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RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)最新文献

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Failure mode of different irradiated power IGBT structures 不同辐照功率IGBT结构的失效模式
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698988
E. Lorfèvre, E. Dachs, C. Detcheverry, C. Sudre, F. Roubaud, J. Palau, J. Gasiot, M. Calvet, R. Ecoffets
{"title":"Failure mode of different irradiated power IGBT structures","authors":"E. Lorfèvre, E. Dachs, C. Detcheverry, C. Sudre, F. Roubaud, J. Palau, J. Gasiot, M. Calvet, R. Ecoffets","doi":"10.1109/RADECS.1997.698988","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698988","url":null,"abstract":"A 2D-simulation investigation determines the heavy ion failure mode of three different IGBT structures. The sensitivities of a N-channel IGBT, with and without n+ buffer and of a P-channel IGBT are compared in simulation.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116889197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Simplified estimation of proton-induced SEU 质子诱导SEU的简化估计
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698998
A. Chumakov, N. V. Kuznetsov
{"title":"Simplified estimation of proton-induced SEU","authors":"A. Chumakov, N. V. Kuznetsov","doi":"10.1109/RADECS.1997.698998","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698998","url":null,"abstract":"An approach for an estimation of a proton SEU cross section vs. proton energy is presented. The value of SEU cross section from proton test and another one from Cf/sup 252/ experiment are needed to determine this dependence or parameters of Bendel model.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116721736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Comparison between fast neutron and gamma irradiation of optical fibres 光纤快中子辐照与伽马辐照的比较
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698960
H. Henschel, O. Kohn, W. Lennartz, S. Metzger, H. U. Schmidt, J. Rosenkranz, B. Glessner, B. Siebert
{"title":"Comparison between fast neutron and gamma irradiation of optical fibres","authors":"H. Henschel, O. Kohn, W. Lennartz, S. Metzger, H. U. Schmidt, J. Rosenkranz, B. Glessner, B. Siebert","doi":"10.1109/RADECS.1997.698960","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698960","url":null,"abstract":"A variety of undoped multimode step-index fibres and Ge-doped single mode and graded index fibres is irradiated by 14 MeV neutrons and /sup 60/Co gamma rays up to the same total dose. Radiation-induced loss and breaking stress are measured. The loss induced during gamma irradiation of Ge-doped fibres is about 2.5 times higher than during neutron irradiation with the same dose rate, up to a fluence of about 3/spl times/10/sup 12/ cm/sup -2/ (14 MeV). This loss ratio decreases to /spl les/2.0 after about 10/sup 13/ cm/sup -2/ (14 MeV). Monte Carlo calculations of the dose enhancement as caused by fast recoil protons out of the H-containing acrylate coating are confirmed experimentally. 14 MeV neutron irradiation up to /spl les/10/sup 13/ cm/sup -2/ seems to decrease fibre breaking stress by 3-4%, whereas /sup 60/Co gamma irradiation up to the same total dose has no effect.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117176977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Upgrade design versions of "RADON-5EM" laser simulator “RADON-5EM”激光模拟器升级设计版本
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698913
A. Nikiforov, O.B. Mavritsky, A. N. Egorov, A. Chumakov
{"title":"Upgrade design versions of \"RADON-5EM\" laser simulator","authors":"A. Nikiforov, O.B. Mavritsky, A. N. Egorov, A. Chumakov","doi":"10.1109/RADECS.1997.698913","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698913","url":null,"abstract":"The original \"RADON-5EM\" upgrade design versions of portable laser simulator for IC dose rate effects investigation are developed. The additional test resources such as optical waveguide homogenizer, second harmonic wavelength converter etc. as well as qualification tests results are presented.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115390428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Spacecraft 3-dimensional charge deposition modelling 航天器三维电荷沉积模型
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698987
L. Varga, E. Horvath
{"title":"Spacecraft 3-dimensional charge deposition modelling","authors":"L. Varga, E. Horvath","doi":"10.1109/RADECS.1997.698987","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698987","url":null,"abstract":"A 3D study of deep charging in a satellite has been carried out. A complex model. Satellite structure has been assembled via software named \"Builder\" developed in-house for this purpose, The generated file formed an input file for the code \"ACCEPT\", a 3D Monte Carlo electron/photon propagation simulator. The code was run on the 500 MHz DEC Alpha RISC platform. Both low and high fluence conditions affecting the internal charging state of the satellite at GEO have been considered. The approach presented allows analysis of realistic charging scenarios.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114280709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Transient radiation effects in CMOS/SOI transistors and circuits CMOS/SOI晶体管和电路中的瞬态辐射效应
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698938
V. Ferlet-Cavrois, E. Dupont-Nivet, J. Vildeuil, O. Musseau, J. Leray
