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Application of a computerized methodology for performing common cause failure analysis: The Mocus-Bacfire beta factor (MOBB) code 应用计算机化方法进行共因故障分析:Mocus-Bacfire beta因子(MOBB)代码
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90043-6
Carolyn D. Heising, Diane M. Luciani
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引用次数: 7
Proportional hazards analysis of field warranty data 现场保修数据的比例危害分析
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90027-8
Thomas L. Landers, William J. Kolarik
{"title":"Proportional hazards analysis of field warranty data","authors":"Thomas L. Landers,&nbsp;William J. Kolarik","doi":"10.1016/0143-8174(87)90027-8","DOIUrl":"10.1016/0143-8174(87)90027-8","url":null,"abstract":"<div><p>This paper describes a proportional hazards reliability analysis and some of the methods of statistical inference, based on asymptotic theory. The authors report application of the Weibull proportional hazards model to the analysis of actual field warranty data for automotive air conditioning compressors. Statistical inference is illustrated through asymptotic normal confidence intervals and the likelihood ratio test statistic. The research employed a commercial data set to test theories relevant to defensive systems reliability analysis, and illustrates technology transfer from defense-research to commercial applications.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"18 2","pages":"Pages 131-139"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90027-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83580549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Cost limit replacement policy under imperfect repair 维修不完善情况下的成本限制更换政策
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90017-5
W.Y. Yun, D.S. Bai
{"title":"Cost limit replacement policy under imperfect repair","authors":"W.Y. Yun,&nbsp;D.S. Bai","doi":"10.1016/0143-8174(87)90017-5","DOIUrl":"10.1016/0143-8174(87)90017-5","url":null,"abstract":"<div><p>A repair cost limit policy is studied for a system whose repair cost can be estimated by inspection. When a system fails, the repair cost is estimated and repair is undertaken if the estimated cost is less than a predetermined limit L; otherwise, the system is replaced. After repair, the system is as good as new with (<span><math><mtext>1−p</mtext></math></span>) or is minimally repaired with p. The s-expected cost rate is used as a criterion for optimization. The existence and uniqueness of optimum L are studied for the case of Weibull time-to-failure distribution and negative exponential repair cost distribution.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 1","pages":"Pages 23-28"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90017-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74250678","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Experiments in software reliability estimation 软件可靠性评估实验
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90026-6
P. Mellor
{"title":"Experiments in software reliability estimation","authors":"P. Mellor","doi":"10.1016/0143-8174(87)90026-6","DOIUrl":"10.1016/0143-8174(87)90026-6","url":null,"abstract":"<div><p>There is an urgent need for manufacturers and users of programmable electronic systems to be able to quantify the risk of system failure due to design faults in software. The reliability of the hardware components of such systems can be assessed using well-tried techniques. By contrast, software reliability is still a ‘grey area’, with no generally accepted methods of assessment.</p><p>This paper describes the results of using the Littlewood Stochastic Reliability Growth Model with maximum likelihood parameter estimation to forecast the behaviour of sets of simulated failure data, generated on the assumptions of the model and using a variety of parameter values. The forecasts are long-term, such as would be made for large software products whose reliability is important from the support cost point of view, but not critical as regards safety. The data is of the ‘grouped’ variety: counts of faults found in successive intervals.</p><p>The predictions are generally of low accuracy. They are particularly bad for extreme parameter values, corresponding to very many, very infrequently manifest faults, and to few frequently manifest faults. The length of the period of observation relative to the average rate of fault manifestation is also crucial.</p><p>Possible reasons for this poor performance and improvements to the estimation methods are discussed.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"18 2","pages":"Pages 117-129"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90026-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72828551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Fundamentals of decision analysis 决策分析基础
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90101-6
{"title":"Fundamentals of decision analysis","authors":"","doi":"10.1016/0143-8174(87)90101-6","DOIUrl":"https://doi.org/10.1016/0143-8174(87)90101-6","url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"18 3","pages":"Page 237"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90101-6","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136405923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The safety and reliability society 安全可靠的社会
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90110-7
{"title":"The safety and reliability society","authors":"","doi":"10.1016/0143-8174(87)90110-7","DOIUrl":"https://doi.org/10.1016/0143-8174(87)90110-7","url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 2","pages":"Pages 162-163"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90110-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136477963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimal development testing policies for products sold with warranty 为保修销售的产品提供最优的开发测试政策
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90106-5
D.N.P. Murthy, D.G. Nguyen
{"title":"Optimal development testing policies for products sold with warranty","authors":"D.N.P. Murthy,&nbsp;D.G. Nguyen","doi":"10.1016/0143-8174(87)90106-5","DOIUrl":"10.1016/0143-8174(87)90106-5","url":null,"abstract":"<div><p>This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 2","pages":"Pages 113-123"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90106-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90425507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Contents of Volume 14, Volume 15 ,volume 16 第14卷，第15卷，第16卷的内容
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90089-8
{"title":"Contents of Volume 14, Volume 15 ,volume 16","authors":"","doi":"10.1016/0143-8174(87)90089-8","DOIUrl":"https://doi.org/10.1016/0143-8174(87)90089-8","url":null,"abstract":"","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"17 1","pages":"Pages i-vi"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90089-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"92080099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Estimation of constant failure rates of electronic components at reduced voltage stresses 降低电压应力下电子元件恒定故障率的估计
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90047-3
G.N. Sharma
{"title":"Estimation of constant failure rates of electronic components at reduced voltage stresses","authors":"G.N. Sharma","doi":"10.1016/0143-8174(87)90047-3","DOIUrl":"10.1016/0143-8174(87)90047-3","url":null,"abstract":"<div><p>In space-borne systems, the reliability of an electronic component is increased by derating, i.e. operating the component at a temperature or voltage stress below its normal capacity. The improvement in reliability due to derating can be estimated if the failure rate at derated stress is known. This paper shows a method of evaluating the failure rates of some electronic components at various stress ratios when the normal failure rate is known.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"18 1","pages":"Pages 1-8"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90047-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91324525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Asymptotic unavailability for an M-out-of-N system without testing 未经测试的m -of- n系统的渐近不可用性
Reliability Engineering Pub Date : 1987-01-01 DOI: 10.1016/0143-8174(87)90042-4
N.J. McCormick
{"title":"Asymptotic unavailability for an M-out-of-N system without testing","authors":"N.J. McCormick","doi":"10.1016/0143-8174(87)90042-4","DOIUrl":"10.1016/0143-8174(87)90042-4","url":null,"abstract":"<div><p>A simple closed form equation is presented for the asymptotic unavailability of a system consisting of N identical units of which M are required for operation. Nonoperating units can fail during standby, and at most R failed units can be under repair at any time. A Markov model is assumed, e.g. the units fail randomly and require a random time interval for repair; there are no periodic inspections or tests. The equation has useful pedagogical applications since there are six independent variables that can be changed.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"17 3","pages":"Pages 189-191"},"PeriodicalIF":0.0,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90042-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81558947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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