M. Bosi, Albert-Miquel Sánchez, F. Pajares, I. Garcia, J. Accensi, J. Regué
{"title":"Common- and Differential-Mode Conducted Emissions Measurements using Conventional Receivers versus FFT-Based Receivers","authors":"M. Bosi, Albert-Miquel Sánchez, F. Pajares, I. Garcia, J. Accensi, J. Regué","doi":"10.1109/MEMC.2022.9982541","DOIUrl":"https://doi.org/10.1109/MEMC.2022.9982541","url":null,"abstract":"Electromagnetic interference (EMI) instrumentation has significantly evolved over the last thirty years. In this paper, the classical architecture of a conventional receiver is described and compared with the newest architecture of a Fast-Fourier-transform (FFT) based receiver. Additionally, different ways to measure the modal emissions, that is, the common and differential modes, with both types of receivers are described. In a conventional receiver, modal emissions can be measured using an external noise separator. In a dual-port FFT-based receiver, this can be done in the digital domain. Both receivers have been used to measure a device under test emitting non-stationary interference.","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"11 1","pages":"55-63"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"EMC and Digital Design Share More Than We Thought","authors":"T. Braxton","doi":"10.1109/memc.2022.10058842","DOIUrl":"https://doi.org/10.1109/memc.2022.10058842","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SPI 2022 Held in Siegen, Germany","authors":"E. Griese, T. Kuhler","doi":"10.1109/memc.2022.9873834","DOIUrl":"https://doi.org/10.1109/memc.2022.9873834","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"48 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"L-EMCPA: Call for Letters on EMC Testing and Qualification","authors":"","doi":"10.1109/memc.2022.9780329","DOIUrl":"https://doi.org/10.1109/memc.2022.9780329","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Report on 2022 ESA Workshop on Aerospace EMC","authors":"J. Wolf","doi":"10.1109/memc.2022.9982536","DOIUrl":"https://doi.org/10.1109/memc.2022.9982536","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62488857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experiments and Demonstrations at EMC+SIPI 2022","authors":"Jacob Dixon, Gabe Alcala","doi":"10.1109/memc.2022.9982566","DOIUrl":"https://doi.org/10.1109/memc.2022.9982566","url":null,"abstract":"","PeriodicalId":73281,"journal":{"name":"IEEE electromagnetic compatibility magazine","volume":"35 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"62489648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}