Imaging & Microscopy最新文献

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A Better Start in Life 一个更好的开始
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890077
S. Batard, C. Laine
{"title":"A Better Start in Life","authors":"S. Batard, C. Laine","doi":"10.1002/IMIC.200890077","DOIUrl":"https://doi.org/10.1002/IMIC.200890077","url":null,"abstract":"The success of in vitro fertilisation techniques such as intracytoplasmic sperm injection (ICSI) depends critically on selection of the most healthy sperm for injection into the oocyte. Intracytoplasmic morphologically selected sperm injection (IMSI) is a high magnification light microscopy imaging method that is being used increasingly to select sperm for ICSI. IMSI has been shown to increase pregnancy rates and reduce abortion rates compared to routine ICSI-IVF. This technical note describes IMSI using a Nikon inverted microscope equipped with Normarski DIC optics and digital imaging system to achieve magnifications in excess of 6000x.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"75 2 1","pages":"58-59"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75844023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Always in Focus 始终专注
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890066
E. Wehner
{"title":"Always in Focus","authors":"E. Wehner","doi":"10.1002/IMIC.200890066","DOIUrl":"https://doi.org/10.1002/IMIC.200890066","url":null,"abstract":"Particularly, long-term experiments in live-cell imaging are often impaired or only possible to limited extent as a result of drifting in Z accompanied by the loss of the original observation plane. The primary reason for this is the mechanical expansion of the components in the heat-up phase. Definite Focus from Carl Zeiss is able to rapidly compensate for this drifting. This is achieved by continuous monitoring of the distance between the objective and the culture vessel by means of infrared light and a corresponding correction in case of deviations. Definite Focus overcomes the disadvantages of previous approaches to drift reduction and additionally allows novel experiments, which e.g., require rapid temperature change.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"1 1","pages":"32-33"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76926091","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron beam induced damage: An atom-by-atom investigation with TEAM0.5 电子束引起的损伤:用TEAM0.5逐个原子的研究
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1007/978-3-540-85226-1_20
C. Kisielowski, R. Erni, Jannik C. Meyer
{"title":"Electron beam induced damage: An atom-by-atom investigation with TEAM0.5","authors":"C. Kisielowski, R. Erni, Jannik C. Meyer","doi":"10.1007/978-3-540-85226-1_20","DOIUrl":"https://doi.org/10.1007/978-3-540-85226-1_20","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"1 1","pages":"39-40"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77314651","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Aberration corrected STEM and EELS: Atomic scale chemical mapping 像差校正STEM和EELS:原子尺度化学作图
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1007/978-3-540-85156-1_1
A. Bleloch, M. Gass, L. Jiang, B. Mendis, K. Sader, Peng Wang
{"title":"Aberration corrected STEM and EELS: Atomic scale chemical mapping","authors":"A. Bleloch, M. Gass, L. Jiang, B. Mendis, K. Sader, Peng Wang","doi":"10.1007/978-3-540-85156-1_1","DOIUrl":"https://doi.org/10.1007/978-3-540-85156-1_1","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"138 1","pages":"1-2"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90346000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mesiodens: Structure of Supernumerary Teeth in a Scanning Microscope 中齿:扫描显微镜下多生牙齿的结构
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890073
B. Jodłowska-Jędrych, B. Kawka, W. Matysiak
{"title":"Mesiodens: Structure of Supernumerary Teeth in a Scanning Microscope","authors":"B. Jodłowska-Jędrych, B. Kawka, W. Matysiak","doi":"10.1002/IMIC.200890073","DOIUrl":"https://doi.org/10.1002/IMIC.200890073","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"58 1","pages":"48-49"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86519165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
High-end Technology to Explore the Small World 高端科技探索小世界
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890058
M. Friedrich
{"title":"High-end Technology to Explore the Small World","authors":"M. Friedrich","doi":"10.1002/IMIC.200890058","DOIUrl":"https://doi.org/10.1002/IMIC.200890058","url":null,"abstract":"To manage expansion, the European Headquarters of Nikon Instruments was relocated within The Netherlands to a larger building in Amstelveen last January.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"345 1","pages":"19-19"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75793473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Piezo Drives for Microscopy 压电驱动显微镜
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890070
Sandra Ebler
{"title":"Piezo Drives for Microscopy","authors":"Sandra Ebler","doi":"10.1002/IMIC.200890070","DOIUrl":"https://doi.org/10.1002/IMIC.200890070","url":null,"abstract":"It is difficult to imagine microscopy in biotechnology or clinical and pharmaceutical research without automation technology. Many applications in industrial surface inspection also require appropriate solutions for sample handling and sample positioning because of the large amount of data and the desired throughput. Conventional stepper motors achieve the required speeds and have resolutions in the micron range, making them adequate as drives for sample scanning in the XY-direction. Motion along the optical axis, on the other hand, requires much higher resolutions and, at the same time, long settling times must be avoided. Piezo drives are thus able to offer far better fine adjustment for the focus. Moreover, they can be comparatively easily integrated into the application and a retrofit is also unproblematic in most cases.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"28 1","pages":"42-43"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89409534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Correlative 3D Microscopy: CLSM and FIB/SEM Tomography 相关三维显微镜:CLSM和FIB/SEM断层扫描
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890065
Miriam S. Lucas, P. Gasser, M. Günthert, R. Wepf, J. Mercer, A. Helenius, A. Schertel
{"title":"Correlative 3D Microscopy: CLSM and FIB/SEM Tomography","authors":"Miriam S. Lucas, P. Gasser, M. Günthert, R. Wepf, J. Mercer, A. Helenius, A. Schertel","doi":"10.1002/IMIC.200890065","DOIUrl":"https://doi.org/10.1002/IMIC.200890065","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"18 1","pages":"30-31"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73264643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Investigating the Material World 探究物质世界
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890067
Esther Ahrent
{"title":"Investigating the Material World","authors":"Esther Ahrent","doi":"10.1002/IMIC.200890067","DOIUrl":"https://doi.org/10.1002/IMIC.200890067","url":null,"abstract":"Corrosion is a big problem. From metal and concrete to polymers and electronics, different forms of decay lead to structural and functional failures that can sometimes be of fundamental importance. The Swedish Corrosion and Metals Institute – Swerea KIMAB, is focused on developing and improving solutions for materials research. As such, they are studying corrosion in its many forms as well as the various methods used to prevent it.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"42 1","pages":"34-35"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85383872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enhanced Imaging on Mirror Slides 增强镜像玻片成像
Imaging & Microscopy Pub Date : 2008-08-01 DOI: 10.1002/IMIC.200890068
E. Fort, E. Moal, S. Lévêque-Fort
{"title":"Enhanced Imaging on Mirror Slides","authors":"E. Fort, E. Moal, S. Lévêque-Fort","doi":"10.1002/IMIC.200890068","DOIUrl":"https://doi.org/10.1002/IMIC.200890068","url":null,"abstract":"Fluorescence microscopy has become the method of choice in the majority of life-science applications. However, standard fluorophores do not luminesce brightly enough for some applications. We describe development and use of mirror slides to significantly enhance the fluorescence signal using standard air microscope objectives. This technique offers sufficient gain to achieve high-sensitivity imaging, together with a wide field of observation and a large depth of focus.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"11 1","pages":"36-38"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87899219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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