven fault detection and diagnosis approach for an automotive electric power steering system","authors":"Rajeev Ghimire, C. Sankavaram, A. Ghahari, K. Pattipati, Y. Ghoneim, Mark N Howell, M. Salman","doi":"10.1109/AUTEST.2011.6058760","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058760","url":null,"abstract":"Integrity of electric power steering system is vital to vehicle handling and driving performance. Advances in electric power steering (EPS) system have increased complexity in detecting and isolating faults. In this paper, we propose a hybrid model-based and data-driven approach to fault detection and diagnosis (FDD) in an EPS system. We develop a physics-based model of an EPS system, conduct fault injection experiments to derive fault-sensor measurement dependencies, and investigate various FDD schemes to detect and isolate the faults. Finally, we use an SVM regression technique to estimate the severity of faults.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"137 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128681141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A practical use for ATML Capabilities","authors":"C. Gorringe, T. Lopes, D. Pleasant","doi":"10.1109/AUTEST.2011.6058789","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058789","url":null,"abstract":"Automatic Test Markup language (ATML) Capabilities provides one of the pivotal behavioral descriptions available within ATML, but to date there has not been any significant use of these underlining mechanisms. This paper considers what is required to automate the selection of instrumentation through the use of capability descriptions.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125351480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Lansdowne, John R. Maclean, C. Winton, P. McCartney
{"title":"Automation Hooks Architecture for Flexible Test Orchestration - concept development and validation","authors":"C. Lansdowne, John R. Maclean, C. Winton, P. McCartney","doi":"10.1109/AUTEST.2011.6058728","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058728","url":null,"abstract":"The Automation Hooks Architecture Trade Study for Flexible Test Orchestration sought a standardized data-driven alternative to conventional automated test programming interfaces. The study recommended composing the interface using multicast DNS (mDNS/SD) service discovery, Representational State Transfer (Restful) Web Services, and Automatic Test Markup Language (ATML). We describe additional efforts to rapidly mature the Automation Hooks Architecture candidate interface definition by validating it in a broad spectrum of applications. These activities have allowed us to further refine our concepts and provide observations directed toward objectives of economy, scalability, versatility, performance, severability, maintainability, scriptability and others.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114353357","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Rapid development and porting of new waveforms for Synthetic Instrumentation","authors":"C. Parkey","doi":"10.1109/AUTEST.2011.6058764","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058764","url":null,"abstract":"Changing standards and newly defined waveforms make keeping up with test requirements without the purchase of new, expensive measurement systems or software is desirable. The Long Term Evolution (LTE) Advanced, Association of Public-Safety Communications Officials Project 25 (APCO-25 or P25), and TErrestrial Trunked RAadio (TETRA) standards are a few examples of developing standards changing requirements for test equipment. With the move to digital communications, test systems are faced with additional new test requirements and methods of measurement. Instead of implementing independent specific waveform options into the Digital Signal Processing (DSP) algorithms of the synthetic instrument a more generic algorithm design method is implemented and described in this paper. With the development of generic digital modulation and demodulation algorithms, rapid development and porting of new waveforms becomes possible.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127730511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Diagnostic alarm sequence maturation in timed failure propagation graphs","authors":"S. Strasser, J. Sheppard","doi":"10.1109/AUTEST.2011.6058741","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058741","url":null,"abstract":"Diagnostic model development presents a significant engineering challenge to ensure subsequent diagnostic processes using such models will yield accurate results. One approach to developing system-level diagnostic models that has been receiving attention is the Timed Failure Propagation Graph (TFPG), developed at Vanderbilt University. Unfortunately, developing TFPG models is also difficult and error-prone. In this paper, we extend previous work in using historical maintenance and diagnostic information to identify potential errors in the TFPG-based diagnostic models and recommend ways of maturing these models. This is done by extending the maturation process to incorporate historical alarm sequences and to model these sequences using a probabilistic transition matrix (similar to a Markov chain). The resulting sequence model is compared to the causal relationships identified in the original TFPG to discover discrepancies between the two. Potential sequence modeling errors with recommendations are given back to an engineer or analyst. We report on the maturation process and algorithms and also provide preliminary experimental results.