{"title":"Transient radiation effects in CMOS/SOI transistors and circuits","authors":"V. Ferlet-Cavrois, E. Dupont-Nivet, J. Vildeuil, O. Musseau, J. Leray","doi":"10.1109/RADECS.1997.698938","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698938","url":null,"abstract":"The dose rate hardening of a CMOS/SOI technology is evaluated in this paper. The response of elementary transistors is studied with an original method by using a 2D drift-diffusion code. The photocurrent model is introduced in SPICE simulation to predict the sensitivity of complex circuits. A good agreement is observed between simulation and experiment. Simple rules to harden circuits are deduced from simulation.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"39 4S 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126991803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
An approach to unfold the response of a multi-element system using an artificial neural network 一种利用人工神经网络展开多元素系统响应的方法
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698908
E. Cordes, G. Fehrenbacher, R. Schutz, M. Sprunck, K. Hahn, R. Hofmann, J. Biersack, W. Wahl
{"title":"An approach to unfold the response of a multi-element system using an artificial neural network","authors":"E. Cordes, G. Fehrenbacher, R. Schutz, M. Sprunck, K. Hahn, R. Hofmann, J. Biersack, W. Wahl","doi":"10.1109/RADECS.1997.698908","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698908","url":null,"abstract":"An unfolding procedure is proposed which aims at obtaining spectral information of a neutron radiation field by the analysis of the response of a multi-element system consisting of converter type semiconductors. For the unfolding procedure an artificial neural network (feed forward network), trained by the back-propagation method, was used. The response functions of the single elements to neutron radiation were calculated by application of a computational model for an energy range from 10/sup -2/ eV to 10 MeV. The training of the artificial neural network was based on the computation of responses of a six-element system for a set of 300 neutron spectra and the application of the back-propagation method. The validation was performed by the unfolding of 100 computed responses. Two unfolding examples were pointed out for the determination of the neutron spectra. The spectra resulting from the unfolding procedure agree well with the original spectra used for the response computation.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124871581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Extremely high energy cosmic rays and the Auger Observatory 超高能量宇宙射线和俄歇天文台
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698833
M. Boratav
{"title":"Extremely high energy cosmic rays and the Auger Observatory","authors":"M. Boratav","doi":"10.1109/RADECS.1997.698833","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698833","url":null,"abstract":"Over the last 30 years or so, a handful of events observed in ground-based cosmic ray detectors seem to have opened a new window in the field of high-energy astrophysics. These events have energies exceeding 5/spl times/10/sup 19/ eV (the region of the so-called Greisen-Zatsepin-Kuzmin spectral cutoff); they seem to come from no known astrophysical source; their chemical composition is mostly unknown; no conventional accelerating mechanism is considered as being able to explain their production and propagation to Earth. Only a dedicated detector can bring in the high-quality and statistically significant data needed to solve this long-lasting puzzle: this is the aim of the Anger Observatory project around which a world-wide collaboration is being mobilised. A large amount of information and technical documents can be consulted on many Web pages accessible through: http://www-lpnhep.in2p3.fr/auger/.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"160 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115003510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Suitability of COTS IBM 64M DRAM in space COTS IBM 64M DRAM在空间中的适用性
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698899
A. Fox, W. Abare, A. Ross
{"title":"Suitability of COTS IBM 64M DRAM in space","authors":"A. Fox, W. Abare, A. Ross","doi":"10.1109/RADECS.1997.698899","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698899","url":null,"abstract":"This paper provides results of total dose and heavy ion testing of the IBM 0165400 DRAM, and discusses the architectural impacts of using these parts in a solid state digital recorder in a LEO orbit.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132220591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Surface potential determination in irradiated MOS transistors combining current-voltage and charge pumping measurements 结合电流-电压和电荷泵送测量的辐照MOS晶体管表面电位测定
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) Pub Date : 1997-09-15 DOI: 10.1109/RADECS.1997.698835
P. Masson, J. Autran, C. Raynaud, O. Flament, P. Paillet, C. Chabrerie
{"title":"Surface potential determination in irradiated MOS transistors combining current-voltage and charge pumping measurements","authors":"P. Masson, J. Autran, C. Raynaud, O. Flament, P. Paillet, C. Chabrerie","doi":"10.1109/RADECS.1997.698835","DOIUrl":"https://doi.org/10.1109/RADECS.1997.698835","url":null,"abstract":"A method combining charge pumping and current-voltage measurements is presented for determining the surface potential versus gate voltage relationship in irradiated MOS transistors. This technique uses parameter optimization and simple numerical equations. It can be applied even for a high interface state density and for a non-uniform distribution in the silicon bandgap. This makes the method attractive for all studies concerning interface trap characterization or accurate modeling of MOS transistors in subthreshold regime. In this study, this new approach is applied to n-channel transistors irradiated up to 10 Mrad (SiO/sub 2/).","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134120552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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