IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility最新文献

{"title":"A Method To Improve EMI Shielding Predictions","authors":"C. Brench","doi":"10.1109/ISEMC.1992.626085","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626085","url":null,"abstract":"Colin E. Brench Digital Equipment Corporation 146 Main Street, Maynard, MA 01754 Overall perfonnance of a shield with one or more apertures depends upon a number of factors, including, the type and location of the source, the presence of adjacent conductors and the geometry of the shield. Both analytic and numerical techniques were employed in this work to analyze four separate indicators to shielding perfonnance. The four indicators used were shielding effectiveness, electric field suppression, magnetic field suppression and surface impedance.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"232-235"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85204975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Circuit theory approach to shielding","authors":"G. Kunkel","doi":"10.1109/ISEMC.1992.626041","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626041","url":null,"abstract":"There are two approved methods for approximating the shielding effectiveness of shielding m,aterials used in the design of shielded enclosures and boxes. Both of the approved methods use wave theory and quasi-stationary assumptions. One of the methods uses Maxwell¿s equations to estimate the shielding, and the other uses the correlation between transmissiain lines and radiated waves. A third method consisiting of circuit theory (or Kirkoff's Law) is proposed herein as an applicable method of approximation worthy of consideration.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"162 50 1","pages":"15-20"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87063023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Derivation Of The Normalized Site Attenuation Mutual Coupling Correction Factor And An Improved Method Of Antenna Factor Determination","authors":"R. McConnell","doi":"10.1109/ISEMC.1992.626126","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626126","url":null,"abstract":"The mutual coupling correction factor is used in ANSI C63.4-1991 site attenuation procedures to correct the antenna factors of resonant dipoles at a distance of three meters and arrive at values of measured normalized site attenuation. The correction factor accounts for nonlinearities of attenuation versus distance for resonant dipoles in close proximity. A derivation of the correction factor is given here in which it is shown that the factor is composed of effects due to mutual impedance, changes in aperture, and changes in effective height. The insights gained from this derivation lead to improved methods of deterniining resonant dipole antenna factors through the elimination of two approximations which are used in the present ANSI C63.5-1988 procedures.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"407-411"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81809467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Measurement Of Radiated Emissions From Integrated Circuits","authors":"R. R. Goulette","doi":"10.1109/ISEMC.1992.626105","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626105","url":null,"abstract":"Newer, larger integrated circuits are becoming significant sources of EMI, due to their higher clock speeds, greater dynamic current consumption, and increased size and complexity. This paper presents an approach for the measurement of radiated emissions potential at the component level, with the objective of quantitatively specifying the level of device emissions that will ensure compliance at the equipment level. Since many integrated circuit radiated emission effects depend upon near-field coupling, the problem is first examined in the light of magnetic and electric field measurements made in the immediate vicinity of the device. The prospect of using far-field measurement methods is also considered, and the relative merits of using both techniques are weighed. R = Radiated I. INTRODUCI~ON C = Conducted Fig. 1. Electromagnetic emission from integrated circuits. The design of telecommunications equipment for EMI compliance is currently hampered by a lack of relevant data on the emissions potential of commercial and custom electronic components. Newer, more complex devices such as 32-bit microprocessors, digital signal processors, and a variety of ASICs (application-specific integrated circuits) have appeared on the scene and represent an increasingly important source of electromagnetic energy. This is due to their higher clock speeds, greater dynamic current consumption, and increased size and complexity. Although these components will not normally fail the radiated emissions limits by themselves, the energy that they generate may excite resonant structures within electronic equipment, causing an EM1 problem. Figure 1 depicts the flow of both conducted and radiated energy from the integrated circuit (IC) into printed circuit board (PCB) and backplane structures, into enclosure cavities and onto connectors and cables. Each one of these elements contributes to the total energy radiated from the equipment. It is evident from this view that limiting the emissions from the device will control the emissions from the equipment. The problem that remains is to quantitatively specify the level of device emissions that will ensure emission compliance at the product level. The purpose of