{"title":"Electromagnetic Shielding Degradation Of Composite And Metal Mil-c-38999 Connectors Due To Environmental Exposure","authors":"D. Kempf","doi":"10.1109/ISEMC.1992.626120","DOIUrl":null,"url":null,"abstract":"Three types of MIL-C-38999 connectors were measured for shielding effectiveness both before and after exposure to a controlled simulated Navy fleet environment using a salt fog chamber. Two connectors types were made of compositematerial. The third type was a standard aluminumconnector. Shielding effectivenesswas measured over the frequency range of 1 to 10 GHz using m ode-stirred chamber techniques. This paper compares the degradation of shielding effectiveness of the three connector types resulting from the salt fog exposure.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"55 1","pages":"380-383"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626120","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Three types of MIL-C-38999 connectors were measured for shielding effectiveness both before and after exposure to a controlled simulated Navy fleet environment using a salt fog chamber. Two connectors types were made of compositematerial. The third type was a standard aluminumconnector. Shielding effectivenesswas measured over the frequency range of 1 to 10 GHz using m ode-stirred chamber techniques. This paper compares the degradation of shielding effectiveness of the three connector types resulting from the salt fog exposure.