纳米科学与工程(英文)最新文献_第10页

Simulation of Structural Characteristics and Depth Filtration Elements in Interconnected Nanofibrous Membrane Based on Adaptive Image Analysis 基于自适应图像分析的互联纳米纤维膜结构特性及深度过滤元模拟

纳米科学与工程(英文) Pub Date : 2013-03-31 DOI: 10.4236/WJNSE.2013.31002

Mohammad Kazemi Pilehrood, P. Heikkilä, A. Harlin

{"title":"Simulation of Structural Characteristics and Depth Filtration Elements in Interconnected Nanofibrous Membrane Based on Adaptive Image Analysis","authors":"Mohammad Kazemi Pilehrood, P. Heikkilä, A. Harlin","doi":"10.4236/WJNSE.2013.31002","DOIUrl":"https://doi.org/10.4236/WJNSE.2013.31002","url":null,"abstract":"Due to their unique structural features, electrospun membranes have gained considerable attention for use in applications where quality of depth filtration is a dominant performance factor. To elucidate the depth filtration phenomena it is important to quantify the intrinsic structural properties independent from the dynamics of transport media. Several methods have been proposed for structural characterization of such membranes. However, these methods do not meet the requirement for the quantification of intrinsic structural properties in depth filtration. This may be due to the complex influence of transport media dynamics and structural elements in the depth filtration process. In addition, the different morphological architectures of electrospun membranes present obstacles to precise quantification. This paper seeks to quantify the structural characteristics of electrospun membranes by introducing a robust image analysis technique and exploiting it to evaluate the permeation-filtration mechanism. To this end, a nanostructured fibrous network was simulated as an ideal membrane using adaptive local criteria in the image analysis. The reliability of the proposed approach was validated with measurements and comparison of structural characteristics in different morphological conditions. The results were found to be well compatible with empirical observations of perfect membrane structures. This approach, based on optimization of electrospinning parameters, may pave the way for producing optimal membrane structures for boosting the performance of electrospun membranes in end-use applications.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"3 1","pages":"6-16"},"PeriodicalIF":0.0,"publicationDate":"2013-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70877366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

C@Ag/TiO 2 : A Highly Efficient and Stable Photocatalyst Active under Visible Light C@Ag/ tio2:一种高效稳定的可见光活性光催化剂

纳米科学与工程(英文) Pub Date : 2013-03-31 DOI: 10.4236/WJNSE.2013.31001

Bei Jin, Xiaosong Zhou, Xuyao Xu, Lin Ma, Zhijun Wu, Yingshan Huang

引用次数: 9

Study of Two One-Dimensional Multi Tunnel Junctions Arrays Structures by SIMON 两个一维多隧道结阵列结构的SIMON研究

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24023

A. Touati, S. Chatbouri, N. Sghaier, A. Kalboussi

引用次数: 3

Characterization and Evaluation of Antibacterial Activities of Chemically Synthesized Iron Oxide Nanoparticles 化学合成氧化铁纳米颗粒抗菌活性的表征与评价

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24026

S. Behera, J. Patra, K. Pramanik, N. Panda, H. Thatoi

引用次数: 172

Molecular Dynamics Study on Mechanical Properties in the Structure of Self-Assembled Quantum Dot 自组装量子点结构力学性能的分子动力学研究

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24025

T. Yamaguchi, K. Saitoh

{"title":"Molecular Dynamics Study on Mechanical Properties in the Structure of Self-Assembled Quantum Dot","authors":"T. Yamaguchi, K. Saitoh","doi":"10.4236/WJNSE.2012.24025","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24025","url":null,"abstract":"Stress and strain in the structure of self-assembled quantum dots constructed in the Ge/Si(001) system is calculated by using molecular dynamics simulation. Pyramidal hut cluster composed of Ge crystal with {105} facets surfaces observed in the early growth stage are computationally modeled. We calculate atomic stress and strain in relaxed pyramidal structure. Atomic stress for triplet of atoms is approximately defined as an average value of pairwise (virial) quantity inside triplet, which is the product of vectors between each two atoms. Atomic strain by means of atomic strain measure (ASM) which is formulated on the Green’s definition of continuum strain. We find the stress (strain) relaxation in pyramidal structure and stress (strain) concentration in the edge of pyramidal structure. We discuss size dependency of stress and strain distribution in pyramidal structure. The relationship between hydrostatic stress and atomic volumetric strain is basically linear for all models, but for the surface of pyramidal structure and Ge-Si interface. This means that there is a reasonable correlation between atomic stress proposed in the present study and atomic strain measure, ASM.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"189-195"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Observed Enhancement in LIBS Signals from Nano vs. Bulk ZnO Targets: Comparative Study of Plasma Parameters 观察到的LIBS信号从纳米和体氧化锌靶增强:等离子体参数的比较研究

