CPSS Transactions on Power Electronics and Applications最新文献

Modeling of Magnetic Core Losses from Global to Local Scales Based on Multimodal Neural Networks 基于多模态神经网络的磁芯损耗全局到局部建模

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-15 DOI: 10.24295/CPSSTPEA.2026.00025

Chuanyang Wang;Shutong Sang;Sheng Qu;Dongxing Yang;Yuqi Wei

{"title":"Modeling of Magnetic Core Losses from Global to Local Scales Based on Multimodal Neural Networks","authors":"Chuanyang Wang;Shutong Sang;Sheng Qu;Dongxing Yang;Yuqi Wei","doi":"10.24295/CPSSTPEA.2026.00025","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00025","url":null,"abstract":"This paper presents a comprehensive framework for modeling magnetic core losses, validated through a systematic multi-scale approach. The framework is built on two pillars: a suite of physically-grounded data augmentation and training optimization techniques, and a multimodal neural network that synergizes CNNs and Transformers. Data augmentation techniques—including random period shifts, waveform flipping, noise injection, and parameter perturbations—simulate real-world waveform irregularities, enabling direct applicability to arbitrary-phase and non-periodic inputs. Complementary training strategies ensure stable learning. The core network architecture dynamically fuses scalar parameters and sequential waveforms via attention mechanisms. Extensive validation uses both an in-house experimental platform and the public MagNet database, extending beyond common ferrites to include nanocrystalline and iron powder cores, with data for some materials reaching magnetic saturation. The framework generalizes consistently across these materials, with average prediction errors below 3.4% for most, and handles non-integer periodic waveforms like 3C94 with about 2.44% error. Compared to existing methods, the core contribution lies in the holistic framework integrating expanded experimental data, enhancement techniques tailored to real-world variability, and rigorous multi-material validation, offering a flexible and directly applicable solution for predicting core losses in power electronic devices.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"335-347"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11611626","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

High Power Density High Current Density LLC-DCX Converter for Datacenter Application 用于数据中心应用的高功率密度高电流密度LLC-DCX转换器

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-15 DOI: 10.24295/CPSSTPEA.2026.00024

Yang Cao;Bin Wang;Zhanshan Zhu;Min Xu;David Wei Zhang

引用次数: 0

An Improved Double-2D Electromagnetic Simulation Methodology for Winding Loss Analysis of High-Frequency Magnetic Components 一种用于高频磁性元件绕组损耗分析的改进双二维电磁仿真方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-15 DOI: 10.24295/CPSSTPEA.2026.00021

Kaining Fu;Jiaqing Ye;Jiangtao Tu;Yujie Lan;Wei Chen

{"title":"An Improved Double-2D Electromagnetic Simulation Methodology for Winding Loss Analysis of High-Frequency Magnetic Components","authors":"Kaining Fu;Jiaqing Ye;Jiangtao Tu;Yujie Lan;Wei Chen","doi":"10.24295/CPSSTPEA.2026.00021","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00021","url":null,"abstract":"Precise and efficient winding loss calculation is critical for optimizing high-frequency magnetic components. While three-dimensional (3D) finite element method (FEM) provides accuracy, its computational demands limit practical applications. Conventional two-dimensional (2D) FEM, though computationally efficient, fails to balance calculation accuracy and efficiency. This paper develops a double-2D electromagnetic simulation methodology achieving 3D-equivalent accuracy through magnetic potential equivalence in the air gap location. The proposed double-2D approach can be applied to common core structures such as EE, EC, and others: (1) Synthesis modeling for symmetric structures. (2) Magnetic potential compensation for complex asymmetric structures. A deviation of less than 5% from the measured results is achieved over the frequency range of 10 kHz to 1 MHz, and a 130-fold acceleration was achieved, resolving the accuracy-efficiency trade-off in 3D FEM simulations. The proposed double-2D simulation technique provides practical significance for high-frequency magnetic device design, particularly in GaN-based power delivery.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"372-382"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11611629","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A Universal EV Charging System with Extended Output Voltage Range for Future Electric Mobility 面向未来电动汽车的扩展输出电压范围通用电动汽车充电系统

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-15 DOI: 10.24295/CPSSTPEA.2026.00019

