2019 11th International Conference on Electrical and Electronics Engineering (ELECO)最新文献

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Exploring Effects of Creativity Training on Default Mode Network and Attention 探索创造力训练对默认模式网络和注意的影响
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990509
Muhammad Ammar Ali, Süreyya Özögür-Akyüz, A. Duru, Alper Almelek, M. Çalişkan
{"title":"Exploring Effects of Creativity Training on Default Mode Network and Attention","authors":"Muhammad Ammar Ali, Süreyya Özögür-Akyüz, A. Duru, Alper Almelek, M. Çalişkan","doi":"10.23919/ELECO47770.2019.8990509","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990509","url":null,"abstract":"The growing consensus is that creativity is associated with connectivity across multiple neural networks including, but not restricted to, networks involved in executive and cognitive control along with regions closely linked to the Default Mode Network (DMN) of the brain. In this study, the effects of a nine-week creativity training given to managers with a minimum of five years of experience in their field was explored. Power Spectral Density computed from scalp electrical signals and P300 waves derived from ERP techniques paired with Kaufman Domains of Creativity Scale (K-DOCS) were used. After the training, an increase in \"Everyday\" creativity was observed, implying that this aspect of creativity is possibly more dependent on the processing of the DMN than on attention and executive function.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"38 1","pages":"954-958"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75802983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analytical model for PMSM Analysis Including Finite Soft-Magnetic Material Permeability 含有限软磁材料磁导率的永磁同步电机分析模型
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990431
B. L. Chikouche
{"title":"Analytical model for PMSM Analysis Including Finite Soft-Magnetic Material Permeability","authors":"B. L. Chikouche","doi":"10.23919/ELECO47770.2019.8990431","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990431","url":null,"abstract":"This paper presents a simplified analytical method to predict the influence of magnetic finite permeability of iron core on machine’s parameters of a surface mounted permanent magnet synchronous machine. On the open circuit, two-dimensional field distributions produced by permanent magnets synchronous machine (PMSM) are obtained in analytical approach forms by taking into account the relative permeability value of a ferromagnetic rotor and stator core. The analytical solution is given by applying boundary and interface conditions in each region of the proposed machine. Analytical method is verified by the finite-element analysis (FEA).","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"20 1","pages":"200-204"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75810828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Electric Vehicle Model Parameter Estimation with Combined Least Squares and Gradient Descent Method 基于最小二乘法和梯度下降法的电动汽车模型参数估计
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990393
Mehmet Ali Gozukucuk, H. Fatih Uğurdağ, Mert Dedekoy, Mert Celik, T. Akdogan
{"title":"Electric Vehicle Model Parameter Estimation with Combined Least Squares and Gradient Descent Method","authors":"Mehmet Ali Gozukucuk, H. Fatih Uğurdağ, Mert Dedekoy, Mert Celik, T. Akdogan","doi":"10.23919/ELECO47770.2019.8990393","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990393","url":null,"abstract":"Energy management algorithms have a crucial role in electric vehicles due to their limited driving range. For an energy management algorithm to be effective, we should model the vehicle as accurately as possible. That is, not only the structure of the model should be accurate, but also the parameters of the model should be accurate. In this work, we take the model of an electric vehicle and tune three parameters in it based on trip data, namely, vehicle mass, air drag coefficient, and rolling resistance coefficient. We do this by using Least Squares method to set the initial guess and then by optimizing the parameters using Gradient Descent. To the best of our knowledge, this is the first work that simultaneously estimates these three parameters. Our work is also unique in the sense that it combines Least Squares and Gradient Descent.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"38 1","pages":"805-809"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75488973","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Computational Design for Overvoltage Protection of Photovoltaic Inverters, based on Metal Oxide Varistors 基于金属氧化物压敏电阻的光伏逆变器过电压保护计算设计
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990373
F. Crisovan, F. Frigura-Iliasa, A. Simo, P. Andea, S. Musuroi
{"title":"Computational Design for Overvoltage Protection of Photovoltaic Inverters, based on Metal Oxide Varistors","authors":"F. Crisovan, F. Frigura-Iliasa, A. Simo, P. Andea, S. Musuroi","doi":"10.23919/ELECO47770.2019.8990373","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990373","url":null,"abstract":"Protection equipment based on metal oxide varistors is the most common solution today in the field of low voltage surge arrester applications. All ZnO based varistors are power electronic devices made of n-type semiconductor polycrystalline ceramics, having a high degree of non-linearity of current-voltage dependence. This paper presents an original algorithm applied for dimensioning low voltage varistors, used to protect the inverters located in photovoltaic plants. The algorithm consists in 3 steps, one for computing the height corresponding to the desired voltage, another for the determination of the diameter corresponding to a certain energy/volume absorption capacity, and, a third one which is a sort of safety test for conformity.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"154 1","pages":"345-348"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74062546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Load Frequency Control of Two Area and Multi Source Power System Using Grey Wolf Optimization Algorithm 基于灰狼优化算法的两区多源电力系统负荷频率控制
