{"title":"Optimal development testing policies for products sold with warranty","authors":"D.N.P. Murthy, D.G. Nguyen","doi":"10.1016/0143-8174(87)90106-5","DOIUrl":null,"url":null,"abstract":"<div><p>This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.</p></div>","PeriodicalId":101070,"journal":{"name":"Reliability Engineering","volume":"19 2","pages":"Pages 113-123"},"PeriodicalIF":0.0000,"publicationDate":"1987-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0143-8174(87)90106-5","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0143817487901065","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17
Abstract
This paper deals with product development to improve product quality. It examines two stochastic models incorporating development testing and derives the optimal testing plans to minimize expected costs for products sold with warranty.