模拟钠硫电池的可靠性

R.O. Ansell, J.I. Ansell
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引用次数: 24

摘要

影响硫钠电池可靠性的主要因素之一是氧化铝陶瓷的开裂。提出了几种陶瓷降解机理;缺陷依赖,亚临界裂纹扩展,应力腐蚀裂纹和渐进退化机制。本文对这些问题进行了综述。考虑了基于这些机制的可靠性模型,并提出了区分这些模型的方法。这些模型似乎都不能清楚地解释所获得的实证结果。作者提出了另一种模型。所开发的方法可用于其他类似的工艺。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modelling the reliability of sodium sulphur cells

One of the main influences on the reliability of sodium sulphur cells has been identified to be the cracking of beta alumina ceramic. Several ceramic degradation mechanisms have been proposed; flaw-dependent, subcritical crack growth, stress corrosion cracking and progressive degradation mechanisms. These are reviewed in the paper. Reliability models based on these mechanisms are considered, and methods to distinguish between the models are developed. None of the models seems clearly to account for the empirical results obtained. The authors develop an alternative model. The method developed may be used for other similar processes.

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