C. Kisielowski, R. Erni, Jannik C. Meyer
{"title":"电子束引起的损伤:用TEAM0.5逐个原子的研究","authors":"C. Kisielowski, R. Erni, Jannik C. Meyer","doi":"10.1007/978-3-540-85226-1_20","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"1 1","pages":"39-40"},"PeriodicalIF":0.0000,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electron beam induced damage: An atom-by-atom investigation with TEAM0.5\",\"authors\":\"C. Kisielowski, R. Erni, Jannik C. Meyer\",\"doi\":\"10.1007/978-3-540-85226-1_20\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":100658,\"journal\":{\"name\":\"Imaging & Microscopy\",\"volume\":\"1 1\",\"pages\":\"39-40\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging & Microscopy\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-540-85226-1_20\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-540-85226-1_20","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0