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990643
A. Doğan
{"title":"Load Frequency Control of Two Area and Multi Source Power System Using Grey Wolf Optimization Algorithm","authors":"A. Doğan","doi":"10.23919/ELECO47770.2019.8990643","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990643","url":null,"abstract":"In this study, load frequency of two area interconnected power systems are controlled based on Proportional Integral Derivative (PID) controller structures and gain parameters of controllers are decided using Grey Wolf Optimization (GWO) algorithm. Dynamic response of the proposed structure is investigated considering integral of time multiplied absolute error (ITEA) as cost function in a two area and multi source power system. Capability and efficiency of GWO algorithm is illustrated in comparison to Particle Swarm Optimization (PSO) and Artificial Bee colony (ABC). It is observed that GWO provides minimum value of cost function and better dynamic response among the considered algorithms.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"35 9","pages":"81-84"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72612976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Transimpedance Type MOS-C Bandpass Filter Cores 跨阻型MOS-C带通滤波器芯
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990543
Ismail Cevik, B. Metin, N. Herencsar, O. Cicekoglu, H. Kuntman
{"title":"Transimpedance Type MOS-C Bandpass Filter Cores","authors":"Ismail Cevik, B. Metin, N. Herencsar, O. Cicekoglu, H. Kuntman","doi":"10.23919/ELECO47770.2019.8990543","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990543","url":null,"abstract":"In this paper, we present two area-efficient transimpedance type second-order analog filters. In many applications the signal generated and available is current, however the necessary signal for further processing is voltage type. For these applications the presented circuits will be very useful. The technique employed is MOS-only technique and to the best of our knowledge this is the first attempt to implement transimpedance filters with MOS-only technique. Starting from the core circuit biasing is illustrated and the functionality is shown with LTSPICE simulations using TSMC 180nm technology parameters.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"45 1","pages":"371-374"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78720377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
5G Enhanced Mobile Broadband Downlink Scheduler 5G增强型移动宽带下行调度程序
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/eleco47770.2019.8990378
M. Sağlam, M. Kartal
{"title":"5G Enhanced Mobile Broadband Downlink Scheduler","authors":"M. Sağlam, M. Kartal","doi":"10.23919/eleco47770.2019.8990378","DOIUrl":"https://doi.org/10.23919/eleco47770.2019.8990378","url":null,"abstract":"A new 5G enhanced Mobile BroadBand (eMBB) downlink scheduler is proposed in this paper. 5G can support a diversity of services and user requirements. These services and user requirements can be handled by functions like scheduling, link adaptation and power control. Scheduling has a close relation with other functionalities for an efficient system resources. The proposed 5G eMBB scheduling algorithm is throughput and Channel Quality Indicator (CQI) aware. The proposed algorithm, named 5G eMBB lean scheduler, is inspired by lean production method and possesses the properties of both best CQI and proportional fair (PF) algorithms. According to our best knowledge, lean production method has not been applied to 5G mobile communication scheduling algorithms. The proposed scheduler exceeds the performance of best CQI and PF algorithms in fairness and the throughput respectively even for cell edge users.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"5 1","pages":"687-692"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75019042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Automated Prediction Of TNM Stage For Clear Cell Renal Cell Carcinoma Disease By Analyzing CT Images of Primary Tumors 通过分析原发肿瘤CT图像自动预测透明细胞肾细胞癌TNM分期
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990496
Harika Beste Ökmen, H. Uysal, A. Guvenis
