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Optimal development testing policies for products sold with warranty 为保修销售的产品提供最优的开发测试政策
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90106-5
D.N.P. Murthy, D.G. Nguyen
{"title":"Optimal development testing policies for products sold with warranty","authors":"D.N.P. Murthy,&nbsp;D.G. Nguyen","doi":"10.1016/0143-8174(87)90106-5","DOIUrl":"10.1016/0143-8174(87)90106-5","url":null,"abstract":"<div><p>This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 2","pages":"Pages 113-123"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90106-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90425507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
New probabilistic risk assessment techniques and their application to the Chernobyl reactor accident 新的概率风险评估技术及其在切尔诺贝利反应堆事故中的应用
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90023-0
{"title":"New probabilistic risk assessment techniques and their application to the Chernobyl reactor accident","authors":"","doi":"10.1016/0143-8174(87)90023-0","DOIUrl":"https://doi.org/10.1016/0143-8174(87)90023-0","url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 1","pages":"Pages 74-75"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90023-0","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134684693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient Computation of k-to-l-out-of-n System Reliability k-to-l-out- n系统可靠性的高效计算
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90066-7
{"title":"Efficient Computation of k-to-l-out-of-n System Reliability","authors":"","doi":"10.1016/0143-8174(87)90066-7","DOIUrl":"https://doi.org/10.1016/0143-8174(87)90066-7","url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 4","pages":"Page I"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90066-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136980827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modelling the reliability of sodium sulphur cells 模拟钠硫电池的可靠性
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90011-4
R.O. Ansell, J.I. Ansell
{"title":"Modelling the reliability of sodium sulphur cells","authors":"R.O. Ansell,&nbsp;J.I. Ansell","doi":"10.1016/0143-8174(87)90011-4","DOIUrl":"10.1016/0143-8174(87)90011-4","url":null,"abstract":"<div><p>One of the main influences on the reliability of sodium sulphur cells has been identified to be the cracking of beta alumina ceramic. Several ceramic degradation mechanisms have been proposed; flaw-dependent, subcritical crack growth, stress corrosion cracking and progressive degradation mechanisms. These are reviewed in the paper. Reliability models based on these mechanisms are considered, and methods to distinguish between the models are developed. None of the models seems clearly to account for the empirical results obtained. The authors develop an alternative model. The method developed may be used for other similar processes.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"17 2","pages":"Pages 127-137"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90011-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74079021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
Estimation of constant failure rates of electronic components at reduced voltage stresses 降低电压应力下电子元件恒定故障率的估计
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90047-3
G.N. Sharma
{"title":"Estimation of constant failure rates of electronic components at reduced voltage stresses","authors":"G.N. Sharma","doi":"10.1016/0143-8174(87)90047-3","DOIUrl":"10.1016/0143-8174(87)90047-3","url":null,"abstract":"<div><p>In space-borne systems, the reliability of an electronic component is increased by derating, i.e. operating the component at a temperature or voltage stress below its normal capacity. The improvement in reliability due to derating can be estimated if the failure rate at derated stress is known. This paper shows a method of evaluating the failure rates of some electronic components at various stress ratios when the normal failure rate is known.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"18 1","pages":"Pages 1-8"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90047-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91324525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of operator error analysis in the design of Sizewell ‘B’ 算子误差分析在Sizewell ' B '设计中的应用
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90063-1
D.P.D. Whitworth
{"title":"Application of operator error analysis in the design of Sizewell ‘B’","authors":"D.P.D. Whitworth","doi":"10.1016/0143-8174(87)90063-1","DOIUrl":"10.1016/0143-8174(87)90063-1","url":null,"abstract":"<div><p>A programme of operator error analysis is being carried out for the Sizewell ‘B’ PWR design. This paper describes the methods used, the analysis which has been carried out, preliminary results and design changes which have been incorporated to reduce the risk. At this stage, systematic identification and reduction of risk from operator error has been achieved. Further analysis and quantification of error is required to substantiate that the risk arising from operator error does not dominate the risk due to mechanical plant failures.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 4","pages":"Pages 299-316"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90063-1","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84461441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Some tests for mean residual life criteria based on the total time on test transform 基于试验变换总时间的平均剩余寿命准则的一些试验