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24024

A. M. E. Sherbini, A. Aboulfotouh, F. F. Rashid, S. Allam, Ashraf El Dakrouri, T. E. Sherbini

{"title":"Observed Enhancement in LIBS Signals from Nano vs. Bulk ZnO Targets: Comparative Study of Plasma Parameters","authors":"A. M. E. Sherbini, A. Aboulfotouh, F. F. Rashid, S. Allam, Ashraf El Dakrouri, T. E. Sherbini","doi":"10.4236/WJNSE.2012.24024","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24024","url":null,"abstract":"In this article, we will report an experimental evidence of enhanced LIBS emission upon replacing a Bulk-Based ZnO target by the corresponding Nano-Based target. The plasma was initiated via interaction of a Nd:YAG laser at the fundamental wavelength with both targets in open air under the same experimental conditions. The measurements show an enhanced emission from the Zn I-lines at the wavelengths of 328.26, 330.29, 334.55, 468.06, 472.2, 481.01, 636.38 nm. The measurements were repeated at different delay times in the range from 1 to 5 μs at constant irradiation level and fixed gate time of 1 μs. The average enhancement over the different Zn I-lines was found increases exponentially up to 8-fold with delay time. The electron density to each plasma was measured utilizing the Hα-line appeared in the emitted spectra from each plasma and was found to give similar values. The electron temperatures were measured via Boltzmann plot method utilizing the relative intensities of the Zn I-lines and were found to give very close values. Moreover, the relative population density of the ground state of the zinc atoms (relative concentration) was measured spectroscopically utilizing the Boltzmann plot method and was found to increase in a very similar trend to that of enhancement. The results of the spectroscopic analysis conclude that these signal enhancements can be attributed to the higher concentration of neutral atoms in the Nano-Based material plasma with respect to the corresponding Bulk-based ZnO material.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"181-188"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.4236/WJNSE.2012.24024","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 29

Photoluminescence Properties of LaF 3 :Ce Nanoparticles Embedded in Polyacrylamide 聚丙烯酰胺包埋laf3:Ce纳米粒子的光致发光性能

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24027

T. K. Srinivasan, B. Venkatraman, D. Ponraju, A. Arora

引用次数: 3

Measurement of Plasma Parameters in Laser-Induced Breakdown Spectroscopy Using Si-Lines 用硅线测量激光诱导击穿光谱中的等离子体参数

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24028

A. M. E. Sherbini, A. Aamer

{"title":"Measurement of Plasma Parameters in Laser-Induced Breakdown Spectroscopy Using Si-Lines","authors":"A. M. E. Sherbini, A. Aamer","doi":"10.4236/WJNSE.2012.24028","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24028","url":null,"abstract":"The electron density and temperature of the laser induced silicon plasma were measured using two different methods. The plasma was produced via the interaction of high peak power Nd-YAG laser at the fundamental wavelength of 1064 nm with a plane solid iron target contain small traces of silicon as an element of minor concentration. The lines from the Si I at 288.15 nm and Si II-ionic lines at 413.08 and 634.71 nm were utilized to evaluate the plasma parameters. The reference plasma parameters were measured utilizing the Hα-line at 656.27 nm appeared in the spectra under the same condition. The electron density was measured utilizing the Stark broadening of the silicon lines and the temperature from the standard Saha-Boltzmann plot method. The comparison between electron densities from different silicon lines to that from the Hα-line reveals that the Si I-line at 288.15 nm contain some optical thickness while the Si II-ionic lines were found to be free from this effect. The measurements were repeated at different delay times between the laser and the camera in the range from 1 - 5 μsec. The electron density was found decreases from 2 × 1018 down to 4 × 1017 cm–3. After correcting the spectral intensity at the Si I-line at 288.15 nm, the temperatures evaluated from the different methods were found in an excellent agreement and decreases from 1.25 down to 0.95 eV with delay time.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"02 1","pages":"206-212"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70877038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 53

Microstructural Characterization of Large Area C 60 Films Obtained by Conventional Microwave Oven Irradiation 微波辐照大面积c60薄膜的微观结构表征

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24029

Jacobo Martínez-Reyes, L. D. Barriga-Arceo, L. Rendón-Vázquez, R. Martínez-Guerrero, N. Romero-Partida, E. Palacios-González, V. Garibay-Feblés, J. Ortiz-Lopez

{"title":"Microstructural Characterization of Large Area C 60 Films Obtained by Conventional Microwave Oven Irradiation","authors":"Jacobo Martínez-Reyes, L. D. Barriga-Arceo, L. Rendón-Vázquez, R. Martínez-Guerrero, N. Romero-Partida, E. Palacios-González, V. Garibay-Feblés, J. Ortiz-Lopez","doi":"10.4236/WJNSE.2012.24029","DOIUrl":"https://doi.org/10.4236/WJNSE.2012.24029","url":null,"abstract":"In the present work the synthesis of C60 produced in a conventional microwave oven from the decomposition of camphor resin is reported. The polycrystalline structure of the sample was determined by X-Ray Diffraction (XRD), the sample showed several phases, the main phase corresponds to fullerene C60 ordered in a Face-Centered Cubic structure (FCC), with two more structures: one orthorhombic system and the other the monoclinic system coexisting also with graphite 2H phase. It was observed in a Scanning Electron Microscopy (SEM), that the sample formed thin films of stacked carbon. Whereas in a High Resolution Transmission Electron Microscopy (HRTEM), measurements in Bright Field mode revealed that the main phase of the material is C60 ordered in FCC structure and the elemental composition and atomic bonding state can be determined by analyzing the energy with the electron microscope by Elesctron Energy- Loss Spectroscopy (EELS), technique allowed confirm all the phase C60 established with XRD observations.","PeriodicalId":66816,"journal":{"name":"纳米科学与工程(英文)","volume":"2 1","pages":"213-218"},"PeriodicalIF":0.0,"publicationDate":"2012-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"70876913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

New Model for Drain and Gate Current of Single-Electron Transistor at High Temperature 高温下单电子晶体管漏极和栅极电流的新模型

纳米科学与工程(英文) Pub Date : 2012-12-11 DOI: 10.4236/WJNSE.2012.24022

A. Touati, S. Chatbouri, N. Sghaier, A. Kalboussi

引用次数: 8