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131711704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Achieving optimum test by applying standardization","authors":"R. Shannon, M. Modi, J. Stanco","doi":"10.1109/AUTEST.2011.6058787","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058787","url":null,"abstract":"Over the past two decades, the US Department of Defense (DoD) has seen the introduction of weapon systems that do not meet their diagnostic requirements when initially fielded. Some suffer false alarm rates over eighty percent [1]. During a product's lifecycle, the ability to determine how well it performs is based on the capability to test and the evaluation of those tests. Different tests and evaluations are required throughout the product's lifecycle. These tests must, therefore, have the standards that define parameters, techniques and procedures for measurements that present an accurate and precise communication of information. In order to effectively accomplish this task, the development of quality tests capable of supporting these tasks must be defined and documented for the design, production, and operations-and-support phases of a system's lifecycle. As a product proceeds through its life cycle, the information collected at each phase must be used for the support of subsequent phases.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131222678","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Chenakin, S. Ojha, Shyam Nediyanchath, V. Bykhovsky, Steven McClellan, Hue Ngo
{"title":"Broadband PXI local oscillator modules with low phase noise and fast switching speed","authors":"A. Chenakin, S. Ojha, Shyam Nediyanchath, V. Bykhovsky, Steven McClellan, Hue Ngo","doi":"10.1109/AUTEST.2011.6058754","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058754","url":null,"abstract":"This paper presents two local oscillator modules developed for PXI instrumentation. The modules are based on a novel, patented PLL design that combines fast switching speed, low phase noise, and low spurious characteristics. The modules cover 3–10 and 2–20 GHz frequency ranges respectively. The step size is 0.1 Hz for both modules. The measured phase noise at 10 kHz offset is about −121 dBc/Hz at 10 GHz and −115 dBc/Hz at 20 GHz respectively. The switching time is less than 500 microseconds to be within °50 kHz from the final frequency for any frequency step within the entire operating range. Spurs do not exceed the −70 dBc level. Both developed modules occupy two standard 3-U PXI slots and can be used in a variety of synthetic instruments based on the PXI platform.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114200723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On-line adaptive data-driven fault prognostics of complex systems","authors":"Datong Liu, Shaojun Wang, Yu Peng, Xiyuan Peng","doi":"10.1109/AUTEST.2011.6058755","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058755","url":null,"abstract":"Data-driven prognostics based on sensor or historical test data have become appropriate prediction means in prognostics and health management (PHM) application. However, most traditional data-driven forecasting methods are off-line which would be seriously limited in many PHM systems that need on-line predicting and real-time processing. Furthermore, even in some on-line prediction methods such as Online SVR, there are conflicts and trade-offs between prognostics efficiency and accuracy. Therefore, in different PHM applications, prognostics algorithms should be on-line, flexible and adaptive to balance the prediction efficiency and accuracy. An on-line adaptive data-driven prognostics strategy is proposed with five different improved on-line prediction algorithms based on Online SVR. These five algorithms are improved with kernel combination and sample reduction to realize higher precision and efficiency. These algorithms can achieve more accurate results by data pre-processing, moreover, faster operation speed and different computational complexity can be achieved by improving training process with on-line data reduction. With these different improved Online SVR approaches, varies of demands with different precision and efficiency could be fulfilled by an adaptive prediction strategy. To evaluate the proposed prognostics strategy, we have executed simulation experiments with Tennessee Eastman (TE) process. In addition, the prediction strategies are also tested and evaluated by traffic mobile communication data from China Mobile Communications Corporation Heilongjiang Co., Ltd. Experiments and test results prove its effectiveness and confirm that the algorithms can be effectively applied to the on-line status prediction with excellent performance in both precision and efficiency.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125197398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}