Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.最新文献

Clocks and timing in the NASA deep space network 美国宇航局深空网络中的时钟和计时

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-10-27 DOI: 10.1109/FREQ.2005.1574041

J. Lauf, M. Calhoun, W. Diener, J. Gonzalez, A. Kirk, P. Kuhnle, B. Tucker, C. Kirby, R. Tjoelker

引用次数: 16

CANVAS: clock analysis, visualization, and archiving system - a new software package for the efficient management of clock/oscillator data CANVAS:时钟分析，可视化和存档系统-一个新的软件包，用于时钟/振荡器数据的有效管理

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1574006

K. Senior, R. Beard, J. White

引用次数: 5

Exciting traveling waves in high Q structures using microstrip 利用微带激发高Q值结构中的行波

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1573984

A. Fowler, M. Tobar, C. Locke, F.N. Ivanov, J. Hartnett, J. Anstie, D. Cros

{"title":"Exciting traveling waves in high Q structures using microstrip","authors":"A. Fowler, M. Tobar, C. Locke, F.N. Ivanov, J. Hartnett, J. Anstie, D. Cros","doi":"10.1109/FREQ.2005.1573984","DOIUrl":"https://doi.org/10.1109/FREQ.2005.1573984","url":null,"abstract":"Exciting traveling waves in high-Q resonant structures can simplify low noise oscillator designs (Tobar et al., 1999), (Tobar et al., 2000), (D.P. Tsarapkin, N.A. Shtin, 2002), and also has applications for newly proposed Lorentz invariance tests (Tobar et al., 2005). In this work, we use microstrip probes to excite traveling waves in a sapphire dielectric resonator. Previous work has indicated that matching microstrip probes to a sapphire resonator can be a difficult requirement (D.P. Tsarapkin, N.A. Shtin, 2004). A model has been developed, which takes into account leakage of the microstrip line in the reverse direction to which we excite the traveling wave. From such a model we can define the standing wave ratio (SWR) from the amount of forward and reverse traveling wave in the resonator. Ideally for a perfect traveling wave the SWR = 0, and for a standing wave the SWR = 1. By comparing the model with experiment we find that we can excite a traveling wave with an SWR of 0.35 and an unloaded Q-factor of 150,000 in a WGH12,0,2 mode at 9,997 GHz, in a sapphire of 5 cm diameter and 3 cm height. From the model, we also propose new oscillator designs for low noise applications","PeriodicalId":108334,"journal":{"name":"Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114488799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

GTEM cell method based comparative analysis of performance degradation in integer and fractional frequency synthesizer based direct conversion CDMA transmitters 基于GTEM单元法的整数频率合成器与分数频率合成器直接转换CDMA发射机性能退化比较分析

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1573995

I. Krivokapic, M. Oskowsky

{"title":"GTEM cell method based comparative analysis of performance degradation in integer and fractional frequency synthesizer based direct conversion CDMA transmitters","authors":"I. Krivokapic, M. Oskowsky","doi":"10.1109/FREQ.2005.1573995","DOIUrl":"https://doi.org/10.1109/FREQ.2005.1573995","url":null,"abstract":"Oscillator injection pulling as presented in R. Adler (1973) and K. Kurokawa (1973), is a phenomena that may have significant impact on the performance of modern direct conversion transmitters, that is today almost exclusively applied for the architecture in the cell phone design. Oscillator injection pulling affects crucial CDMA transmitter parameters like waveform quality factor (rho) and in severe cases adjacent channel power ratio (ACPR), due to the in-channel integrated phase noise degradation and increased phase noise at adjacent channel frequency offset. Comparative study presents analysis of rho, ACPR and phase noise parameters degradation obtained in measurements of fractional and integer N synthesizers based direct conversion CDMA transmitters. Relations between phase noise, rho and ACPR parameters are formulated. Advantages of fractional N frequency synthesizer are explained based on measurements result analysis. Assuring repeatable and consistent measurement of oscillator injection pulling in ASIC based transmitters is challenging. In order to assure consistent and repeatable measurements of oscillator pulling, a method based on GTEM as stated in J. Nadolny (1995) and A. Nothofer et al. (2003) cell - variety of transverse electromagnetic mode cell, was developed. Details of the measurement method are presented in this study","PeriodicalId":108334,"journal":{"name":"Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129865311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Sapphire resonators + SiGe transistors based ultra low phase noise microwave oscillators 基于蓝宝石谐振器+ SiGe晶体管的超低相位噪声微波振荡器