{"title":"Automated Prediction Of TNM Stage For Clear Cell Renal Cell Carcinoma Disease By Analyzing CT Images of Primary Tumors","authors":"Harika Beste Ökmen, H. Uysal, A. Guvenis","doi":"10.23919/ELECO47770.2019.8990496","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990496","url":null,"abstract":"TNM Staging is important for prognosis, treatment planning and research of Clear Cell Renal Cell Carcinoma (CCRCC). The goal of this study was to investigate if CT images alone can be used to predict stages. Overall 191 patient data (TCGA-KIRC) were used and the number of images for stages one to four was 92, 19, 50 and 30 respectively. Tumors were manually defined by an expert radiologist on single slices. Open-source software was used to extract 136 features from ROI. Normalization and data balancing were performed. The feature number was reduced to 10 after the feature selection process. Classification accuracy was found 85.4% (KNN with random space model). Accuracies were distributed among stages 1-4 as 79%, 92%, 84%, 91%. CT images can be potentially used to automatically predict the TNM stage of CCRCC patients. A higher number of CT images with standard acquisition protocols may further increase accuracy.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"113 1","pages":"456-459"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79417399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Generalized Polynomial Chaos Based Stochastic Collocation on the Uncertainty Quantification of CMOS Active Filter Circuits 基于广义多项式混沌的CMOS有源滤波电路随机配置的不确定性量化
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990660
Mecit Emre Duman, O. Suvak
{"title":"Generalized Polynomial Chaos Based Stochastic Collocation on the Uncertainty Quantification of CMOS Active Filter Circuits","authors":"Mecit Emre Duman, O. Suvak","doi":"10.23919/ELECO47770.2019.8990660","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990660","url":null,"abstract":"In today’s nanometer-era semiconductor manufacturing technology, quantification of the effects of component-level parameter uncertainties on system operation has become in-dispensible. Well-known brute-force Monte Carlo is still a popular uncertainty quantification technique, but it requires high computational power, rendering it insufficient for the analysis of complex systems. On the other hand, Generalized Polynomial Chaos based stochastic spectral techniques are able to achieve the Monte Carlo accuracy with much less effort in certain situations. In this study, we compute the stochastic characterizations of several multi-component active filter circuits with the gPC-based stochastic collocation technique utilizing our Stokhos-based MAT-LAB/C++ toolbox and present performance comparisons with Monte Carlo along with intuitive and insightful comments.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"8 1","pages":"1051-1055"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85676430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On the Reliability Estimation of Analog CMOS Circuits Based on Statistical Methods 基于统计方法的模拟CMOS电路可靠性估计
2019 11th International Conference on Electrical and Electronics Engineering (ELECO) Pub Date : 2019-11-01 DOI: 10.23919/ELECO47770.2019.8990574
A. Kuntman, H. Kuntman
{"title":"On the Reliability Estimation of Analog CMOS Circuits Based on Statistical Methods","authors":"A. Kuntman, H. Kuntman","doi":"10.23919/ELECO47770.2019.8990574","DOIUrl":"https://doi.org/10.23919/ELECO47770.2019.8990574","url":null,"abstract":"Since modern CMOS technologies are continuously scaling down, the analog circuit designers are faced to serious reliability problems in their designs. These problems are caused by physical effects such as hot carrier injection, negative and positive bias temperature instability (N/PBTI) and temperature dependent dielectric breakdown (TDDB). Therefore, it is an important factor for a robust design to estimate the deviations caused by these degradation mechanisms.Although digital signal processing is becoming increasingly more powerful and many types of signal processing have indeed moved to digital domain due to the advances in IC technology, analog circuits are still fundamentally necessary in many complex and high performance systems. This is caused by the reality that naturally occurring signals are analog. That means, analog circuits act as a bridge between the real world and digital systems. In analog signal processing, many circuit topologies including active filters, oscillators, immittance simulators etc. have been proposed in the literature which find a large application area, ranging from very low frequencies at several Hz levels to RF applications operating at GHz level; in other words, from biomedical and sonar signals to cognitive radio and encrypted communications.Several works have been performed on these degradation effects in MOS structures and appeared in the literature. Generally, physical models were proposed and used in most of the reliability studies. But, difficulties in preparation of physical models seem to be the most important disadvantages of these type models. As a result, statistical method based observation of experimental results have been introduced in some works to overcome these disadvantages of physical models.This talk deals with statistical methods for modelling of the degradation caused deviations in the drain current and threshold voltage of the NMOS and PMOS transistors. Using the observation results obtained, the effect of degradation was investigated statistically and new statistical methods were introduced to be an alternative to those given in the literature. The statistical models introduced are independent of the realization technology, exhibiting short simulation time and high accuracy. The accuracy is proven on circuit design examples from the real World. All data in this review is taken from the recent research works performed in Istanbul University and Istanbul Technical University.","PeriodicalId":6611,"journal":{"name":"2019 11th International Conference on Electrical and Electronics Engineering (ELECO)","volume":"87 1","pages":"I1-I12"},"PeriodicalIF":0.0,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81096304","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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