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90104-1
A.M. Abouammoh, A. Khalique
{"title":"Some tests for mean residual life criteria based on the total time on test transform","authors":"A.M. Abouammoh,&nbsp;A. Khalique","doi":"10.1016/0143-8174(87)90104-1","DOIUrl":"10.1016/0143-8174(87)90104-1","url":null,"abstract":"<div><p>Let F be a life distribution with survival function <span><math><mtext>F</mtext><mtext> = 1 − </mtext><mtext>F</mtext></math></span> and finite mean <span><math><mtext>μ = ∫</mtext><msub><mi></mi><mn>0</mn></msub><msup><mi></mi><mn>∞</mn></msup><mtext> </mtext><mtext>F</mtext><mtext>(</mtext><mtext>x</mtext><mtext>)d</mtext><mtext>x</mtext></math></span>. The scaled total time on test transform is defined by <span><math><mtext>φ</mtext><msub><mi></mi><mn>F</mn></msub><mtext>(t) = (1/μ) ∫</mtext><msub><mi></mi><mn>0</mn></msub><msup><mi></mi><mn><mtext>F</mtext><msup><mi></mi><mn>−1(t)</mn></msup></mn></msup><mtext> </mtext><mtext>F</mtext><mtext>(x)</mtext><mtext>d</mtext><mtext>x</mtext></math></span>. In this paper, the properties of <span><math><mtext>φ</mtext><msub><mi></mi><mn>F</mn></msub><mtext>(t)</mtext></math></span> for some criteria of the mean residual life are investigated. These criteria include decreasing mean residual life average, decreasing harmonic mean residual life average, new better than used harmonic mean residual and new better than used mean residual life. Some test statistics for testing exponentially against all these mean residual life criteria are proposed. The distributions of the test statistics are investigated for small statistics samples. Powers of some of these tests are estimated by simulation.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 2","pages":"Pages 85-101"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90104-1","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90534601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Fatigue in aircraft structures 飞机结构的疲劳
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90062-X
J.B. Young
{"title":"Fatigue in aircraft structures","authors":"J.B. Young","doi":"10.1016/0143-8174(87)90062-X","DOIUrl":"10.1016/0143-8174(87)90062-X","url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 4","pages":"Pages 295-297"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90062-X","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76194863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 31
Fast availability simulation 快速可用性仿真
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90096-5
D.B. Parkinson
{"title":"Fast availability simulation","authors":"D.B. Parkinson","doi":"10.1016/0143-8174(87)90096-5","DOIUrl":"10.1016/0143-8174(87)90096-5","url":null,"abstract":"<div><p>The Availability of a system, device or component in an operational cycle, defined by normal operation—malfunction (failure) — wait — repair, is considered and defined in the form of a random variable. By the use of the fast convolution techniques originally developed for structural reliability applications, the cumulative distribution function of this random variable is obtained together with its mean (equivalent to the long run Average Availability) and standard deviation. The technique described includes preventive maintenance, may be used with any assumed probability distributions of failure, waiting, repair and preventive maintenance times, and may take account of correlation between these parameters. The results are equivalent to those which may be obtained by conventional numerical simulation of repair cycles, but the procedure described is likely to be faster and more economical of computing time and amenable to use on microcomputers.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"18 3","pages":"Pages 157-176"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90096-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81087400","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Monotone Markov models 单调马尔可夫模型
Reliability Engineering Pub Date : 1987-01-01 Epub Date: 2003-03-05 DOI: 10.1016/0143-8174(87)90084-9
Bo Henry Lindqvist
{"title":"Monotone Markov models","authors":"Bo Henry Lindqvist","doi":"10.1016/0143-8174(87)90084-9","DOIUrl":"10.1016/0143-8174(87)90084-9","url":null,"abstract":"<div><p>Markov models are frequently used in connection with system reliability evaluations. In this paper we study Markov models both for single components and for systems of possibly dependent, components. The purpose of the paper is to indicate how certain monotonicity properties of the model can be utilized in order to derive inequalities for interesting reliability parameters. As another application it will be indicated how monotonicity properties can be used to simplify problems concerning optimal replacement of components or systems. The paper is based on results published in probability and operations research journals during the past few years.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"17 1","pages":"Pages 47-58"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90084-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78895987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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