CPSS Transactions on Power Electronics and Applications最新文献_第9页

A Novel Calculation Method for IGBT Junction Temperature Based on Fourier Transform 基于傅立叶变换的IGBT结温计算新方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00006

Zhiliang Xu;Yichi Zhang;Huimin Wang;Xinglai Ge;Yongkang Liao;Bo Yao

引用次数: 0

An Enhanced Rotating Vector-Based Direct Torque Control for Matrix Converter-Fed PMSM Drives Using Virtual Pulsating Vectors 基于虚拟脉动矢量的矩阵变换器供电永磁同步电机直接转矩控制

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00007

Weitao Deng;Jiayi Tang;Wangbin Cheng

{"title":"An Enhanced Rotating Vector-Based Direct Torque Control for Matrix Converter-Fed PMSM Drives Using Virtual Pulsating Vectors","authors":"Weitao Deng;Jiayi Tang;Wangbin Cheng","doi":"10.24295/CPSSTPEA.2023.00007","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00007","url":null,"abstract":"Matrix converter (MC) rotating vectors (RVs) have the natural advantage for common-mode voltage (CMV) minimization, but it is rather complicated to establish the switching table with RVs in a direct torque control (DTC) strategy for motor drive systems. Moreover, the conventional RV-based MC-DTC has limited practical application, as it suffers from increased torque ripple and current distortion. A novel MC-DTC method using RVs is proposed in this paper, which breaks down the compromise between minimization of CMV and performance of torque and current. Two RVs that rotate in opposite directions are employed to synthesize a virtual vector. These virtual vectors are pulsating in a fixed line and are evenly distributed in the vector plane. Therefore, the switching table with virtual pulsating vectors can be established conveniently. The proposed method can not only eliminate common-mode voltage, but also improve the torque and current steady state performances evidently compared with the existing rotating vector-based method. Experiments are carried out and the advantage of the proposed method is verified.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"65-73"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098715.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67864847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Implementation of an Electro-Thermal Model for Junction Temperature Estimation in a SiC MOSFET Based DC/DC Converter 基于SiC MOSFET的DC/DC转换器结温估算的电热模型的实现

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00005

Debi Prasad Nayak;Sumit Kumar Pramanick

{"title":"Implementation of an Electro-Thermal Model for Junction Temperature Estimation in a SiC MOSFET Based DC/DC Converter","authors":"Debi Prasad Nayak;Sumit Kumar Pramanick","doi":"10.24295/CPSSTPEA.2023.00005","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00005","url":null,"abstract":"The junction temperature \u0000<tex>$T_{mathrm{j}}$</tex>\u0000 is an essential indicator for evaluating the thermal stress and the health of the power semiconductor devices. However, direct measurement of \u0000<tex>$T_{mathrm{j}}$</tex>\u0000 is not practical, and indirect non-invasive methods require substantial effort in building the sensing circuits which measure the \u0000<tex>$T_{mathrm{j}}$</tex>\u0000 from the temperature-sensitive electrical parameters (TSEP) of the power devices. Hence, this paper proposes a simulation-based electro-thermal junction temperature \u0000<tex>$T_{mathrm{j}}$</tex>\u0000 assessment method for the SiC MOSFETs in a half-bridge configuration based on the datasheet parameters. The proposed method estimates the MOSFETs' instantaneous power loss, including the gate driver parameters, impact of circuit parasitics and temperature-dependent reverse-recovery loss for different operating conditions. The power loss is then incorporated into a simple Foster-based thermal model to estimate the \u0000<tex>$T_{mathrm{j}}$</tex>\u0000. The effectiveness of the proposed method has been validated by comparing its results with the conventional and TSEP estimation techniques on a 10 kW three-phase interleaved boost converter (IBC) laboratory prototype.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"42-53"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098713.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67864846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Research on the Influence of Signal Sampling Frequency on Soft Fault Diagnosis Accuracy of DC/DC Converters 信号采样频率对DC/DC变换器软故障诊断精度影响的研究

