CPSS Transactions on Power Electronics and Applications最新文献_第8页

Mission Profile-Based Lifetime Estimation and its System-Controlled Improvement Method of IGBT Modules for Electric Vehicle Converters 基于任务谱的电动汽车变流器IGBT模块寿命估计及其系统控制改进方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00023

Yiping Lu;Enyao Xiang;Lin Zhu;Hongyi Gao;Huan Yang;Rongxiang Zhao

{"title":"Mission Profile-Based Lifetime Estimation and its System-Controlled Improvement Method of IGBT Modules for Electric Vehicle Converters","authors":"Yiping Lu;Enyao Xiang;Lin Zhu;Hongyi Gao;Huan Yang;Rongxiang Zhao","doi":"10.24295/CPSSTPEA.2023.00023","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00023","url":null,"abstract":"The estimation of insulated gate bipolar transistor (IGBT) module lifetimes in electric vehicle (EV) converters is heavily influenced by long-term mission profiles (MPs), as their reliability is significantly affected by power fluctuations. This paper presents a lifetime estimation method for IGBT modules based on MPs, using a 115 kW electric drive system as a case study. First, considering the standard road spectrum for EVs, the mathematical model of an automotive motor, and its control strategy, the load conditions for the converters are calculated. Next, employing an electro-thermal coupling model of the power device, the power loss and junction temperature characteristics of the IGBT modules for EV converters under specific load conditions are analyzed. Sub-sequently, the consumed lifetime is determined using a physics-of-failure-based lifetime model and cumulative damage theory. Finally, the paper delves into the reliability-oriented control strategies of EV converters, which fully utilize the transmission ratio of the EV to enhance the IGBT module's lifetime. Test results demonstrate that, by employing the optimal transmission ratio, the lifetime can be extended by more than two times compared to the initial estimation value.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 3","pages":"246-256"},"PeriodicalIF":0.0,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122801.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67865711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Output Curves Based Hierarchical Clustering Screening Method With Static/Dynamic Current Balancing for Paralleled SiC MOSFETs 基于输出曲线的并联SiC MOSFET静态/动态电流平衡分级聚类屏蔽方法

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00024

Fujun Zheng;Hui Meng;Ze Zhou;He Xu;Haoze Luo;Wuhua Li

{"title":"Output Curves Based Hierarchical Clustering Screening Method With Static/Dynamic Current Balancing for Paralleled SiC MOSFETs","authors":"Fujun Zheng;Hui Meng;Ze Zhou;He Xu;Haoze Luo;Wuhua Li","doi":"10.24295/CPSSTPEA.2023.00024","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00024","url":null,"abstract":"Due to manufacturing process immaturity, the parameter dispersion of Silicon Carbide (SiC) MOSFET is severe, which has risks of current imbalances and oscillation in parallel applications. In addition, as the bipolar degradation is gradually solved, SiC MOSFET body diodes are used to replace anti-parallel diodes to conduct at deadtime. Therefore, the screening method needs to consider the current sharing capability in dynamic, static, and reverse processes at the same time. This article analyzes the body effect of SiC MOSFET and the feasibility of taking output curves at multiple gate voltages as screening objects. Then, the concept of multivariate statistical analysis is introduced to quantify the similarity of output curves into distance parameters, and an automatic screening method based on hierarchical clustering is proposed. The validity that the distance parameters at room temperature can be used in a wide temperature range (25–150 °C) is evaluated. Finally, a double pulse test platform with a highly symmetrical circuit is built to test the performance between the proposed method and traditional screening methods. As a result, the error between paralleled devices selected by the proposed method is less than 5% in dynamic and reverse processes and 2% in static processes simultaneously.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 3","pages":"257-268"},"PeriodicalIF":0.0,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122802.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67865713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Partial Discharge Features of Insulation for Power Electronic Transformers Under Time-Temperature Ageing 电力电子变压器绝缘在时间-温度老化条件下的局部放电特性

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00028

Wenqian Zhang;Jun Jiang;Bo Li;Zhan Shen;Guoming Ma;Chaohai Zhang

{"title":"Partial Discharge Features of Insulation for Power Electronic Transformers Under Time-Temperature Ageing","authors":"Wenqian Zhang;Jun Jiang;Bo Li;Zhan Shen;Guoming Ma;Chaohai Zhang","doi":"10.24295/CPSSTPEA.2023.00028","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00028","url":null,"abstract":"Under the combination of temperature and high frequency electrical stress, partial discharge (PD) intensity will increase at the insulation system of power electronic transformer (PET), which leads to premature insulation failure, and finally threatens the reliability of PET. In order to obtain PD features under high frequency square wave voltage combined with high temperature, and different aging time of insulation system in PET. A combined electric-thermal experiment platform is established to simulate the discharge characteristics of typical insulation dielectric films (polyimide, PI) under temperature from 80∼155 °C and ageing time from 0∼50 h respectively. The variation trend of discharge repetition rate, average discharge amplitude and the shape of phase resolved partial discharge (PRPD) spectrum are considered, and then the discharge mechanism is analyzed. The experimental results show that the rise of temperature contribute to the augmentation of discharge repetition rate and the average discharge amplitude, with an increase in amplitude from 0.3 V to 0.6 V, and the phase of the discharge signal widens. As the ageing time goes up, the discharge repetition rate and the average discharge amplitude increase too, but the change is most obvious in the early aging period, leaping from 0.2 V to 0.32 V. It is of practical value to reveal the mechanism of high frequency electro-thermal stress and improve the operation reliability of power electronic transformer.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 4","pages":"363-371"},"PeriodicalIF":0.0,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10122806","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139109685","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Advanced Solid-State Lithium Battery and Its Safety 先进的固态锂电池及其安全性

