考虑SST单元二阶谐波电流路由的直流链路可靠性设计

Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran
{"title":"考虑SST单元二阶谐波电流路由的直流链路可靠性设计","authors":"Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran","doi":"10.24295/CPSSTPEA.2023.00025","DOIUrl":null,"url":null,"abstract":"Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 3","pages":"290-299"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122803.pdf","citationCount":"0","resultStr":"{\"title\":\"Reliability-Oriented Design of DC-Link Considering the Second-Order Harmonic Current Routing in an SST Cell\",\"authors\":\"Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran\",\"doi\":\"10.24295/CPSSTPEA.2023.00025\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.\",\"PeriodicalId\":100339,\"journal\":{\"name\":\"CPSS Transactions on Power Electronics and Applications\",\"volume\":\"8 3\",\"pages\":\"290-299\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122803.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"CPSS Transactions on Power Electronics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10122803/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"CPSS Transactions on Power Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10122803/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

二阶谐波电流(SHC)不可避免地出现在两级AC/DC和DC/DC系统中,例如固态变压器(SST)电池。谐波路由不规范会导致可靠性缺陷,这种缺陷可能出现在直流环节和DC/DC阶段。本文通过对SHC进行布线,提出了一种面向可靠性的设计方法。首先,对两级SST单元中的SHC分布进行了建模,揭示了它们对直流环节电容器和DC/DC级可靠性的影响。直流环节的可靠性和DC/DC级之间的相互作用得到了强调。它表明,小电容可能有利于直流链路的可靠性,但会危及整个系统。执行权衡分析以在SST单元水平上实现更长的平均故障时间(MTTF)。谐波分布揭示了一种控制关键部件之间可靠性平衡的新机制。它还为面向可靠性的设计提供了另一种视角。分布模型和设计框架在15kW SST电池中执行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability-Oriented Design of DC-Link Considering the Second-Order Harmonic Current Routing in an SST Cell
Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
8.80
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信