{"title":"V-22 aircraft flight data mining","authors":"Michael Burger, C. Jaworowski, R. Meseroll","doi":"10.1109/AUTEST.2011.6058773","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058773","url":null,"abstract":"The Naval Air Systems Command (NAVAIR) produces and supports highly complex aircraft weapons systems which provide advanced capabilities required to defend U.S. freedoms. Supporting said complex systems such as the MV-22/CV-22 aircraft requires being able to troubleshoot and mitigate complex failure modes in dynamic operational environments. Since an aircraft is comprised of multiple systems designed by specialty sub-vendors and subsequently brought together by an aircraft integrator, diagnostics at the aircraft level are usually “good enough” but not capable of 100% fault isolation to a single component. Today's system components must be highly integrated and are required to communicate via high speed data-bus conduits which require precise synchronization between systems. Failure modes of aircraft are identified via design, analysis and test prior to fielding of the weapon system. However, not all failure modes are typically known at the time of system Initial Operational Capability, but rather are found in the field by maintainers/pilots and then subsequently mitigated with aircraft engineering changes or system replacements. Also, the requirement for increased capabilities can drive the need for new systems to be integrated into an aircraft system that may not have been considered in the initial design and support concept. There is a plethora of maintenance action detail collected by pilots, maintenance officers (MO) and engineers that can and should be used to identify failure mode trends that come to light during the operational phase of an aircraft. New troubleshooting techniques can be developed to address underlying failure modes to increase efficiency of future maintenance actions thus reducing the logistics trail required to support the aircraft. The elements available for analysis are maintenance results input by the MO/pilot, (including free form comments regarding problems and resulting actions), Built-In-Test (BIT) fault codes recorded during a flight, and off-aircraft test equipment (such as Consolidated Automated Support System CASS) historical test results. The Integrated Support Environment (ISE) is collecting the data required to perform analysis of underlying maintenance trends that can be identified using some specialized software data mining tools such as text mining of corrective action and maintainer comments data fields from maintenance results. The findings or knowledge extracted from text mining can be correlated back to fault codes recorded during flight and historical maintenance results to help mitigate issues with broken troubleshooting procedures causing headaches to the our Sailors and Marines in the field. By tagging key phrases from the maintainer's/pilot's remarks, knowledge can be gleaned into how the aircraft fails in vigorous environments. The premise of this research is to first choose an apparent high failure avionics system on the V-22 aircraft that is experiencing a high removal rate from the aircraft b","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"603 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132353185","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The impact of test instrumentation with distributed processing capabilities on test program set (TPS) architecture and development","authors":"M. McGoldrick","doi":"10.1109/AUTEST.2011.6058742","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058742","url":null,"abstract":"Modern digital interconnection methods have placed significant computational demands on computers controlling test systems, and adding dedicated computing resources for high performance digital test instrumentation to the test system can help meet these demands. This paper examines the impact of these additional computing resources on the design of a TPS, and proposes a software framework to assist developers in creating TPSs for multi-computer environments.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123687453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Julie M. Altham, J. Stabler, B. Spofford, Phong Do
{"title":"ATE and TPS management","authors":"Julie M. Altham, J. Stabler, B. Spofford, Phong Do","doi":"10.1109/AUTEST.2011.6058784","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058784","url":null,"abstract":"The purpose of this paper to discuss Automatic Test Equipment (ATE) and Test Program Set (TPS) management strategy efforts to improve support and reduce logistics costs within the Air Force. The emphasis of this paper will be on two subtopics; efforts to reduce proliferation of unique Automatic Test Systems (ATS) and the impact of technology and software advances as they relate to how the Air Force (AF) works to standardize the TPS process. Both subtopics have a focus on standardization and reduction in life cycle costs for the Air Force.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126497849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"TPS development using the Microsoft .NET Framework","authors":"T. Lopes, Y. Eracar","doi":"10.1109/AUTEST.2011.6058778","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058778","url":null,"abstract":"Managed or .NET languages are widely used in system software development but are often overlooked for TPS development. This paper looks at using managed languages and the .NET Framework for TPS development. In addition to describing the extensive library support for math, file I/O and string manipulation built into the framework and the powerful application development and debugging support in Visual Studio, the paper also explores how one would define and combine test specific constructs.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"79 9","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113963509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Why did we add LabVIEW applications to our ATLAS TPSs?","authors":"L. Kirkland","doi":"10.1109/AUTEST.2011.6058723","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058723","url":null,"abstract":"It is important to keep an open mind and be practical with testing software and hardware. Test Program Set (TPS) transportability is a primary consideration for long term customer support goals. Our ATLAS TPSs are robust and user friendly, however, LabVIEW offers several features and state-of-the-art routines and graphical representations that are valuable in many testing techniques or applications. Also, an interoperable open system software test package is an excellent approach to state-of-the-art technology. Vital testing techniques require expansive open systems.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122915979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