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00027

Zhaoyang Zhao;Haitao Hu;Zhengyou He;Hongyi Zhu;Pooya Davari;Frede Blaabjerg

引用次数: 0

Arm Energy Investigation and Submodule Capacitor Sizing for the Asymmetric Alternate Arm Converter Topology 不对称交替臂变换器拓扑的臂能量研究和子模块电容器的确定

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00019

Dereje Woldegiorgis;H. Alan Mantooth

{"title":"Arm Energy Investigation and Submodule Capacitor Sizing for the Asymmetric Alternate Arm Converter Topology","authors":"Dereje Woldegiorgis;H. Alan Mantooth","doi":"10.24295/CPSSTPEA.2023.00019","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00019","url":null,"abstract":"This paper presents the arm energy model and submodule capacitance sizing of the asymmetric alternate arm converter (AAAC) topology that has been recently proposed for high voltage DC (HVDC) applications. A step-by-step derivation of the converter arm energy model is presented to arrive at a final arm energy expression that aids to determine the maximum arm energy deviation of the converter that is required to determine the minimum submodule capacitance of the converter. A simplified mathematical expression is also derived to help determine the required submodule capacitance for the converter from the maximum arm energy deviation, the number of submodules per converter arm and the maximum allowed submodule capacitor voltage deviation (ripple factor). The derived arm energy expression is validated using both simulation and experimental results. The calculated, the simulated, and the experimentally measured converter arm energy values have a good match with each other verifying the accuracy of the derived converter arm energy model. In addition, comparison of the energy storage requirements of the AAAC topology with other similar converter topologies such as the conventional (symmetric) alternate arm converter topology and the modular multilevel converter topology is provided to further highlight the significance of the derived converter arm energy and submodule capacitance sizing expressions.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 2","pages":"190-198"},"PeriodicalIF":0.0,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10177876/10122797.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"68030015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Reliability-Oriented Design of DC-Link Considering the Second-Order Harmonic Current Routing in an SST Cell 考虑SST单元二阶谐波电流路由的直流链路可靠性设计

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00025

Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran

{"title":"Reliability-Oriented Design of DC-Link Considering the Second-Order Harmonic Current Routing in an SST Cell","authors":"Jinxiao Wei;Yawei Wang;Sicong Liu;Hao Feng;Li Ran","doi":"10.24295/CPSSTPEA.2023.00025","DOIUrl":"https://doi.org/10.24295/CPSSTPEA.2023.00025","url":null,"abstract":"Second-order harmonic current (SHC) inevitably presents in the two-stage AC/DC and DC/DC system, e.g., solid-state transformer (SST) cell. Unregulated harmonics routing leads to reliability defects, which may appear in DC-link and DC/DC stage. This manuscript presents a reliability-oriented design method via routing the SHC. Firstly, the SHC distribution in the two-stage SST cell is modeled, and their effects on the reliability of DC-link capacitor and DC/DC stage are revealed. Interactions are highlighted between the reliability of DC-link and DC/DC stage. It illustrates that a small capacitance may favor the DC-link reliability, yet jeopardizing the overall system. A tradeoff analysis is performed to achieve longer mean time to failure (MTTF) on an SST cell level. The harmonic distribution unravels a new mechanism that governs the reliability balance between critical components. It also provides an alternative perspective to the reliability-oriented design. The distribution model and design framework are performed in a 15 kW SST cell.","PeriodicalId":100339,"journal":{"name":"CPSS Transactions on Power Electronics and Applications","volume":"8 3","pages":"290-299"},"PeriodicalIF":0.0,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/7873541/10272362/10122803.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67865716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Experimental Validation of Novel Shade Dispersion PV Reconfiguration Technique to Enhance Maximum Power Under PSCs 新型阴影色散光伏重构技术在PSCs下提高最大功率的实验验证

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00014

Vinaya Chandrakant Chavan;Suresh Mikkili;Tomonobu Senjyu

引用次数: 1

A Family of Coupled Inductor Voltage-Multiplying Boost Converters 一类耦合电感电压倍增Boost变换器

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00021

Xupeng Fang;Cunliang Zhu;Kun Liu;Yunxu Zhang

引用次数: 1

A Generic Steady-State Analysis Model for Three-Phase Three-Wire Modular Multilevel Converter 三相三线制模块化多电平变换器的通用稳态分析模型

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00020

Xingxing Chen;Jinjun Liu;Zhifeng Deng;Shuguang Song

引用次数: 0

Wideband Dissipativity Enhancement of Grid-Following Inverters Using Virtual Element Design 利用虚拟元件设计增强电网跟随逆变器的宽带失散性

CPSS Transactions on Power Electronics and Applications Pub Date : 2023-03-10 DOI: 10.24295/CPSSTPEA.2023.00026

Zhiqing Yang;Wei Wu;Helong Li;Lijian Ding;Shan He;Frede Blaabjerg

引用次数: 0