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An electron energy loss spectroscopic study of ethylene chemisorbed on Pd(110) at 110 K 乙烯在110 K下在Pd(110)上化学吸附的电子能量损失谱研究
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-09-26 DOI: 10.1016/0378-5963(85)90069-8
Michael A. Chesters, Gordon S. McDougall , Martyn E. Pemble , Norman Sheppard
{"title":"An electron energy loss spectroscopic study of ethylene chemisorbed on Pd(110) at 110 K","authors":"Michael A. Chesters,&nbsp;Gordon S. McDougall ,&nbsp;Martyn E. Pemble ,&nbsp;Norman Sheppard","doi":"10.1016/0378-5963(85)90069-8","DOIUrl":"10.1016/0378-5963(85)90069-8","url":null,"abstract":"<div><p>Adsorption of ethylene on the (110) surface of palladium at 110 K gives rise to two related but clearly distinguishable types of electron energy loss (EEL) spectra corresponding to low and high coverage. Most features in the spectra in both coverage regimes can be interpreted in terms of a π-complex of ethylene with the metal surface. Analysis of the corresponding ethylene-d<sub>4</sub> EEL spectra and comparison with infrared, Raman and inelastic neutron scattering data for the analogous ethylene complex, Zeise's salt, supports this assignment. The selection rules applicable to dipole and impact scattering both on- and off-specular are employed to determine the orientation of the π-complexes with respect to the surface. At higher coverages additional loss features are observed. These are interpreted in terms of the presence of a small proportion of σ-diadsorbed ethylene complexes bonded to pairs of metal atoms.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 369-383"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90069-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81657240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Electron surface barrier structure from analysis of barrier scattering features in LEED 从LEED中势垒散射特征分析电子表面势垒结构
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-09-26 DOI: 10.1016/0378-5963(85)90035-2
M.N. Read
{"title":"Electron surface barrier structure from analysis of barrier scattering features in LEED","authors":"M.N. Read","doi":"10.1016/0378-5963(85)90035-2","DOIUrl":"10.1016/0378-5963(85)90035-2","url":null,"abstract":"<div><p>High resolution LEED intensity data from Cu(001), showing barrier scattering features within ∼ 3 eV from a beam threshold, have been analyzed with a two parameter “modified image barrier” (MIB) model and a three parameter “saturated image barrier” (SIB) model. It is found that a range of values of <em>z</em><sub>0</sub>, the origin of the image potential tail, in the MIB model can provide a fit of experimental maxima and minima energy locations to within 0.3 eV. With the SIB model, there is a multiplicity of values of <em>z</em><sub>0</sub> (and corresponding value of <em>U</em><sub>s</sub>, the value of the potential with respect to the vacuum level at the jellium discontinuity), which can provide a fit to that data to 0.3 eV. Fits to within 0.05 eV were also obtained with parameters outside the values determined by previous authors. It is concluded that the validity of each model and the determination of <em>z</em><sub>0</sub> can only be found from such experimental data if it is fitted to at least 0.05 eV.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 48-54"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90035-2","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86226194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The growth and structure of RF sputtered indium tin oxide thin films 射频溅射氧化铟锡薄膜的生长与结构
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-02-10 DOI: 10.1016/0378-5963(85)90200-4
K. Sreenivas, Abhai Mansingh
{"title":"The growth and structure of RF sputtered indium tin oxide thin films","authors":"K. Sreenivas,&nbsp;Abhai Mansingh","doi":"10.1016/0378-5963(85)90200-4","DOIUrl":"10.1016/0378-5963(85)90200-4","url":null,"abstract":"<div><p>Indium tin oxide films have been grown by reactively sputtering an indium/tin metallic alloy target in argon-oxygen mixtures. Growth parameters and annealing conditions have been optimized at low temperatures. Reactively sputtered oxide films were highly insulating and did require a post-deposition annealing treatment in a reducing ambient, to become highly transparent and conducting. A new annealing ambient, cracked ammonia, has been found to be very effective and economical. Films have been characterized for their structure and morphology by electron diffraction and scanning electron microscopy respectively. Relative advantages of annealing in cracked ammonia over nitrogen-hydrogen mixtures employed by other workers have been discussed. Films with preferred orientation, high optical transmission (∼ 95%) and low electrical resistivity (3 × 10<sup>−4</sup> ω cm) have been obtained.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 670-680"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90200-4","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87640495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
