2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015]最新文献

Named entity recognition approaches: A study applied to English and Hindi language 命名实体识别方法:应用于英语和印地语的研究

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159443

Gowri Prasad, K. K. Fousiya

引用次数: 9

Average current mode control of improved bridgeless flyback rectifier with bidirectional switch 改进型双向开关无桥反激整流器的平均电流模式控制

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159416

V. R. Chandranadhan, G. Renjini

{"title":"Average current mode control of improved bridgeless flyback rectifier with bidirectional switch","authors":"V. R. Chandranadhan, G. Renjini","doi":"10.1109/ICCPCT.2015.7159416","DOIUrl":"https://doi.org/10.1109/ICCPCT.2015.7159416","url":null,"abstract":"This paper introduces average current mode control of flyback rectifier with bidirectional switch. The proposed control scheme employs an outer voltage feedback loop, which maintains the output voltage as constant and an inner loop, which sense the input current. Average current mode control of flyback rectifier is suitable for obtaining a regulated output voltage with a varying input. Voltage equivalent of input current is averaged by using high gain current error amplifier, which again compared with the reference voltage. Reference voltage is produced by multiplying the rectified input voltage with the error output voltage. Gating pulse is generated by using this signal. This control method obtain better line and load regulation with the addition of inner current loop compared with voltage mode control. Also the rectified input voltage feedback achieves better input power factor. Conventional flyback rectifier is the inter connection of a diode bridge rectifier in the input side and a flyback converter. In order to obtain a highly efficient flyback rectifier with fewer losses an improved flyback rectifier is introduced. Here, two switches are connected in back to back to establish the bidirectional switch element, which will conduct both in the positive and negative half cycle of the ac input voltage. The transformer with dual output windings with a diode in each winding reduces the current stress across each diode. New topology adds an extra switch in the primary side and a diode in the secondary side. Improved bridgeless flyback rectifier only introduces a switch with common gate drive, a diode and an additional winding in the secondary side. Thus the weight of the converter is not affected with these additional components. Proposed average current mode control can be used as an adapter. Design and simulated waveforms are added in this paper for an output rating of 20V/1.5A.","PeriodicalId":6650,"journal":{"name":"2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015]","volume":"13 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2015-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86371219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Kernel weighted FCM based MR image segmentation for brain tumor detection 基于核加权FCM的MR图像分割在脑肿瘤检测中的应用

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159366

K. J. Francis, M. S. Godwin Premi

引用次数: 5

A novel method to enhance the security of ATM using biometrics 一种利用生物识别技术提高ATM机安全性的新方法

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159391

G. R. Jebaline, S. Gomathi

引用次数: 27

Design of asynchronous NoC using 3-port asynchronous T-routers 基于3端口异步t型路由器的异步NoC设计

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159417

S. Kunapareddy, Sriraj Dheeraj Turaga, Solomon Surya Tej Mano Sajjan

引用次数: 1

Large-scale steganalysis using outlier detection method for image sharing application 利用离群点检测方法进行大规模隐写分析的图像共享应用

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159320

N. Das, P. Rasmi

引用次数: 5

Neural network based SOM for multispectral image segmentation in RGB and HSV color space 基于神经网络的RGB和HSV色彩空间多光谱图像分割

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159345

Ganesan, Khamar Basha Shaik, B. Sathish, V. Kalist

引用次数: 4

Comparative study of power forecasting methods for wind farms 风电场功率预测方法的比较研究

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-07-16 DOI: 10.1109/ICCPCT.2015.7159429

Kunal Lohia, S. Garg, N. Shrivastava, B. K. Panigrahi

引用次数: 0

NBTI detection methodology for building tolerance with respect to NBTI effects employing adaptive body bias 利用适应性身体偏差建立NBTI效应耐受性的NBTI检测方法

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-03-19 DOI: 10.1109/ICCPCT.2015.7159390

S. Narang, A. Srivastava

{"title":"NBTI detection methodology for building tolerance with respect to NBTI effects employing adaptive body bias","authors":"S. Narang, A. Srivastava","doi":"10.1109/ICCPCT.2015.7159390","DOIUrl":"https://doi.org/10.1109/ICCPCT.2015.7159390","url":null,"abstract":"The nanometre technology is different fundamentally from its predecessors as it is exposed to a wide variety of new effects that are induced on the transistor chips. NBTI is one degradation effects in the reliability regime. It plays significant role as it leads to severe performance degradation. Ageing in pMOS transistor takes place due to Negative bias temperature instability (NBTI) which is the major threat to reliability as we scale down the transistor geometries consistently towards our objective for less power consumption coupled with high performance. The work presented in this paper focuses on NBTI detection scheme for building tolerance with respect to NBTI effects employing Adaptive Body Bias (ABB). In this scheme, an On-Chip monitor detects the change in threshold voltage of the circuit to generate corresponding adaptive body bias by the body biasing circuit which is supplied to the transistors. The simulations have been carried out taking VBB as zero, i.e., No Body Bias (NBB), by applying a finite adaptive body bias (ABB) voltage to the transistors on the chip & their corresponding power and delay have thus been calculated by implementation of the proposed approach on a host of domino logic circuits which include Current comparison domino (CCD). We have mitigated the rise in delay problem by suitably allocating a supply voltage so that the delay specifications are continuously met even after a time span of 10 years of operation at the cost of very low power headroom. Simulations have been performed using the BSIM4v4.7 model & 32-nm predictive technology model in SILVACO EDA tool at a frequency of 2 GHz and nominal supply voltage of 0.9V. The proposed approach has been implemented on 32-bit & 64-bit OR gates and also on 32-bit comparator and the results has been noteworthy.","PeriodicalId":6650,"journal":{"name":"2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015]","volume":"30 1","pages":"1-7"},"PeriodicalIF":0.0,"publicationDate":"2015-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77813574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Multiobjective optimal placement of multiple distributed generations in IEEE 33 bus radial system using simulated annealing 基于模拟退火的ieee33总线径向系统多代分布式优化配置

2015 International Conference on Circuits, Power and Computing Technologies [ICCPCT-2015] Pub Date : 2015-03-19 DOI: 10.1109/ICCPCT.2015.7159428

K. Dharageshwari, C. Nayanatara

引用次数: 34