Second Colloquium on New Developments in EDS Analysis on the SEM

Abstract

On 3–4 June Bruker AXS Microanalysis hosted its second Colloquium on “New Developments in EDS Analysis on the SEM” in Berlin, organised by Bruker in cooperation with the Federal Institute for Material Research and Testing (BAM) and the National Metrology Institute (PTB). Similar to last year's event, there were to main thematic focuses. While the main issue on the first day was the presentation of new developments in EDS analysis and detector technologies, the second day was dedicated to the combination of different analytical methods and to practical applications of the Bruker Quantax EDS system. More than 120 EDS users participated in the event.