X-ray photoelectron spectroscopy of oxidized pyrrhotite surfaces 氧化磁黄铁矿表面的x射线光电子能谱
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-09-26 DOI: 10.1016/0378-5963(85)90061-3
A.N. Buckley, R. Woods
{"title":"X-ray photoelectron spectroscopy of oxidized pyrrhotite surfaces","authors":"A.N. Buckley,&nbsp;R. Woods","doi":"10.1016/0378-5963(85)90061-3","DOIUrl":"10.1016/0378-5963(85)90061-3","url":null,"abstract":"<div><p>The oxidation of fracture surfaces of a pyrrhotite mineral of composition Fe<sub>0.89</sub>S at ambient conditions in air has been studied by X-ray photoelectron spectroscopy (XPS). Fe(2p) and Fe(3p) spectra indicated that iron had diffused from the outermost layers of the mineral lattice to form a hydrated iron(III) oxide or hydro-oxide. The corresponding S(2p) spectrum exhibited a shifted component at a binding energy increasing with time of exposure. It is considered that this component arises from the formation of iron-deficient sulfides with the iron content decreasing with increasing oxidation time.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 280-287"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90061-3","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81907855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 82
A composite insulator structure for VLSI multilevel metallization 一种用于VLSI多层金属化的复合绝缘子结构
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-02-10 DOI: 10.1016/0378-5963(85)90233-8
George S. Gati
{"title":"A composite insulator structure for VLSI multilevel metallization","authors":"George S. Gati","doi":"10.1016/0378-5963(85)90233-8","DOIUrl":"10.1016/0378-5963(85)90233-8","url":null,"abstract":"<div><p>Dense and complex circuit layouts in integrated circuits often require multilevel interconnecting wiring. At IBM East Fishkill sputtered SiO<sub>2</sub> is used to provide insulation between the wiring levels. Defects in the insulating layers can result in interlevel shorts (ILS). If a projection from one metal layer is inadequately covered with the insulator it may short to the metal layer above. Since the inadequacy of coverage is a result of the non-conformal coating that results from sputter deposition, a relatively thin layer of conformal PECVD Si<sub><em>x</em></sub>N<sub><em>y</em></sub> deposited upon the top of the SiO<sub>2</sub> will provide adequate insulation over projections. Electrical testing of special test patterns showed significant improvement in ILS using the structure described.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 997-1003"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90233-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89684301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Roughening transitions on the helium crystal-superfluid interface 氦晶体-超流体界面上的粗化转变
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-02-10 DOI: 10.1016/0378-5963(85)90203-X
A.V. Babkin, K.O. Keshishev, D.B. Kopeliovich, A.Ya. Parshin
{"title":"Roughening transitions on the helium crystal-superfluid interface","authors":"A.V. Babkin,&nbsp;K.O. Keshishev,&nbsp;D.B. Kopeliovich,&nbsp;A.Ya. Parshin","doi":"10.1016/0378-5963(85)90203-X","DOIUrl":"10.1016/0378-5963(85)90203-X","url":null,"abstract":"<div><p>We have studied the equilibrium shapes of large <sup>4</sup>He crystals at two different roughening transitions (<em>T</em><sub>R1</sub> = 1.2 K, <em>T</em><sub>R2</sub> = 0.9 K) by a simple optical technique. The method used provides the temperature and angular dependences of the surface stiffness. The measured surface stiffness appears to be constant in the close vicinities of the roughening transitions (|<em>T</em>−<em>T</em><sub>R</sub>| ∼ 0.001−0.05<em>T</em><sub>R</sub>, <em>ϕ</em> ∼ 0.005−0.1), in strong disagreement with two current theories, viz., the phenomenological “mean field theory” and the lattice model calculations.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 696-704"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90203-X","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75725151","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Some strategies for quantitative scanning Auger electron microscopy 定量扫描俄歇电子显微镜的一些策略
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-09-26 DOI: 10.1016/0378-5963(85)90046-7
R. Browning , D.C. Peacock, M. Prutton
