Yu Cao, Xuejue Huang, N. Chang, Shen Lin, O. S. Nakagawa, Weize Xie, D. Sylvester, C. Hu
{"title":"Effective on-chip inductance modeling for multiple signal lines and application on repeater insertion","authors":"Yu Cao, Xuejue Huang, N. Chang, Shen Lin, O. S. Nakagawa, Weize Xie, D. Sylvester, C. Hu","doi":"10.1109/ISQED.2001.915225","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915225","url":null,"abstract":"A new approach to handle the inductance effect on multiple signal lines is presented. The worst case switching pattern is first identified. Then a numerical approach is used to model the effective loop inductance (L/sub eff/) for multiple lines. Based on look-up table for L/sub eff/, an equivalent single line model can be generated to decouple a specific signal line from the others to perform static timing analysis. Compared to the use of full RLC netlist for multiple lines, this approach greatly improves the computation efficiency and maintains accuracy for timing and signal integrity analysis. Applications to repeater insertion in the critical path chains are demonstrated. For a single line, the RLC model minimizes delay with fewer number of repeaters than RC model. However, for multiple lines, we find that same number of repeaters is inserted for optimal delay according to both the RC and RLC multiple line models.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133746631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A method of embedded memory access time measurement","authors":"Nai-Yin Sung, Tsung-Yi Wu","doi":"10.1109/ISQED.2001.915272","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915272","url":null,"abstract":"The memory access time is a vital factor for embedded memory because the access time dominates the embedded memory performance. To characterize the accurate access time in tester for embedded memory is a big issue and an important topic that needs to be researched. The traditional method to measure the embedded memory access time is not accurate enough for the deep submicron environment. Moreover, the traditional method also requires the engineer to repeat it many times by manual trial-and-error in the test machine. This paper presents a new method to measure the embedded memory access time. It uses BIST (Built-in-Self Test) circuitry and modified the March C+ algorithm so that this circuitry can automatically characterize the embedded memory access time in the tester. Moreover, this method can measure the maximum access time for each bit and each address in an embedded memory. This method can guarantee that the access time measured by the tester is the worst condition in the embedded memory.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"16 Suppl 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125747361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An evaluation of single-ended and differential impedance in PCBs","authors":"M. Mechaik","doi":"10.1109/ISQED.2001.915247","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915247","url":null,"abstract":"The electrical performance of pulses propagating in Printed Circuit Boards (PCBs) is determined by the characteristic impedance, differential impedance, and terminating impedance of both single-ended and differential pairs. In this paper, numerical values are evaluated for the characteristic impedance, differential impedance, and common mode impedance of microstrip and strip transmission lines embedded in a PCB stack up. These numerical values are also plotted for different values of frequency, ratios of signal width to signal height above a ground plane, and signal separation to signal height. Even and differential mode impedances are also evaluated and plotted for two common termination circuits used in routing peripheral connect interface bus (PCI), point-to-point low voltage differential signaling (LVDS), or multipoint to multipoint differential signaling bus (LVDSM). It is also shown that appropriate values of RC termination filters can be used effectively to match common mode and differential mode impedances thereby reducing EMC emissions, minimizing reflections, and providing stable differential input voltage swing levels. The plots aid in the design of differential signalling and controlled layer impedance.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121725207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wei Li, Qiang Li, J. Yuan, J. McConkey, Yuan Chen, S. Chetlur, Jonathan Zhou, A. Oates
{"title":"Hot-carrier-induced circuit degradation for 0.18 /spl mu/m CMOS technology","authors":"Wei Li, Qiang Li, J. Yuan, J. McConkey, Yuan Chen, S. Chetlur, Jonathan Zhou, A. Oates","doi":"10.1109/ISQED.2001.915244","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915244","url":null,"abstract":"Because the supply voltage is not proportionally scaled with the device size, the further scaling down of CMOS devices is in turn accompanied with more and more severe hot-carrier reliability problems. Hot-carriers, the high energy carriers due to high electric field in the channel, are injected into the gate oxide or cause trapping states generation between Si and SiO/sub 2/ interface, which is accumulated and causes long run reliability problems in devices and circuits. In this paper, we describe a systematic method to evaluate the circuit degradation due to hot-carrier stressing. First the substrate current and gate leakage current models are improved for more accuracy in predicting the lifetime of the devices and circuits. The hot-carrier stressing characterization is carried out for 0.18 /spl mu/m technology. The circuit performance degradation is then evaluated using the parameters extracted from 0.18 /spl mu/m technology for both digital logic circuits and RF circuits.