this paper is to propose that devices be characterized in terms of their equivalent magnetic and electric dipole moments, which will provide a measure of the potential for radiated emissions coupling. This is accomplished by representing an IC by a small loop antenna (magnetic dipole) and by a small dipole antenna (electric dipole). The magnetic dipole moment is simply the product of loop area and loop current, and the electric dipoie moment is the product of dipole length and current [I]. Measurement techniques to determine these parameters will be presented in the following sections. II. REASONS FOR REDUCING INTEGRATED ClRCUIT EMISSIONS Direct device radiated emissions are becoming more important in modem high-density high-speed circuitry since the use of ground planes a","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"51 1","pages":"340-345"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83609013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Radiated Emissions Of Interconnect Cables","authors":"S.K. Das, W.T. Smith, C. Paul","doi":"10.1109/ISEMC.1992.626132","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626132","url":null,"abstract":"Short ribbon cables are often used to connect components inside a computer or other electronic device. Crosstalk between the closely spaced wires of a multiconductor ribbon cable is often a problem. Interspersing ground wires and signal-carrying wires is a common and effective method for reduction of crosstalk on these types of cables [ll. In this study, the radiated emissions of a ribbon cable are analyzed. The goal is to determine how different signal wire/ground wire configurations affect the radiated fields of a ribbon cable. A five wire model of a 10 cm ribbon cable is used. Lumped circuit analysis and the method of moments are used to predict the currents and radiated fields.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"142 1","pages":"423-427"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89366244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Broadband Quarter Wave Absorbers And Site Attenuation New Developments","authors":"F. Mayer, J. Chaumat, M. Kirschvink","doi":"10.1109/ISEMC.1992.626160","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626160","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"520-525"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82161981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Far-field Techniques For Predicting Aircraft Antenna Coupling","authors":"J.M. Harris, R. Levin","doi":"10.1109/ISEMC.1992.626057","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626057","url":null,"abstract":"The analytical prediction of coupling between antennas is frequently time consuming and costly. The predictions are most challenging when the antennas operate at frequencies below 1 GHz and are located on surfaces that offer only limited ground plane area. This paper explores the limitations of using simple far-field, free-space transmission equations to predict the coupling between two helicopter-mounted antennas operating in the UHF band. Onaircraft antenna coupling measurements are compared to coupling measurements performed in an anechoic chamber and to antenna coupling values calculated using the simple far-field, free-space transmission equations.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"112-115"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73070233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Shielding Enhancement Of The Torpedo Mk 50","authors":"L. Lacoursiere","doi":"10.1109/ISEMC.1992.626097","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626097","url":null,"abstract":"","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"44 1","pages":"290-293"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80845652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Electromagnetic Shielding Degradation Of Composite And Metal Mil-c-38999 Connectors Due To Environmental Exposure","authors":"D. Kempf","doi":"10.1109/ISEMC.1992.626120","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626120","url":null,"abstract":"Three types of MIL-C-38999 connectors were measured for shielding effectiveness both before and after exposure to a controlled simulated Navy fleet environment using a salt fog chamber. Two connectors types were made of compositematerial. The third type was a standard aluminumconnector. Shielding effectivenesswas measured over the frequency range of 1 to 10 GHz using m ode-stirred chamber techniques. This paper compares the degradation of shielding effectiveness of the three connector types resulting from the salt fog exposure.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"55 1","pages":"380-383"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80195064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"New broadband gigahertz field simulator","authors":"A. Podgorski, G. Gibson","doi":"10.1109/ISEMC.1992.626136","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626136","url":null,"abstract":"A new electromagnetic field simulator for the measurement of radiated susceptibility and emission is presented. The design of the new simulator permits its easy incorporation into existing EMC and EMP facilities and provides for facilities testing capability expansion into the gigahertz region.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"435-437"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77300963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}