{"title":"考虑SST单元二阶谐波电流路由的直流链路可靠性设计","authors":"Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran","doi":"10.24295/CPSSTPEA.2023.00025","DOIUrl":null,"url":null,"abstract":"Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 3","pages":"290-299"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122803.pdf","citationCount":"0","resultStr":"{\"title\":\"Reliability-Oriented Design of DC-Link Considering the Second-Order Harmonic Current Routing in an SST Cell\",\"authors\":\"Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran\",\"doi\":\"10.24295/CPSSTPEA.2023.00025\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.\",\"PeriodicalId\":100339,\"journal\":{\"name\":\"CPSS Transactions on Power Electronics and Applications\",\"volume\":\"8 3\",\"pages\":\"290-299\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122803.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"CPSS Transactions on Power Electronics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10122803/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"CPSS Transactions on Power Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10122803/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability-Oriented Design of DC-Link Considering the Second-Order Harmonic Current Routing in an SST Cell
Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.