Marrapu Sai Harsha Naidu;Josephine R. Louis

{"title":"A Universal EV Charging System with Extended Output Voltage Range for Future Electric Mobility","authors":"Marrapu Sai Harsha Naidu;Josephine R. Louis","doi":"10.24295/CPSSTPEA.2026.00019","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00019","url":null,"abstract":"The rapid diversification of electric vehicles and energy storage systems has created a need for universal battery chargers capable of supporting wide and evolving voltage standards. Present charging infrastructure is designed for fixed or narrow voltage ranges, leading to limited interoperability and reduced future readiness as battery voltages continue to increase. In this paper, a universal battery charger with a wide output voltage range of 100–900 V is proposed to address these challenges and enable future-proof charging solutions. The architecture integrates a bridge less power factor correction (PFC) converter, a full-bridge active power decoupling (APD) stage, and an LLC resonant converter with a voltage doubler circuit. Compared to conventional PFC topologies, the bridgeless PFC reduces conduction losses and ensures near-unity power factor with sinusoidal input current. To mitigate low-frequency second-harmonic power ripple without bulky electrolytic capacitors, the APD stage employs compact film capacitors, improving reliability, thermal performance, and lifetime. The LLC resonant converter, combined with a relay-controlled voltage doubler, enables flexible high-voltage operation while maintaining high efficiency. A 3.3 kW hardware prototype is implemented and experimentally validated, achieving a peak efficiency of 96.5%, demonstrating the feasibility of the proposed universal charger for next-generation wide-voltage battery charging applications.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"360-371"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11611628","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A Review of Supercapacitor Balancing Circuits 超级电容平衡电路研究进展

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-15 DOI: 10.24295/CPSSTPEA.2026.00026

Yuhong Fan;Bowen Pang;Chao Lin;Minfan Fu;Hengzhao Yang

引用次数: 0

A Wideband Modeling Method for Magnetic Components Considering Strong/Weak Near-Field Coupling Characteristics 考虑强/弱近场耦合特性的磁性元件宽带建模方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-13 DOI: 10.24295/CPSSTPEA.2026.00014

Xuanran Huang;Kaining Fu

{"title":"A Wideband Modeling Method for Magnetic Components Considering Strong/Weak Near-Field Coupling Characteristics","authors":"Xuanran Huang;Kaining Fu","doi":"10.24295/CPSSTPEA.2026.00014","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00014","url":null,"abstract":"Magnetic components in switching power supplies generate severe leakage electromagnetic fields, which not only affect the filtering performance of EMI filters but also may disrupt the normal operation of circuits. This paper first analyzes the mechanism of near-field leakage generated by magnetic components. It investigates the effect of frequency-dependent permeability on the self-parameters of these components and further explores how the self-parameters influence mutual parameters. By integrating both effects on near-field coupling, a wideband near-field coupling model for magnetic components is established, which accounts for the transmission characteristics of both magnetic and electric field coupling. Insertion loss is measured using a network analyzer and converted into Z-parameters to extract the values of equivalent inductance, equivalent capacitance, and equivalent resistance in the self-parameter module and mutual-parameter module. The near-field transmission characteristics of magnetic components under both strong and weak coupling scenarios are tested to verify the accuracy of the proposed wideband near-field coupling model, which exhibits good conformity in the frequency range from 100 kHz to 60 MHz. The results indicate that magnetic field coupling and electric field coupling dominate the near-field transmission characteristics of magnetic components in different frequency bands.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"260-268"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11606632","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Near-Field Coupling Analysis and Modeling of the Input Plug on EMI Performance in Power Delivery Adapter 供电适配器中输入插头对电磁干扰性能的近场耦合分析与建模

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-06-15 DOI: 10.24295/CPSSTPEA.2026.00016

Qingbin Chen;Zirui Qian;Yujie Lan;Qing He;Wei Chen

{"title":"Near-Field Coupling Analysis and Modeling of the Input Plug on EMI Performance in Power Delivery Adapter","authors":"Qingbin Chen;Zirui Qian;Yujie Lan;Qing He;Wei Chen","doi":"10.24295/CPSSTPEA.2026.00016","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00016","url":null,"abstract":"With the continuous enhancement of power density in power delivery (PD) adapters, devices are positioned in close proximity to each other. Consequently, the proximity raises the concern for electromagnetic interference (EMI) due to magnetic near-field coupling effects, making EMI mitigation a priority in PD adapters. This paper addresses potential near-field couplings within a PD adapter and introduces a differential-mode (DM) EMI circuit model that accounts for near-field coupling effects. The magnetic field coupling between high-frequency (HF) power printed circuit board (PCB) loops and the input plug loop is identified as the pivotal factor affecting the differential-mode EMI noise. By electromagnetic field theory, a mathematical model is established for near-field coupling between the power PCB loops and the input plug loop. The model calculations and simulation examine the impact of power PCB loop dimension parameters. Ultimately, this study proposes three primary PCB layout design approaches for both single-sided and double-sided PCBs to mitigate near-field coupling effects. Empirical results validate the accuracy and applicability of the theoretical analysis.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"294-305"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11568113","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Investigation of GaN HEMT Degradation in High Temperature Power Electronics Using Application Level Reliability Test 基于应用级可靠性试验的高温电力电子器件GaN HEMT退化研究