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00004

Jigui Miao;Yang Liu;Quan Yin;Guoqing Zhang;Yining Yuan

{"title":"Research on the Influence of Signal Sampling Frequency on Soft Fault Diagnosis Accuracy of DC/DC Converters","authors":"Jigui Miao;Yang Liu;Quan Yin;Guoqing Zhang;Yining Yuan","doi":"10.24295/CPSSTPEA.2023.00004","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00004","url":null,"abstract":"As a key component of power system, DC/DC converter needs to operate normally. Related DC/DC converter fault diagnosis technology has been widely proposed, among which the output voltage is often used to indicate the health status of the converter system. This paper mainly studies the influence of various sampling frequencies of output voltage on soft fault diagnosis accuracy of DC/DC converters. A buck converter is used as an example, and its output voltage signal is collected at different frequencies. Based on the obtained output voltage samples, various machine learning models are applied to diagnose converter soft faults. The diagnosis accuracy of these models under different output voltage sampling frequencies is studied. The appropriate sampling frequency of the models is investigated. This research provides a reference for the selection of signal sampling frequency for soft fault diagnosis of DC/DC converters in practical engineering applications, because the implementation cost of high-frequency sampling circuits may be high.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"33-41"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098716.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67866147","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Parameter Shift Prediction of Planar Transformer Based on Bi-LSTM Algorithm 基于Bi-LSTM算法的平面变压器参数偏移预测

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00002

Yuchen Chen;Zhan Shen;Zhike Xu;Long Jin;Wu Chen

{"title":"Parameter Shift Prediction of Planar Transformer Based on Bi-LSTM Algorithm","authors":"Yuchen Chen;Zhan Shen;Zhike Xu;Long Jin;Wu Chen","doi":"10.24295/CPSSTPEA.2023.00002","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00002","url":null,"abstract":"The reliability issues of magnetic elements become more and more prominent with the wide-range application of high-power-density power electronics. Normally, high-frequency planar transformers take up above 30% of the weight and volume of the converter. They suffer various reliability stresses, such as high operating temperature and high-frequency voltages, which can lead to parameter degradations and even failure during operation. To achieve a reliability-oriented design and minimal lifetime maintenance cost of the high-power-density converter, the lifetime prediction of planar magnetics is essential. This paper proposes a method to predict the parameter of planar transformers under thermal reliability stress using a deep learning algorithm. A deep learning neural network is established using the existing parameter shift data in the accelerated aging test. Then, based on the Bi-LSTM model, the future parameter shift of the planar transformer is predicted. Finally, multiple methods are compared to show the advantage of the proposed method. Compared with the conventional curve fitting method, the deep learning algorithm is more suitable for lifetime prediction in terms of filtering data, considering the weight factor, and predicting future change trends.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"13-22"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098727.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67866144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Quantitative Analysis Method Based on Frequency Domain RGA for Coupling Degree of Parallel Converters 基于频域RGA的并联变换器耦合度定量分析方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00010

Zhen Zhao;Baifu Zhang;Zhangzhuoyu Sun;Lei Zhang;Yihe Wang;Yongxin Li

{"title":"Quantitative Analysis Method Based on Frequency Domain RGA for Coupling Degree of Parallel Converters","authors":"Zhen Zhao;Baifu Zhang;Zhangzhuoyu Sun;Lei Zhang;Yihe Wang;Yongxin Li","doi":"10.24295/CPSSTPEA.2023.00010","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00010","url":null,"abstract":"When LCL-type converters operate in parallel to increase system transmission capacity, the coupling will be generated by the difference of parameters, synchronization control and the change of grid impedance, which will reduce the cohesiveness of a single converter. The coupling analysis method based on the relative gain array (RGA) in the frequency domain is proposed in this paper to reveal the coupling mechanism of parallel converters. The transfer function model of the LCL-type converter with an active damping control loop is established. A high-order network matrix under multi-machine operating conditions is constructed based on the analysis of the impedance characteristics of a single converter. Combined with the principle of relative gain, the RGA model of parallel converters is established. And the main risk factors affecting the coupling characteristics of the parallel converter are quantitatively analyzed. Finally, the proposed analysis method is validated by simulation and experimental analysis. The proposed analytical method that can quantitatively analyze the coupling degree and reveal the coupling mechanism of parallel converters, which provides a theoretical basis for the optimization of the software and hardware parameters.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"97-108"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098703.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67868397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Editorial for the Special Issue on Safety and Reliability of Power Electronics Components and Systems 电力电子元件和系统的安全与可靠性特刊编辑

