{"title":"Microscience 2008: Microscopy and Analysis at the Frontiers","authors":"A. Winton","doi":"10.1002/IMIC.200890033","DOIUrl":"https://doi.org/10.1002/IMIC.200890033","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"175 1","pages":"14-15"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85423218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"M‐FISH and QuantiFISH","authors":"A. Sassen, G. Brockhoff","doi":"10.1002/IMIC.200890046","DOIUrl":"https://doi.org/10.1002/IMIC.200890046","url":null,"abstract":"Malignant cell growth is acquired by genetic and / or chromosomal instability e. g. gene amplification or deletion, chromosomal polysomy, aneuploidy or translocations. Hence, molecular and cytogenetic analysis has become an essential as well as indispensable complementing tool in routine diagnostics of histological sections.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"2 1","pages":"46-49"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76322946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Deep 3D Optical Metrology","authors":"Carles Oriach-Font","doi":"10.1002/IMIC.200890043","DOIUrl":"https://doi.org/10.1002/IMIC.200890043","url":null,"abstract":"Confocal technique and white light interferometry have demonstrated to be suitable for characterization of transparent thick films. Layer's thickness and 3D topographies of its upper and lower interfaces can be determined from the two peaks in the confocal axial response or from the two sets of interference fringes developed during a vertical scan. Refraction index mismatch between immersion medium and layer worsens the performance of these techniques when profiling lower surface.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"19 1","pages":"40-42"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74868517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Steel Cleanliness Analysis by SEM/EDS","authors":"S. Scheller, S. Langner","doi":"10.1002/IMIC.200890035","DOIUrl":"https://doi.org/10.1002/IMIC.200890035","url":null,"abstract":"Steel is often doped or contains oxides or sulphides to give it properties required by the manufacturer. Hence the steel needs to be assessed and graded according to these properties. To grade these properties efficiently, many steel cleanliness standards have been developed over time, some have been around for decades, others less than a year. The standards seek to classify inclusions in steel and sum the total length per unit area. This gives the steel a cleanliness factor or grade.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"69 1","pages":"18-21"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73997661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"EMS Newsletter 22, May 2008","authors":"U. Aebi, N. Schryvers","doi":"10.1002/IMIC.200890034","DOIUrl":"https://doi.org/10.1002/IMIC.200890034","url":null,"abstract":"Things are moving rapidly now for our colleagues in Aachen being in charge of organizing EMC 2008. With a short extension of the abstract submission deadline, the count of abstracts has gone past 1000, thus exceeding the number of contributions received at EMC 2004 in Antwerp. Now the program committee together with the appointed session chairs has to make sure that all these abstracts are properly assigned and incorporated into an exciting, well-structured program for participants and organizers alike. The Eveni on-line submission system has worked very well (less than 1% of the submissions have caused some minor problems) and will now also be used for the reviewing process by the session chairs. The next deadline is that of the early bird registration set to June 30, until which you can take advantage of reduced registration rates. The deadline for hotel reservation is July 31. Registration and accommodation are handled by a local PCO assisting the local organizing committee - it can be reached via the general congress website www.emc2008.de.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"26 1","pages":"16-16"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91176672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Clinical Electron Microscopy","authors":"J. Schröder","doi":"10.1002/IMIC.200890040","DOIUrl":"https://doi.org/10.1002/IMIC.200890040","url":null,"abstract":"The high resolution and sensitivity of electron microscopy is a valuable ancillary tool or gold standard in pathological diagnosis. The conventional sample turnaround time for processing in the lab can be significantly reduced from days to hours by the microwave technology.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"113 1","pages":"32-35"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76086646","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Altstädt, D. Lovera, H. Schmidt, Stephan Schmidt, A. Fery
{"title":"Electrospun Polymeric Fine Fibres : Characterisation of their Morphology and Properties","authors":"V. Altstädt, D. Lovera, H. Schmidt, Stephan Schmidt, A. Fery","doi":"10.1002/IMIC.200890039","DOIUrl":"https://doi.org/10.1002/IMIC.200890039","url":null,"abstract":"Electrospinning is recognised for being a versatile and prolific method for producing polymeric fibres with diameters ranging from micro- to nanometers. By choosing polymers with particular physical properties, employing complex multiple systems or compounding with non-polymeric particles, the fibre properties can be tailored to ideally suit a particular application.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"5 1","pages":"29-31"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84885621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Fendrich, C. Weiss, M. Lange, T. Kunstmann, R. Möller, Kai Ruschmeyer, A. Schirmeisen, W. Kamiński, R. Pérez
{"title":"Imaging Beyond Topography","authors":"M. Fendrich, C. Weiss, M. Lange, T. Kunstmann, R. Möller, Kai Ruschmeyer, A. Schirmeisen, W. Kamiński, R. Pérez","doi":"10.1002/IMIC.200890038","DOIUrl":"https://doi.org/10.1002/IMIC.200890038","url":null,"abstract":"As a relatively new scanning probe technique, Dynamic Force Microscopy [1] has proved to be a powerful tool, allowing for imaging the topography of a sample surface with true atomic resolution. Besides topographic imaging, the simultaneously recorded damping signal is related to non-conservative interaction between tip and sample. For a molecular system, we show the tip-induced switching of the functionalized groups of the organic molecule leading to an enhanced damping signal.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"200 1","pages":"25-28"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76960184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Confocal and Atomic Force Microscopy","authors":"M. Balzar, K. Poole","doi":"10.1002/IMIC.200890049","DOIUrl":"https://doi.org/10.1002/IMIC.200890049","url":null,"abstract":"A wide range of different forms of microscopy may be applied to the visualisation of biological specimens. Confocal microscopy can provide 3D information about fluorescently labelled cells with the added advantage that it excludes out of focus light. Atomic force microscopy (AFM) provides direct high resolution images of surface features of a sample. Here we look at the microscope configuration necessary for simultaneous confocal and AFM, and examine how the combination of the two techniques together with the ‘Direct Overlay’ function can be used to great advantage in cell research for correlating surface and internal features.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"44 1","pages":"56-57"},"PeriodicalIF":0.0,"publicationDate":"2008-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73151711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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