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-13 DOI: 10.24295/CPSSTPEA.2026.00028

Muhammed Ajmal C. N.;Lifang Hu;Moon J. Kim;Bilal Akin

{"title":"Investigation of GaN HEMT Degradation in High Temperature Power Electronics Using Application Level Reliability Test","authors":"Muhammed Ajmal C. N.;Lifang Hu;Moon J. Kim;Bilal Akin","doi":"10.24295/CPSSTPEA.2026.00028","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00028","url":null,"abstract":"Extreme environmental and high-power density applications, such as those in oil and gas industry, rely on power electronic circuits to drive sensors and control systems. These circuits are often subjected to harsh thermal conditions and must demonstrate high reliability to ensure uninterrupted operation. Gallium nitride (GaN) based semiconductor switches offer several advantages over conventional silicon (Si) devices, including a higher breakdown electric field and superior electron mobility, enabling more efficient and compact power electronics. However, as a relatively new technology with immature epitaxial processes, GaN reliability remains a critical concern, particularly in applications where unexpected downtime can lead to substantial economic losses. In high temperature environments, this challenge is further amplified by the frequent need for devices to operate beyond their datasheet-specified limits. In this work we explore the reliability of different GaN power semiconductor technologies in these conditions using realistic test procedure that is very closer to an actual converter operation. Devices were stressed for extended durations of up to 1000 h with their static parameters continuously monitored. The collected data were analyzed to identify failure modes and their underlying root causes, providing insights into the robustness of GaN devices under extreme condition.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"237-247"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11606631","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

An Improved Two-Dimensional Calculation Method for PCB Winding Loss of Planar Transformers 一种改进的平面变压器PCB绕组损耗二维计算方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-13 DOI: 10.24295/CPSSTPEA.2026.00017

Jinjiang Li;Binzhi Xie;Wei Chen;Qingbin Chen

{"title":"An Improved Two-Dimensional Calculation Method for PCB Winding Loss of Planar Transformers","authors":"Jinjiang Li;Binzhi Xie;Wei Chen;Qingbin Chen","doi":"10.24295/CPSSTPEA.2026.00017","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2026.00017","url":null,"abstract":"Accurate winding-loss calculation is critical for the design of printed circuit board (PCB) planar transformers, especially for considering the edge effects of the PCB winding. In conventional winding-loss modeling, the winding is uniformly divided into a limited number of segments due to computational constraints. However, this approach fails to accurately represent the nonuniform current distribution within the winding under high-frequency operating conditions. To address this issue, an improved winding segmentation algorithm is proposed, based on an iterative procedure. Each PCB turn of the winding is modeled as multiple parallel-connected conductors with nonuniform dimensions, and the segmentation size is adaptively determined according to the actual current distribution. An 8-turn planar transformer is used as a sample, and the winding-loss calculation results are validated against those obtained from two-dimensional (2-D) finite element method (FEM). The results indicate that the proposed algorithm reduces the maximum winding-loss calculation error from 2.9% to 0.22% compared with conventional uniform segmentation methods, in which each turn is divided into eight segments for calculation. The experiment results show that the winding AC resistance is lower than 8% up to 1 MHz, which verifies that the proposed method is correct and flexible.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"11 3","pages":"306-317"},"PeriodicalIF":0.0,"publicationDate":"2026-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11606635","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149097869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Research on Wide-Range Core Loss Measurement Model and Method Based on DC Power Method 基于直流功率法的大量程铁芯损耗测量模型与方法研究

CPSS Transactions on Power Electronics and Applications Pub Date : 2026-09-01 Epub Date: 2026-07-13 DOI: 10.24295/CPSSTPEA.2026.00015

Qingbin Chen;Wei Qiu;Jinjiang Li;Qing He;Xixian Guo;Wei Chen

引用次数: 0