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01

Frede Blaabjerg;Wu Chen;Haoze Luo

{"title":"Editorial for the Special Issue on Safety and Reliability of Power Electronics Components and Systems","authors":"Frede Blaabjerg;Wu Chen;Haoze Luo","doi":"","DOIUrl":"https://doi.org/","url":null,"abstract":"Efficiency and power density have been widely concerned with the development of power electronics, while the safety and reliability issues are attracting more and more attention in a few years due to the increasingly stringent safety requirements, e.g., in electric vehicle, consumer electronics, and aerospace industries. To understand the failure mechanisms and the safe operation area of components/systems in practical applications, comprehensive testing methods considering the operating conditions are becoming essential. Besides accelerated aging tests, multi-physics modeling, physics-of-failure analyses, degradation modeling, electro-thermal simulation, and lifetime assessment contribute to a better understanding of the failure roots in components and systems and the design of a safer system. Moreover, designing condition monitoring and health status estimation tools, fault diagnosis, fault tolerance, and active thermal management techniques help to realize the predictive maintenance of power electronic components and systems. Finally, emerging artificial intelligence (AI) and machine learning (ML) techniques are getting a lot of attention in aging data processing, remaining useful life estimation, etc. Correspondingly, we organized this Special Issue on Safety and Reliability of Power Electronics Components and Systems to collect emerging research achievements within the scope of safety and reliability of power electronics components and systems and circuits.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"1-2"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098702.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67866145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Synthetical Thermal Modeling and Optimization Design for High Power Density Inverter Heat Dissipation 高功率密度逆变器散热的综合热建模与优化设计

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00001

Kemin Dai;Jinwu Gong;Wenqiang Lin;Shangzhi Pan;Xiaoming Zha

{"title":"Synthetical Thermal Modeling and Optimization Design for High Power Density Inverter Heat Dissipation","authors":"Kemin Dai;Jinwu Gong;Wenqiang Lin;Shangzhi Pan;Xiaoming Zha","doi":"10.24295/CPSSTPEA.2023.00001","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00001","url":null,"abstract":"Demanding accuracy and reliability of thermal design for high efficiency and high-power density inverter devices. Integrating heat conduction, convection heat transfer and fluid dynamics theories, a synthetical thermal model based on the characteristic length as the square root of the cross-sectional area and a multi-objective optimization method based on entropy yield minimization theory and electrothermal coupling are proposed for a typical forced air-cooling heatsink system to improve the efficiency of design optimizations in the structure and cost. The fin thickness, fin length, number of fins, and air velocity of the heatsink are used as design variables, and the NSGA-III algorithm applying a prophet population is used to obtain the pareto fronts with minimum thermal resistance, cost and pressure loss as optimization objectives. Enhanced airflow through the heatsink by arranging the columns in a phyllotactic pattern. A temperature rise test by a 100 V/10 kW prototype was designed to prove the accuracy of the model proposed and heatsink optimized. At rated power, the surface temperature of power devices and heatsink has 10°C reduction.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"3-12"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098705.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67866146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

An Online On-State Voltage Measurement Circuit With Series Diode Clamp for SiC MOSFETs SiC MOSFET串联二极管箝位在线电压测量电路

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00003

Yichao Duan;Jianlong Kang;Yafei Shi;Zhen Xin

{"title":"An Online On-State Voltage Measurement Circuit With Series Diode Clamp for SiC MOSFETs","authors":"Yichao Duan;Jianlong Kang;Yafei Shi;Zhen Xin","doi":"10.24295/CPSSTPEA.2023.00003","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00003","url":null,"abstract":"The condition monitoring of SiC MOSFETs is significant for the reliability of the power electronic system. The on-state drain-source voltage(\u0000<tex>$V_{text{DS}-text{on}}$</tex>\u0000) of SiC MOSFETs contains the temperature information and reflects the health state. It is essential information for the junction temperature monitoring, loss calculation, and health state evaluation of SiC MOSFETs. A measurement circuit with a voltage clamp branch is proposed in this paper to solve the problems of large errors, complex structure, and low reliability of traditional \u0000<tex>$V_{text{DS}-text{on}}$</tex>\u0000 measurement circuits. The proposed circuit uses several series diodes as the clamp branch, and the voltage peak of the input circuit is suppressed by setting a reverse parallel fast recovery diode. Simulation and experimental results show that the proposed circuit has high accuracy and reliability. Combined with the offline calibration of the linear relationship between \u0000<tex>$V_{text{DS}-text{on}}$</tex>\u0000 and junction temperature, the proposed circuit can be used for the online monitoring of the junction temperature of SiC MOSFETs. Lastly, the optical fiber temperature sensor is used to verify the measurement results of the proposed circuit for junction temperature monitoring, which shows that the proposed circuit is highly accurate and feasible for junction temperature monitoring.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 1","pages":"23-32"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10098701/10098704.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67866148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Small Signal Modeling and Interaction Analysis of Multi-VSCs System Connected to Weak Grid 弱电网下多VSCs系统的小信号建模及相互作用分析

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-01 DOI: 10.24295/CPSSTPEA.2023.00008

Yunhui Huang;Fuen Chen;Dong Wang;Sidong Zhang;Guorong Zhu;Keliang Zhou

引用次数: 0