{"title":"Some strategies for quantitative scanning Auger electron microscopy","authors":"R. Browning ,&nbsp;D.C. Peacock,&nbsp;M. Prutton","doi":"10.1016/0378-5963(85)90046-7","DOIUrl":"10.1016/0378-5963(85)90046-7","url":null,"abstract":"<div><p>The general applicability of power law forms of the background in electron spectra is pointed out and exploited for background removal from under Auger peaks. This form of <em>B(E)</em> is found to be extremely sensitive to instrumental alignment and to fault-free construction - an observation which can be used to set up analyser configurations in an accurate way. Also, differences between <em>N(E)</em> and <em>B(E)</em> can be used to derive a spectrometer transmission function <em>T(E)</em>. The questions of information density in an energy-analysing spatially-resolving instrument are addressed after reliable instrumental characterization has been established. Strategies involving ratio histograms, showing the population distribution of the ratio of a pair of Auger peak heights, composition scatter diagrams and windowed imaging are discussed and illustrated.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 145-159"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90046-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86184787","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Surface compositions of the two phases of differently prepared Ni-Cr-Al and Ni-Cr-Al-Zr samples 不同制备的Ni-Cr-Al和Ni-Cr-Al- zr样品的两相表面组成
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-09-26 DOI: 10.1016/0378-5963(85)90050-9
M.M. El Gomati, M. Prutton, R.H. Roberts
{"title":"Surface compositions of the two phases of differently prepared Ni-Cr-Al and Ni-Cr-Al-Zr samples","authors":"M.M. El Gomati,&nbsp;M. Prutton,&nbsp;R.H. Roberts","doi":"10.1016/0378-5963(85)90050-9","DOIUrl":"10.1016/0378-5963(85)90050-9","url":null,"abstract":"<div><p>The surface compositions of the α/β and γ/γ' phases of different metallographic preparations of Ni-15Cr-24Al and Ni-15Cr-24Al-0.3Zr (at%) alloys are presented. Surfaces investigated include a mechanically polished surface for both alloys, a mechanically polished acid etched surface of the Ni-Cr-Al-Zr both before heating and after heating to 600°C for several hours, and the underlying surface of this latter sample exposed by ball cratering. Both phases of all surfaces considered show depletion of Al. It is concluded that the Al depletion is not an artefact of the sample metallographic preparation or the analytical procedure. This is supported by analysis of the composition of a sample scratched in situ under UHV. It is further concluded that the Al depletion is due to oxidation during bakeout. Cr-rich features in both the α/β and γ/γ' phases are reported. An optimal two dimensionally smoothed Cr Auger image is presented showing these features which are considered to be due to the αCr solid solution particles or clustering of these particles in the α/β phase and the Ni solid solution component in the γ/γ' phase.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 184-192"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90050-9","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86819138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The contribution of kinetic nucleation theories to studies of Volmer-Weber thin film growth 动力学成核理论对Volmer-Weber薄膜生长研究的贡献
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-02-10 DOI: 10.1016/0378-5963(85)90182-5
B.F. Usher
{"title":"The contribution of kinetic nucleation theories to studies of Volmer-Weber thin film growth","authors":"B.F. Usher","doi":"10.1016/0378-5963(85)90182-5","DOIUrl":"10.1016/0378-5963(85)90182-5","url":null,"abstract":"<div><p>Extensive study of the vapour deposition of noble metals onto UHV cleaved alkali halide crystal surfaces has made an important contribution to the development of time-dependent nucleation theory. There nevertheless remain significant inconsistencies between results obtained from different studies of identical systems. The role which the time-dependent kinetic approach to nucleation theory has played in the past and that which it might take in the future are discussed.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 506-511"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90182-5","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90953095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Some properties of Si(111) and Ge(111) cleaved surfaces at low temperatures 低温下Si(111)和Ge(111)切割表面的一些性质
Applications of Surface Science Pub Date : 1985-05-01 Epub Date: 2003-09-26 DOI: 10.1016/0378-5963(85)90032-7
V.A. Grazhulis, V.F. Kuleshov
{"title":"Some properties of Si(111) and Ge(111) cleaved surfaces at low temperatures","authors":"V.A. Grazhulis,&nbsp;V.F. Kuleshov","doi":"10.1016/0378-5963(85)90032-7","DOIUrl":"10.1016/0378-5963(85)90032-7","url":null,"abstract":"<div><p>Low-temperature experimental results on Ge(111) and Si(111) surfaces prepared by crystal cleavage in ultra-high vacuum (∼ 10<sup>-10</sup> Torr), liquid N<sub>2</sub>, and liquid He are presented and briefly discussed. Some of these results are reanalyzed and new interpretations are suggested.</p></div>","PeriodicalId":100105,"journal":{"name":"Applications of Surface Science","volume":"22 ","pages":"Pages 14-24"},"PeriodicalIF":0.0,"publicationDate":"1985-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0378-5963(85)90032-7","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90942605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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