M. Kociak, M. Kobylko, S. Mazzucco, R. Bernard, A. Kasumov, C. Colliex
{"title":"TEM Nanolaboratory: Physical Measurements on Individual Nanostructures","authors":"M. Kociak, M. Kobylko, S. Mazzucco, R. Bernard, A. Kasumov, C. Colliex","doi":"10.1002/IMIC.200890063","DOIUrl":"https://doi.org/10.1002/IMIC.200890063","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"35 1","pages":"26-27"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78246739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Second Colloquium on New Developments in EDS Analysis on the SEM","authors":"S. Langner","doi":"10.1002/IMIC.200890057","DOIUrl":"https://doi.org/10.1002/IMIC.200890057","url":null,"abstract":"On 3–4 June Bruker AXS Microanalysis hosted its second Colloquium on “New Developments in EDS Analysis on the SEM” in Berlin, organised by Bruker in cooperation with the Federal Institute for Material Research and Testing (BAM) and the National Metrology Institute (PTB). Similar to last year's event, there were to main thematic focuses. While the main issue on the first day was the presentation of new developments in EDS analysis and detector technologies, the second day was dedicated to the combination of different analytical methods and to practical applications of the Bruker Quantax EDS system. More than 120 EDS users participated in the event.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"108 1","pages":"18-18"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74659275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Imaging and Force Spectroscopy on DNA","authors":"G. D. Santo, S. Tobenas, J. Adamcik, G. Dietler","doi":"10.1002/IMIC.200890071","DOIUrl":"https://doi.org/10.1002/IMIC.200890071","url":null,"abstract":"Imaging of single DNA molecules has reached the best spatial resolution by means of dynamic force mode. Amplitude and Frequency Modulation modes at room and low temperature in UHV indicate semi-contact or non-contact as the best modes to achieve high resolution on such small biological molecules. A step forward to more quantitative results is single point force spectroscopy. The force and potential evaluation from the experimental curves evidences the contrast between substrate and DNA and suggests the Non Contact AFM as a possible tool for molecular recognition.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"99 1","pages":"44-47"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73254747","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"East Meets West in Osaka","authors":"Fred Brakenhoff","doi":"10.1002/IMIC.200890055","DOIUrl":"https://doi.org/10.1002/IMIC.200890055","url":null,"abstract":"","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"96 1","pages":"12-13"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82956440","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Next Steps in Stem Cell Research","authors":"S. Minger","doi":"10.1002/IMIC.200890069","DOIUrl":"https://doi.org/10.1002/IMIC.200890069","url":null,"abstract":"Ever since the first human embryonic stem cell line was established, hopes have been raised that treatment for a wide range of cellular degenerative disease and injuries is imminent. While significant progress has been made in stem cell research in recent years, several hurdles remain to be overcome before stem cells can be used routinely in the clinic. In particular, the understanding of the mechanisms that control cell integration, differentiation and proliferation in recipient tissues is far from complete. Identifying the factors that affect these mechanisms will be of enormous value in improving the therapeutic potential of stem cells. New stem cell models of disease together with highly controlled cell culture conditions and microscopic monitoring will be important tools in the study of these processes in vitro.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"80 1","pages":"39-41"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89900513","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Virtual Prototyping Software","authors":"M. Gauvin, A. Stangassinger","doi":"10.1002/IMIC.200890075","DOIUrl":"https://doi.org/10.1002/IMIC.200890075","url":null,"abstract":"Photonic devices play an indispensable role in today's bio-medical industry. For the last quarter century, timely design and delivery to market of these new technologies has been possible only with the aid of sophisticated software tools and experienced optical engineers. Modern optical engineering tools such as FRED help accelerate the pace of innovation in the biomedical community by enabling its members to participate more fully in the process.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"15 1","pages":"52-54"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74255298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electron Beam Induced Damage","authors":"C. Kisielowski, R. Erni, Jannik C. Meyer","doi":"10.1002/IMIC.200890062","DOIUrl":"https://doi.org/10.1002/IMIC.200890062","url":null,"abstract":"A next generation electron microscopes is currently being developed by the Department of Energy as a collaborative effort to redesign the instruments around aberration corrected optics [1]. Within this project, the TEAM 0.5 prototype microscope is currently being commissioned. The instrument is equipped with a high brightness gun and a monochromator [2]. However, already in the past concerns were raised [3] and debated [4] that the high current density in field emission microscopes may alter the atomic structure of materials too fast to record undamaged images of compound semiconductors. Concerns about electron beam induced knock-on damage are indeed very relevant because the TEAM project aims at reconstructing the three dimensional structure of materials at atomic resolution, which requires maintaining structural integrity. On the other hand detailed knowledge about knock-on and ionisation damage in such microscopes is absent and the TEAM0.5 microscope is ideally suited for such investigations since its unprecedented performance allows for the detection of single atoms of most elements of the periodic system [2].","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"1 1","pages":"24-25"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82770749","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Bleloch, M. Gass, Linshu Jiang, Peng Wang, B. Mendis, K. Sader
{"title":"Aberration Corrected STEM and EELS","authors":"A. Bleloch, M. Gass, Linshu Jiang, Peng Wang, B. Mendis, K. Sader","doi":"10.1002/IMIC.200890064","DOIUrl":"https://doi.org/10.1002/IMIC.200890064","url":null,"abstract":"The ultimate aim of an analytical technique applied to a solid material could be stated as the identification and mapping of the constituent atoms and their bonding in three dimensions. Hitherto, this was almost always achieved by diffraction methods averaging over many identical structures and, where it can be used, this remains the most powerful approach. However, the need to characterise the atomic positions in non-periodic structures is being driven by our ability and need to engineer and understand complex non-periodic structures at this scale. Engineered structures where this is relevant range from semiconductor interfaces, dopants and defects through atoms segregated to grain boundaries in structural materials to the detailed morphology and atomic distribution in catalyst nanoparticles.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"105 1","pages":"28-29"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88306394","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"EMS Newsletter 23, July 2008","authors":"U. Aebi, N. Schryvers","doi":"10.1002/IMIC.200890061","DOIUrl":"https://doi.org/10.1002/IMIC.200890061","url":null,"abstract":"We guess, no one will blame us if we fully dedicate this EMS newsletter to the forthcoming EMC 2008 meeting. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from the Rheinisch-Westfalische Technische Hochschule (RWTH) Aachen and the Research Centre Julich, the 14th European Microscopy Congress brings together scientists from all over Europe and beyond. Hosted by the Eurogress Centre at Aachen, EMC 2008 will give you the opportunity to present your own work, hear about the newest findings in the materials and life sciences, and learn about the latest developments in hardware and software – with the common denominator being the ever expanding field of microscopy.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"54 1","pages":"23-23"},"PeriodicalIF":0.0,"publicationDate":"2008-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89211315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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