2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)最新文献_第8页

A novel parameter estimation of a PV model 一种新的PV模型参数估计方法

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7750220

M. El-Sayed, Mohamed Abd-El-Hakeem Mohamed, M. H. Osman

{"title":"A novel parameter estimation of a PV model","authors":"M. El-Sayed, Mohamed Abd-El-Hakeem Mohamed, M. H. Osman","doi":"10.1109/PVSC.2016.7750220","DOIUrl":"https://doi.org/10.1109/PVSC.2016.7750220","url":null,"abstract":"This paper proposes a photovoltaic mathematical model featuring reduction in mathematical solution and comparable accuracy. The proposed model mimics the characteristics of the practical model by solving two nonlinear equations only, thus providing low computational time. In this paper, the most important parameters, i.e. the short circuit current, open-circuit voltage, maximum power point of the PV module, are determined with best accuracy under different solar irradiance intensities and module temperatures. The best estimation of the most important parameters enhance the model's accuracy at any values of irradiance and temperature. The proposed procedure is used the Newton-Raphson method based on simplified method to calculate the parameters of a PV system. The initial values of these parameters are estimated by using the simplified method to prevent a bad starting point which can compromise the convergence of the Newton-Raphson's method. Also the proposed equations which are used to calculate these parameters of a PV system, allow one to calculate it's without relying on the experimental I-V curve to determine the parameters of a PV system as usually reported in literature. The effectiveness of the model is shown by comparing the accuracy of the proposed model with those of the available models.","PeriodicalId":6524,"journal":{"name":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","volume":"49 1","pages":"3027-3032"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86937708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Assessing dust on PV modules using image processing techniques 使用图像处理技术评估光伏组件上的灰尘

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7749993

H. Qasem, A. Mnatsakanyan, P. Banda

引用次数: 16

Record high performance of perovskite/crystalline silicon four-terminal tandem solar cells 创纪录的高性能钙钛矿/晶体硅四端串联太阳能电池

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7749719

Z. Ren, Jixiang Zhou, A. Ng, Q. Shen, Hui Shen, C. Surya

引用次数: 1

Evaluating a model to estimate GHI, DNI, & DHI from POA irradiance 评估从POA辐照度估算GHI、DNI和DHI的模型

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7749749

M. Gostein, B. Stueve, K. Passow, A. Panchula

引用次数: 4

A manufacturable achromatic fresnel lens for CPV 一种可制造的CPV消色差菲涅耳透镜

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7749579

S. Askins, G. Vallerotto, M. Victoria, R. Herrero, C. Domínguez, I. Antón, G. Sala

引用次数: 3

Outstanding As-deposited surface passivation by industrial PECVD aluminum oxide 优异的工业PECVD氧化铝表面钝化

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7750191

Kyung Kim, Z. Hameiri, N. Borojevic, S. Duttagupta, S. Winderbaum

引用次数: 3

PV single axis tracker array tests in the Northeast US with CIGS 用CIGS在美国东北部进行光伏单轴跟踪阵列试验

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7750282

S. McWilliams, R. Sundaramoorthy, D. Metacarpa, P. Haldar

引用次数: 2

Aspects of sintering CdTe nanoparticles into functional bulk absorber layers CdTe纳米颗粒烧结成功能大块吸收层的几个方面

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7749631

S. Hawks, Abdullah S Abbas, A. Alivisatos

引用次数: 0

Degradation in PV encapsulant strength of attachment: An interlaboratory study towards a climate-specific test PV封装剂附着强度的退化:针对气候特定测试的实验室间研究

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7749556

David C. Miller, Eleonora Annigoni, A. Ballion, J. Bokria, L. Bruckman, D. Burns, Xinxin Chen, Jiangtao Feng, R. French, S. Fowler, C. Honeker, M. Kempe, Hussameldin I. Khonkar, Michael Kohl, Laure‐Emmanuelle Perret‐Aebi, N. Phillips, Kurt P. Scott, F. Sculati‐Meillaud, J. Wohlgemuth

{"title":"Degradation in PV encapsulant strength of attachment: An interlaboratory study towards a climate-specific test","authors":"David C. Miller, Eleonora Annigoni, A. Ballion, J. Bokria, L. Bruckman, D. Burns, Xinxin Chen, Jiangtao Feng, R. French, S. Fowler, C. Honeker, M. Kempe, Hussameldin I. Khonkar, Michael Kohl, Laure‐Emmanuelle Perret‐Aebi, N. Phillips, Kurt P. Scott, F. Sculati‐Meillaud, J. Wohlgemuth","doi":"10.1109/PVSC.2016.7749556","DOIUrl":"https://doi.org/10.1109/PVSC.2016.7749556","url":null,"abstract":"Reduced strength of attachment of the encapsulant resulting from the outdoor environment, including ultraviolet (UV) radiation, may decrease photovoltaic (PV) module lifetime by enabling widespread corrosion of internal components. To date, few studies exist showing how the adhesion of PV components varies with environmental stress. We have conducted an interlaboratory experiment to provide an understanding that will be used to develop climatic specific module tests. Factors examined in the study included the UV light source (lamp type), temperature, and humidity to be proposed for use in accelerated aging tests. A poly (ethylene-co-vinyl acetate) (EVA) formulation often used in veteran PV installations was studied using a compressive shear test - to quantify the strength of attachment at the EVA/glass interface. Replicate laminated glass/polymer/glass coupon specimens were weathered at 12 institutions using a variety of indoor chambers or field aging. Shear strength, shear strain, and toughness were measured using a mechanical load-frame for the compressive shear test, with subsequent optical imaging and electron microscopy of the separated surfaces.","PeriodicalId":6524,"journal":{"name":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","volume":"42 1","pages":"0095-0100"},"PeriodicalIF":0.0,"publicationDate":"2016-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73394158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 13

Quantitative analysis of crystalline silicon wafer PV modules by electroluminescence imaging 用电致发光成像技术定量分析晶体硅晶片光伏组件

2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Pub Date : 2016-06-05 DOI: 10.1109/PVSC.2016.7750365

Siyu Guo, E. Schneller, K. Davis, W. Schoenfeld

引用次数: 14