B. Pattipati, C. Sankavaram, K. Pattipati, Yilu Zhang, Mark N Howell, M. Salman
{"title":"Multiple model moving horizon estimation approach to prognostics in coupled systems","authors":"B. Pattipati, C. Sankavaram, K. Pattipati, Yilu Zhang, Mark N Howell, M. Salman","doi":"10.1109/MAES.2013.6495647","DOIUrl":"https://doi.org/10.1109/MAES.2013.6495647","url":null,"abstract":"The key objectives of this paper are to analyze and implement a novel moving horizon model predictive estimation scheme based on constrained nonlinear optimization techniques for inferring the survival functions and residual useful life (RUL) of components in coupled systems. The approach employs a data-driven prognostics framework that combines failure time data, static and dynamic (time-series) parametric data, and the Multiple Model Moving Horizon Estimation (MM-MHE) algorithm for predicting the survival functions of components based on their usage profiles. Validation of the approach has been provided based on data from an electronic throttle control (ETC) system. The proposed prognostic approach is modular and has the potential to be applicable to a wide variety of systems, ranging from automobiles to aerospace.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"282 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122952172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mobile power issues with test equipment","authors":"Elizabeth M. DePuy","doi":"10.1109/AUTEST.2011.6058779","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058779","url":null,"abstract":"This paper summarizes issues with using mobile power generators (MEPs) with automatic test equipment. MEPs are used on the flight line and at AF bases worldwide where facility power is unavailable. MEPs generate high power, connect directly to ATE with no current limiting devices in between, and are often left ungrounded. With these MEP issues ATE should be designed to detect power on its chassis.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128725398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"DoD/MOD coalition efforts for ATS","authors":"M. Malesich, Malcolm Brown","doi":"10.1109/AUTEST.2011.6058791","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058791","url":null,"abstract":"The US DoD and UK MOD have recognized that they have similar goals in terms of advancing Automatic Test System (ATS). Over the years, representatives from both departments have discussed these mutual goals, worked cooperatively in trying to achieve them, and shared results and lessons learned. Recently, the DoD and MOD have begun to arrange more formal agreements that will help to facilitate leveraging of each Department's resources, and to more efficiently achieve the mutual goals as they arise. This paper discusses the most recent initiatives being considered. The paper presents the background for the DoD and MOD ATS initiatives, the topics under consideration, the benefits intended by the DoD and MOD, and how the efforts are planned to be executed.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124468774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Creating real-time high performance computing systems based on COTS technology","authors":"C. Kapoor","doi":"10.1109/AUTEST.2011.6058737","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058737","url":null,"abstract":"Various applications such as Synthetic Aperture Radar (SAR), Signal and Communication Inteligence (SIGINT, CMINT) and Real-Time Hardware-in-Loop (RT-HIL) have certain common needs. They all require high-speed in-line data processing with loop rates in the range of 1ms. This paper explores the use of PXI hardware platform and LabVIEW graphical development environment as a COTS based solution for addressing these needs of such Real-Time High Performance Computing (RT-HPC) applications.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117222960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
W. J. Headrick, M. Bodkin, Robert R Fox, T. W. Davis, Kevin Dusch, Dan Wolfe
{"title":"Signal Based Domain Specific Language (SBDSL) a proposal for a next generation test","authors":"W. J. Headrick, M. Bodkin, Robert R Fox, T. W. Davis, Kevin Dusch, Dan Wolfe","doi":"10.1109/AUTEST.2011.6058739","DOIUrl":"https://doi.org/10.1109/AUTEST.2011.6058739","url":null,"abstract":"Signal Based Domain Specific Language (SBDSL) is a domain specific language which combines the use of ATLAS Signal statements with high-level programming language constructs. The goals of this new language are: facilitate the writing of concurrent test programs, provide a language that is easy to extend with new constructs, maintain backwards compatibility with ATLAS Family of languages, enable interoperability between test stations, and enable engineers' fresh out of college to quickly become productive with a test programming language. This paper will cover how the design of the SBDSL language, SBDSL Integrated Development Environment (IDE) and runtime executable will accomplish these goals and present results from the technology demonstration developed.","PeriodicalId":110721,"journal":{"name":"2011 IEEE AUTOTESTCON","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130883877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}