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1574047

R. Boudot, S. Gribaldo, V. Giordano, O. Llopis, C. Rocher, N. Bazin, G. Cibiel

引用次数: 10

A review of time jitter and digital systems 时间抖动与数字系统综述

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1573900

V. Reinhardt

{"title":"A review of time jitter and digital systems","authors":"V. Reinhardt","doi":"10.1109/FREQ.2005.1573900","DOIUrl":"https://doi.org/10.1109/FREQ.2005.1573900","url":null,"abstract":"Time jitter is an important parameter for determining the performance of digital systems. This paper reviews how time jitter impacts the performance of digital systems. For the purposes of later discussions, digital systems are broken down into three major categories: synchronous data transfer, asynchronous data transfer, and digital sampling systems. A statistical framework is first developed for treating time jitter. This framework explicitly deals with issues of bandwidth and noise processes with 1/fn spectra. It is shown that various forms of the standard variance of time jitter are convergent in the presence of 1/fn noise, if one explicitly considers the properties of the system phase response function for each of these categories. It is also shown that standard variances are preferred over 2nd difference variances in dealing with digital performance issues such as bit errors, because standard variances can be directly related to the total time error (jitter plus skew). Detailed discussions of how time jitter impacts the enumerated categories of digital systems are then presented. In synchronous data transfer systems, it is shown that time jitter causes hard bit errors, that only the white noise components of clock oscillator and gate noise make appreciable contributions to the time jitter, and that aliasing of this white noise is a major issue. In asynchronous systems, it is shown that time jitter can also cause soft errors or bit error rate degradation and that there is an additional time jitter term due to relative master clock-local clock oscillator jitter, whose value is determined by 1/f n oscillator noise as well as the white noise. Finally, for digital sampling in analog-to-digital and digital-to-analog converters, it is shown that noise power or multiplicative decorrelation noise generated by sampling clock jitter is a major limitation on the bit resolution (effective number of bits) of these devices","PeriodicalId":108334,"journal":{"name":"Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124385974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 29

Impedance control for critically coupled cavities 临界耦合腔的阻抗控制

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1573979

B. Riddle, C. Nelson

引用次数: 7

Discovery of swapping chuck 发现交换卡盘

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1573998

Z. Nagaura, K. Nagaura, K. Imani, Y. Nagaura

引用次数: 0

Studies on Mg/sub x/Zn/sub 1-x/O thin film resonator for mass sensor application 质量传感器用Mg/sub -x/ Zn/sub - 1-x/O薄膜谐振器的研究

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1573916

Y. Chen, G. Saraf, R. Wittstruck, N. Emanetoglu, Y. Lu

{"title":"Studies on Mg/sub x/Zn/sub 1-x/O thin film resonator for mass sensor application","authors":"Y. Chen, G. Saraf, R. Wittstruck, N. Emanetoglu, Y. Lu","doi":"10.1109/FREQ.2005.1573916","DOIUrl":"https://doi.org/10.1109/FREQ.2005.1573916","url":null,"abstract":"Zinc oxide (ZnO) and its ternary alloy magnesium zinc oxide (Mg xZn1-xO) are piezoelectric materials for high quality factor bulk acoustic wave (BAW) resonators operating at GHz frequencies. MgxZn1-xO thin film BAW devices built on Si substrates are particularly attractive for integrating piezoelectric MgxZn1-xO with the main stream semiconductor devices and circuits. In this paper, we report single-mode MgxZn1-xO based thin film resonators (TFRs) built on Si substrates. An acoustic mirror, composed of alternating quarter-wavelength silicon dioxide (SiO2) and tungsten (W) layers, is used to isolate the resonator from the Si substrate. High quality and well c-axis oriented MgxZn1-xO thin films are deposited on Si substrates using RF sputtering technology. X-ray diffraction (XRD) and field emission electron microscopy (FESEM) are used to characterize the MgxZn1-xO layers. The theoretical analysis of the TFR, based on the transmission line model, is presented. The BAW velocity and effective coupling coefficient of Mg xZn1-xO can be tailored by varying the Mg composition in the films. The acoustic velocity increases with increasing Mg composition. The feasibility to use this structure to build ultra-high-sensitive mass BAW TFR sensor is analyzed. A mass sensitivity higher than 103 Hz cm2/ng is demonstrated","PeriodicalId":108334,"journal":{"name":"Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129860301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

A comparotive study of GPS P3 and GPS L3 GPS P3与GPS L3的比较研究

Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. Pub Date : 2005-08-31 DOI: 10.1109/FREQ.2005.1574016

Gun Li, Bian Li, S. Dong

引用次数: 3