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128786436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Signal attenuation in transmission lines","authors":"M. Mechaik","doi":"10.1109/ISQED.2001.915226","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915226","url":null,"abstract":"Transmission lines are standard waveguiding structures used for data transmission in multi-point communications. Signal attenuation, signal integrity, and transmission loss associated with transmission lines are modeled and investigated in this paper. Performance of transmitting data in coaxial cables and in strip transmission lines are analyzed using an accurate and efficient method of moments (MoM) solution based on solving Maxwell's equations for the electromagnetic fields associated with waveguiding structures supporting data transmission in finite homogeneous and isotropic media. The analysis in this paper models attenuation losses, conductive losses, and dielectric losses for a coaxial cable and a printed circuit board (PCB). The models show that transmission loss is mainly dominated by conductive losses in metals for frequencies up to 25 GHz and by dielectric losses at much higher frequencies. Results show that high attenuation prevents data transmission at much higher frequencies unless the transmission line is designed using low-loss dielectric materials in the dielectric medium and high conductive material in the metals.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129271769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Scaling-induced reductions in CMOS reliability margins and the escalating need for increased design-in reliability efforts","authors":"J. McPherson","doi":"10.1109/ISQED.2001.915216","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915216","url":null,"abstract":"Scaling, for enhanced performance and cost reduction reasons, has pushed existing CMOS materials much closer to their intrinsic reliability limits. Future robust designs will require a strong team effort whereby the design engineer must clearly understand the process variability and its impact on reliability. This strong team effort, between design and process, will become critically important as the industry is seeking to replace the very materials that has made the industry so successful: Si substrates, SiO/sub 2/ gate-dielectric, Al-based metallization and SiO/sub 2/ interconnect-dielectrics.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126779266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Memory bus encoding for low power: a tutorial","authors":"W. Cheng, Massoud Pedram","doi":"10.1109/ISQED.2001.915227","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915227","url":null,"abstract":"This paper contains a tutorial on bus-encoding techniques that target low power dissipation. Three general classes of codes, i.e., algebraic, permutation-based, and probability-based, are reviewed. A new mathematical framework for unifying the power-aware algebraic coding techniques based on the notion of leader sets is also presented.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114721475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Hajjar, Tom Chen, Isabelle Munn, A. Andrews, M. Bjorkman
{"title":"Stopping criteria comparison: towards high quality behavioral verification","authors":"A. Hajjar, Tom Chen, Isabelle Munn, A. Andrews, M. Bjorkman","doi":"10.1109/ISQED.2001.915202","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915202","url":null,"abstract":"Verification of complex behavioral models has become a critical and time-consuming process. Determine when to switch to different testing strategy phase is the key to improving efficiency. This paper presents an overview of the existing statistical stopping rules that can be used for behavioral model verification. We examined the stopping rules using two VHDL models for five consecutive test phases. The results of the coverage gained and the number of testing patterns applied are then compared for each stopping rule. We conclude that the confidence-based stopping criterion outperforms others in terms of efficiency.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123582250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Trading bitwidth for array size: a unified reconfigurable arithmetic processor design","authors":"R. Lin","doi":"10.1109/ISQED.2001.915251","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915251","url":null,"abstract":"This paper presents a novel unified run-time reconfigurable arithmetic processor design scheme. It provides novel computational trade-offs between array/matrix size and input data item bitwidth, and efficiently performs multiple types of arithmetic operations in pipeline within a single hardware-reusable processor. The proposed computations include inner product evaluation, matrix multiplication, and evaluation of polynomial. More specifically, we show that the minimum hardware platform can be easily reconfigured to complete: [1] the inner products of two input arrays with several combinations of array dimension and precision, including input arrays of 256 4-bit items, 64 8-bit items, 16 16-bit items, 4 32-bit items and I 64-bit item; (2) the product of matrices X/sub nk/ and Y/sub km/ for any integers n, k, m and any item precision b ranging from 4 to 64 bits, including input arrays of X/sub 16/spl times/16/ Y/sub 16/spl times/16/ of 4-bit items, X/sub 8/spl times/8/ and Y/sub 8/spl times/8/ of 8-bit items, X/sub 4/spl times/4/, Y/sub 4/spl times/4/ of 16-bit items, X/sub 2/spl times/2/ and Y/sub 2/spl times/2/ of 32-bit items and the product of two 64-bit numbers; (3) the polynomial evaluations at any given point x, with several combinations of the polynomial degree N and evaluation point number precision p, including polynomial degree and item precision options of N=64, p=13, N=16, p=16, and N=4, p=32.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129412932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Techniques that improved the timing convergence of the Gekko PowerPC microprocessor","authors":"P. Kartschoke, S. Hojat","doi":"10.1109/ISQED.2001.915207","DOIUrl":"https://doi.org/10.1109/ISQED.2001.915207","url":null,"abstract":"Wire capacitance models used in some synthesis tools have been based on number of fanouts. These wire capacitance models can be misleading when compared to real wiring. This discrepancy can cause synthesis tools to optimize incorrectly causing severe problems with chip level timing convergence. Designs may take longer than expected and designers may work on timing paths that are not critical thus increasing the design cycle. In sub-micron designs it is crucial to improve the timing convergence between synthesis and physical design. This paper describes several practical approaches used in timing convergence of the IBM Gekko PowerPC/sup 1/ microprocessor that is used in the Nintendo Gamecube system. The impact of each approach is evaluated on the timing and size of the microprocessor.","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129765676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}